Four transistor static RAM cell

Claim 2

In a read-write memory including a word line and complementary data lines and a memory cell, said memory cell comprising complementary data nodes for storing data signals at one of two levels thereat, the data signals on said data nodes requiring periodic refreshing to retain their desired values, said memory cell including first and second MOS transistors each having one output terminal respectively connected to one of said data lines, a second output terminal connected respectively to said data nodes and a control terminal connected to said word line, and third and fourth MOS transistors each having one output terminal connected respectively to one of said data nodes and a control terminal connected respectively to the other of said data nodes, said memory further comprising means for applying a first control signal at a first level to said word line during a read or write operation and for applying a second control signal to the word line at a level lower than that of said first control signal during a refresh operation, said lower level signal turning on said first and second transistors to a higher on resistance than said higher-level first control signal, said control signal applying means including an address decoder for providing an address signal and a refresh counter for providing a refresh signal and a word line driver having first and second inputs respectively receiving said address signal and said refresh signal and effective to produce said first control signal when it receives said address signal and said second control signal when it receives said refresh signal.

Claim 3

In the memory of claim 1, in which the resistances of said first and second MOS transistors are substantially equal, and the resistances of said third and fourth MOS transistors are substantially equal at the same operating voltages.

Claim 4

In the memory of claim 1, in which the resistances of said first and second MOS transistors are greater than those of said third and fourth MOS transistors at the same operating voltages.

Claim 5

In the memory of claim 3, in which the resistance of said first and second transistors is five times greater than that of said third and fourth transistors.

Claim 6

In the memory of claim 4, further comprising fifth and sixth transistors having an output terminal respectively connected to one of said data lines.

Claim 7

In the memory of claim 5, in which the resistances of said fifth and sixth transistors are respectively less than the combined series resistances of said first and third transistors and said second and fourth transistors, respectively.

Claim 8

In the memory of claim 6, in which said first, second, third and fourth transistors are all of a first conductivity type.

Claim 9

In the memory of claim 7, in which said fifth and sixth transistors are each of a second conductivity type.

Claim 10

In the memory of claim 8, in which said first, second, third, and fourth transistors are NMOS transistors, and said fifth and sixth transistors are PMOS transistors.

Claim 11

In the memory of claim 1, further comprising fifth and sixth transistors each having an output terminal respectively connected to one of said data lines.

Claim 12

In the memory of claim 5, in which the resistances of said fifth and sixth transistors are respectively less than the combined series resistances of said first and third transistors and said second and fourth transistors, respectively.

Claim 13

In the memory of claim 1, in which said first, second, third and fourth transistors are all of a first conductivity type.

Claim 14

In the memory of claim 2, in which said fifth and sixth transistors are each of a second conductivity type.

Claim 15

In the memory of claim 3, in which said first, second, third, and fourth transistors are NMOS transistors, and said fifth and sixth transistors are PMOS transistors.

Claim 16

A read-write memory including word lines and orthogonal complementary data line pairs servicing an array of first, second, third and fourth transistor memory cell, each of said memory cells comprising two complementary data nodes for storing data signals at one of two levels, the data signals on said nodes requiring periodic refreshing to retain their desired values, said memory cell further including first and second MOS transistors having their drains connected to said data line pair, their sources connected to said data nodes and their gates commonly connected to said word line, and third and fourth MOS transistors each having sources connected to ground, drains connected to said data nodes, and gates cross-connected to each other's drains, the resistances of said first and second MOS transistors being essentially the same and at least four times greater than the essentially equal resistances of said third and fourth transistors at essentially the same operating voltages; means for setting a word line to a cell to a maximum positive supply voltage during a read or write operation, to approximately half of the supply during a refresh operation, and to essentially zero volts in the absence of a refreshing, reading or writing operation; and means for enabling the sequential turning on, one at a time, of word lines for refreshing, thereby having on at any one time a maximum of two word lines, said word line voltage setting means including means for placing one of said word lines at a half level for refreshing, and the other of said one word lines at a full level for reading or writing, and for placing one of said word lines on at a half level if neither reading nor writing is occuring, thereby reducing memory power consumption.

Claim 17

A read-write memory including word lines and orthogonal complementary data line pairs servicing an array of first, second, third and fourth transistor memory cell, each of said memory cells comprising two complementary data nodes for storing data signals at one of two levels, the data signals on said nodes requiring periodic refreshing to retain their desired values, said memory cell further including first and second MOS transistors having their drains connected to said data line pair, their sources connected to said data nodes and their gates commonly connected to said word line, and third and fourth MOS transistors each having sources connected to ground, drains connected to said data nodes, and gates cross-connected to each other's drains, the resistances of said first and second MOS transistors being essentially the same and at least four times greater than the essentially equal resistances of said third and fourth transistors at essentially the same operating voltages; means for setting a word line to a cell to a maximum positive supply voltage during a read or write operation, to approximately half of the supply during a refresh operation, and to essentially zero volts in the absence of a refreshing, reading or writing operation; and means for enabling the sequential turning on, one at a time, of word lines for refreshing, thereby having on at any one time a maximum of two word lines, said word line voltage setting means including means for placing one of said word lines at a half level for refreshing, and the other of said one word lines at a full level for reading or writing, and for placing one of said word lines on at a half level if neither reading nor writing is occuring, thereby reducing memory power consumption.