US5023561A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Apparatus and method for non-invasive measurement of electrical properties of a dielectric layer in a semiconductor wafer
Assignee: Solid State Measurements Inc
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Filing: 1990-05-04
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Granted: 1991-06-11
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Expires: 2010-05-04
Abstract
Abstract An apparatus and method for measurement of electrical properties of a dielectric layer on a semiconductor wafer body is disclosed. The apparatus supports the semiconductor wafer body in position and two electrical contacts are utilized, one of which is a probe tip having a uniformly flat contact portion. Means are provided for establishing a planar contact between the flat contact portion of the probe tip and the dielectric layer of the semiconductor wafer. Measurements of the electrical properties of the dielectric layer can then be made without the use of patterned mesas.
Inventors
- 👤 Robert J. Hillard
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 23:25
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/282; G01R31/2831
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
197 words
An apparatus for measurement of electrical properties of a dielectric layer in a semiconductor wafer body, said semiconductor wafer body including substrate means, said apparatus comprising: means for supporting said semiconductor wafer body in predetermined position; first electrical contact means for contacting said substrate means of said semiconductor wafer body; second electrical contact means for contacting said dielectric layer, said second electrical contact means comprising probe means, said probe means including conductive probe tip means, said conductive probe tip means having a uniformly flat contact portion thereon of predetermined dimensions; kinematically stable probe arm positioning means comprising a probe arm having said probe means affixed thereto, said kinematically stable probe arm positioning means for controlling the pressure and rate of travel of said probe tip means; means for establishing a planar contact between said uniformly flat contact portion of said probe tip means and the outer surface of, said dielectric layer of said semiconductor wafer body; measurement means for causing an electrical current to flow through said dielectric layer and measuring the resultant electrical properties of said dielectric layer, said measurement means connected in circuit with said first electrical contact means and said second electrical contact means.
Claim 2
Independent Claim
197 words
An apparatus for measurement of electrical properties of a dielectric layer in a semiconductor wafer body, said semiconductor wafer body including substrate means, said apparatus comprising: means for supporting said semiconductor wafer body in predetermined position; first electrical contact means for contacting said substrate means of said semiconductor wafer body; second electrical contact means for contacting said dielectric layer, said second electrical contact means comprising probe means, said probe means including conductive probe tip means, said conductive probe tip means having a uniformly flat contact portion thereon of predetermined dimensions; kinematically stable probe arm positioning means comprising a probe arm having said probe means affixed thereto, said kinematically stable probe arm positioning means for controlling the pressure and rate of travel of said probe tip means; means for establishing a planar contact between said uniformly flat contact portion of said probe tip means and the outer surface of, said dielectric layer of said semiconductor wafer body; measurement means for causing an electrical current to flow through said dielectric layer and measuring the resultant electrical properties of said dielectric layer, said measurement means connected in circuit with said first electrical contact means and said second electrical contact means.
Claim 3
Dependent Claim
65 words
The apparatus of claim 1, wherein said means for establishing a planar contact between said flat contact portion of said probe tip means and said dielectric layer of said semiconductor wafer body comprises an optical means for focusing on a reference plane to ensure planar contact between said flat contact portion of said probe tip means and said dielectric layer of said semiconductor wafer body.
Claim 4
Dependent Claim
22 words
The apparatus of claim 1, wherein said kinematically stable probe arm positioning means further comprising fulcrum means for supporting said probe arm.
Claim 5
Dependent Claim
29 words
The apparatus of claim 1, further comprising semiconductor wafer body horizontal and rotational movement means for moving said wafer body rotationally or horizontally relative to said probe tip means.
Claim 6
Dependent Claim
13 words
The apparatus of claim 1, wherein said conductive probe tip means is metallic.
Claim 7
Dependent Claim
14 words
The apparatus of claim 5, wherein said metallic probe tip means is tungsten-osmium alloy.
Claim 8
Dependent Claim
17 words
The apparatus of claim 1, wherein said flat contact portion of said probe tip means is circular.
Claim 9
Dependent Claim
25 words
The apparatus of claim 7, wherein said flat contact portion of said probe tip means has a diameter of from about 5 to 2000 microns.
Claim 10
Independent Claim
116 words
A method for measurement of electrical properties of a dielectric layer in a semiconductor wafer body, aid semiconductor wafer body including substrate means, said method comprising: a. supporting the semiconductor wafer body in predetermined position; b. contacting said substrate means with a first electrical contact means; c. kinematically controlling a second electrical contact means to establish a uniform planar contact with the outer surface of said dielectric layer, said second electrical contact means comprising conductive probe tip means having a uniformly flat contact portion thereon of predetermined dimensions; d. measuring the electrical properties of said dielectric layer by causing an electrical current to flow between said first electrical contact means and said second electrical contact means.
Claim 11
Independent Claim
116 words
A method for measurement of electrical properties of a dielectric layer in a semiconductor wafer body, aid semiconductor wafer body including substrate means, said method comprising: a. supporting the semiconductor wafer body in predetermined position; b. contacting said substrate means with a first electrical contact means; c. kinematically controlling a second electrical contact means to establish a uniform planar contact with the outer surface of said dielectric layer, said second electrical contact means comprising conductive probe tip means having a uniformly flat contact portion thereon of predetermined dimensions; d. measuring the electrical properties of said dielectric layer by causing an electrical current to flow between said first electrical contact means and said second electrical contact means.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1994-06-10 | 1994-12-10 | 1995-06-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-06-10 | 1998-12-10 | 1999-06-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-06-10 | 2002-12-10 | 2003-06-11 | $7700.00 | Window Closed / Lapsed |