US5124640A
Expired / Lapsed
US
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Method for advanced material characterization by laser induced eddy current imaging
Assignee: National Aeronautics and Space Administration
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Filing: 1991-09-05
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Granted: 1992-06-23
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Expires: 2011-09-05
Abstract
Abstract An improved NDE method utilizes a laser source with modulator and scanning mirror, a pancake shape eddy current detecting coil, a lock-in amplifier, a system controller, and an impedance gain/phase analyzer. The laser is directed by the scanning mirror to a specimen to be analyzed. A very localized or small area of the specimen is impacted directly by the laser beam creating a thermal and stress wave in the specimen. An impedance gain/phase analyzer is connected to the eddy current detecting coil and to a lock-in amplifier through the system controller. The lock-in amplifier is also synchronized to the laser modulator. The system controller is used to control the lock-in amplifier, scanning mirror, and to process data from the analyzer. Raster scanning of the laser beam across the speciment allows the detection by the coil of the laser generated thermal and elastic strains induced in the specimen by the laser. The rastering of the laser beam is controlled by the controller by positioning the mirror.
Inventors
- 👤 Engmin J. Chern
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 03:13
CPC Classifications
G; G01; G01N; G01N27/00; G01N27/72; G01N27/82; G01N27/90; G01N27/9013; G01N27/902
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
128 words
An apparatus for advanced characterization of a material specimen comprising: a laser; a modulator modulating said laser; a scanning mirror for directing a beam from said laser on said material specimen thereby inducing thermal and elastic strains in said specimen; an eddy current detecting coil adjacent said specimen for detecting changes in electrical conductivity in said specimen caused by said thermal and elastic strains in said specimen; an impedance gain/phase analyzer, for measuring said the absolute resistance and inductance of said coil as a result of said changes in electrical conductivity in said specimen, connected to said detecting coil; a lock-in amplifier connected to said modulator; and a system controller for data acquisition and control connected to said impedance gain/phase analyzer, said lock-in amplifier and said scanning mirror.
Claim 2
Independent Claim
128 words
An apparatus for advanced characterization of a material specimen comprising: a laser; a modulator modulating said laser; a scanning mirror for directing a beam from said laser on said material specimen thereby inducing thermal and elastic strains in said specimen; an eddy current detecting coil adjacent said specimen for detecting changes in electrical conductivity in said specimen caused by said thermal and elastic strains in said specimen; an impedance gain/phase analyzer, for measuring said the absolute resistance and inductance of said coil as a result of said changes in electrical conductivity in said specimen, connected to said detecting coil; a lock-in amplifier connected to said modulator; and a system controller for data acquisition and control connected to said impedance gain/phase analyzer, said lock-in amplifier and said scanning mirror.
Claim 3
Dependent Claim
19 words
The apparatus of claim 1 wherein said scanning mirror directs said beam on said specimen in a raster fashion.
Claim 4
Independent Claim
104 words
A method for advanced characterization of a material specimen comprising the steps of: positioning said specimen adjacent an eddy current detecting coil; generating a modulated thermal source; directing said modulated thermal source onto said specimen at a localized area on said specimen; scanning said localized area across said specimen to cause generation of thermal and stress wave in said specimen; detecting with said coil changes in electrical conductivity and magnetic permeability in the localized areas caused by localized thermal and stress changes in said specimen; and measuring the absolute resistance and inductance of said coil so as to thereby directly characterize said material specimen.
Claim 5
Independent Claim
104 words
A method for advanced characterization of a material specimen comprising the steps of: positioning said specimen adjacent an eddy current detecting coil; generating a modulated thermal source; directing said modulated thermal source onto said specimen at a localized area on said specimen; scanning said localized area across said specimen to cause generation of thermal and stress wave in said specimen; detecting with said coil changes in electrical conductivity and magnetic permeability in the localized areas caused by localized thermal and stress changes in said specimen; and measuring the absolute resistance and inductance of said coil so as to thereby directly characterize said material specimen.
Claim 6
Dependent Claim
17 words
The method of claim 3 wherein said scanning is done in a raster fashion across said specimen.
References Cited (Backward Citations)
US4950990A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1995-06-23 | 1995-12-23 | 1996-06-23 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-06-23 | 1999-12-23 | 2000-06-23 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-06-23 | 2003-12-23 | 2004-06-23 | $7700.00 | Window Closed / Lapsed |