US5175504A
Expired / Lapsed
US
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Method and apparatus for automatically inspecting and repairing a simple matrix circuit panel
Assignee: Photon Dynamics Inc
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Filing: 1991-06-17
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Granted: 1992-12-29
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Expires: 2011-06-17
Abstract
Abstract Circuit panels, such as LCD panels, are inspected in-process and after final assembly to identify defects. Prior to final assembly, panels identified as having sufficiently few defects are repaired. Similarly after final assembly, panels identified as having sufficiently few defects are repaired. The inspection and repair systems are linked through a repair file. The inspection system identifies each defect by type and location and includes such information in the repair file. The repair system accesses such file and follows a prescribed repair method for a given type of defect at the location of such defect. Simple matrix panel defects include open line defects and line to line shorts. The inspection system includes an automated non-contact capacitance imaging system. The repair system may include a pair of lasers and a film dispenser. A first laser is used to selectively remove material and cut lines. The dispenser is for applying a liquid organic metallic film in the defect area. The second laser is for tracing a line in the film to form a conductive path repairing the defect.
Inventors
- 👤 Francois J. Henley
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 02:04
CPC Classifications
G; G09; G09G; G09G3/00; G09G3/006; G02; G02F; G02F1/00; G02F1/01; G02F1/13; G02F1/1306; G02F1/1309; H; H05; H05K; H05K3/00; H05K3/22; H05K3/225
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
77 words
A method for inspecting a circuit panel having a plurality of conductive lines, comprising the steps of: shorting said plurality of conductive lines; applying a test signal to said shorted plurality of conductive lines; capturing a capacitance image of an area of the panel; identifying an open circuit line defect from the capacitance image; identifying a location of said open circuit line defect; and storing said location and a corresponding indication signifying an open circuit line defect.
Claim 2
Independent Claim
77 words
A method for inspecting a circuit panel having a plurality of conductive lines, comprising the steps of: shorting said plurality of conductive lines; applying a test signal to said shorted plurality of conductive lines; capturing a capacitance image of an area of the panel; identifying an open circuit line defect from the capacitance image; identifying a location of said open circuit line defect; and storing said location and a corresponding indication signifying an open circuit line defect.
Claim 3
Independent Claim
111 words
A method for inspecting a circuit panel having a plurality of substantially parallel, conductive lines and a built-in shorting means coupled to alternate conductive lines, the method comprising the steps of: applying a second shorting means across a plurality of conductive lines to short said plurality of conductive lines; applying a first test signal to either one of the built-in shorting means and the second shorting means; capturing a capacitance image of a first area of the panel; identifying an open circuit line defect from the capacitance image; identifying a location of said open circuit line defect; and storing said location and a corresponding indication signifying an open circuit line defect.
Claim 4
Independent Claim
111 words
A method for inspecting a circuit panel having a plurality of substantially parallel, conductive lines and a built-in shorting means coupled to alternate conductive lines, the method comprising the steps of: applying a second shorting means across a plurality of conductive lines to short said plurality of conductive lines; applying a first test signal to either one of the built-in shorting means and the second shorting means; capturing a capacitance image of a first area of the panel; identifying an open circuit line defect from the capacitance image; identifying a location of said open circuit line defect; and storing said location and a corresponding indication signifying an open circuit line defect.
Claim 5
Dependent Claim
71 words
The method of claim 2, further comprising the steps of: removing said second shorting means; applying a second test signal to the built-in shorting means; capturing a second capacitance image of a second area of the panel; identifying a short circuit line defect from the second capacitance image; identifying a location of said short circuit line defect; and storing said location and a corresponding indication signifying a short circuit line defect.
Claim 6
Independent Claim
122 words
An apparatus for automatically inspecting and repairing a simple matrix circuit panel, said panel having a plurality of substantially parallel conductive lines and a built-in shorting bar coupled to alternate conductive lines, comprising: means for applying a test signal to said built-in shorting bar; means for capturing a capacitance image of a portion of said panel while said test signal is applied; means for identifying panel defects from said captured image; means for storing panel defect information including defect type data and defect location data; laser means for removing selective material from a location of said panel, said selective material and said location determined based upon said panel defect information; and means for forming a conductive line to repair the panel defect.
Claim 7
Independent Claim
122 words
An apparatus for automatically inspecting and repairing a simple matrix circuit panel, said panel having a plurality of substantially parallel conductive lines and a built-in shorting bar coupled to alternate conductive lines, comprising: means for applying a test signal to said built-in shorting bar; means for capturing a capacitance image of a portion of said panel while said test signal is applied; means for identifying panel defects from said captured image; means for storing panel defect information including defect type data and defect location data; laser means for removing selective material from a location of said panel, said selective material and said location determined based upon said panel defect information; and means for forming a conductive line to repair the panel defect.
Claim 8
Dependent Claim
39 words
The apparatus of claim 4 wherein said conductive line forming means comprises: means for dispensing a film layer over an area of the panel which includes a panel defect; and means for removing excess film of said film layer.
Claim 9
Dependent Claim
30 words
The apparatus of claim 5 in which the selective material removed and a location and shape of the conductive line formed are prescribed based upon the type of panel defect.
Claim 10
Independent Claim
104 words
A method for automatically testing and repairing a circuit panel, comprising the steps of: applying a test signal to said circuit panel; capturing a capacitance image of said panel while said test signal is applied; identifying panel defects from said captured image; storing panel defect information including defect type data and defect location data; removing selective material from a location of said panel, said selective material and said location being determined from said panel defect information; dispensing a film layer over an area of the panel which includes a panel defect; and forming a conductive line with said film to repair the panel defect.
Claim 11
Independent Claim
104 words
A method for automatically testing and repairing a circuit panel, comprising the steps of: applying a test signal to said circuit panel; capturing a capacitance image of said panel while said test signal is applied; identifying panel defects from said captured image; storing panel defect information including defect type data and defect location data; removing selective material from a location of said panel, said selective material and said location being determined from said panel defect information; dispensing a film layer over an area of the panel which includes a panel defect; and forming a conductive line with said film to repair the panel defect.
Claim 12
Dependent Claim
14 words
The method of claim 7 further comprising the step of removing excess metallic film.
Claim 13
Dependent Claim
30 words
The method of claim 8 in which the selective material removed and a location and shape of the conductive line formed are prescribed based upon the type of panel defect.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-12-29 | 1996-06-29 | 1996-12-29 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-12-29 | 2000-06-29 | 2000-12-29 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-12-29 | 2004-06-29 | 2004-12-29 | $7700.00 | Window Closed / Lapsed |