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US5189594A Expired / Lapsed US ⏱️ 0.0 years remaining

Capacitor in a semiconductor integrated circuit and non-volatile memory using same

Assignee: Rohm Co Ltd
•
Filing: 1992-04-30
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Granted: 1993-02-23
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Expires: 2012-04-30
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Abstract

Abstract A capacitor used in a semiconductor integrated circuit, in which lower electrode 31, a ferroelectric film 33, and an upper electrode in the form of a comb are formed on the source region 13a of a field-effect transistor 10 in the stated order, to form a ferroelectric capacitor which is apparently made of a plurality of capacitors small in area which are connected in parallel to one another. Thereby, the capacitor for a semiconductor integrated circuit can store a sufficient amount of signal charge, and is short in switching time.

Inventors

  • 👤 Kazuhiro Hoshiba

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 14:25
CPC Classifications
H; H01; H01G; H01G4/00; H01G4/002; H01G4/005; H01G4/012; H10; H10B; H10B53/00; H10D; H10D1/00; H10D1/60; H10D1/68; H10D1/682

Claims Analysis

Total Claims: 12
Claim 1
Independent Claim 50 words
A capacitor in a semiconductor integrated circuit, comprising: a lower electrode formed on a semiconductor substrate; a ferroelectric film formed on said lower electrode; and an upper electrode formed on said ferroelectric film; wherein at least one of said upper and lower electrodes is in the form of a comb.
Claim 2
Dependent Claim 50 words
A capacitor in a semiconductor integrated circuit, comprising: a lower electrode formed on a semiconductor substrate; a ferroelectric film formed on said lower electrode; and an upper electrode formed on said ferroelectric film; wherein at least one of said upper and lower electrodes is in the form of a comb.
Claim 3
Dependent Claim 38 words
A capacitor as claimed in claim 1, wherein said ferroelectric film is made of a ferroelectric material selected from a group consisting of lead zirconate-titanate (PZT) and (Pb x La 1-x )(Zr y Ti 1-y )O 3 (PLZT).
Claim 4
Dependent Claim 51 words
A non-volatile memory comprising: a signal charge storing capacitor having a lower electrode formed on a semiconductor substrate; a ferroelectric film formed on said lower electrode; and an upper electrode on said ferroelectric film; wherein at least one of said upper and lower electrodes is in the form of a comb.
Claim 5
Dependent Claim 51 words
A non-volatile memory comprising: a signal charge storing capacitor having a lower electrode formed on a semiconductor substrate; a ferroelectric film formed on said lower electrode; and an upper electrode on said ferroelectric film; wherein at least one of said upper and lower electrodes is in the form of a comb.
Claim 6
Dependent Claim 38 words
A capacitor as claimed in claim 3, wherein said ferroelectric film is made of a ferroelectric material selected from a group consisting of lead zirconate-titanate (PZT) and (Pb x La 1-x )(Zr y Ti 1-y )O 3 (PLZT).
Claim 7
Dependent Claim 68 words
A capacitor in a semiconductor integrated circuit, comprising: a lower electrode formed on a semiconductor substrate, being in a form of a comb; a ferroelectric film formed on said lower electrode; and an upper electrode on said ferroelectric film, being in a form of a comb; wherein said upper and lower electrodes are so arranged that the teeth of said upper electrode cross those of said lower electrode.
Claim 8
Dependent Claim 68 words
A capacitor in a semiconductor integrated circuit, comprising: a lower electrode formed on a semiconductor substrate, being in a form of a comb; a ferroelectric film formed on said lower electrode; and an upper electrode on said ferroelectric film, being in a form of a comb; wherein said upper and lower electrodes are so arranged that the teeth of said upper electrode cross those of said lower electrode.
Claim 9
Dependent Claim 38 words
A capacitor as claimed in claim 5, wherein said ferroelectric film is made of a ferroelectric material selected from a group consisting of lead zirconate-titanate (PZT) and (Pb x La 1-x )(Zr y Ti 1-y )O 3 (PLZT).
Claim 10
Dependent Claim 70 words
A non-volatile memory comprising: a signal charge storing capacitor having a lower electrode formed on a semiconductor substrate, being in a form of a comb; a ferroelectric film formed on said lower electrode; and an upper electrode on said ferroelectric film, being in a form of a comb; wherein said upper and lower electrodes are so arranged that the teeth of said upper electrode cross those of said lower electrode.
Claim 11
Dependent Claim 70 words
A non-volatile memory comprising: a signal charge storing capacitor having a lower electrode formed on a semiconductor substrate, being in a form of a comb; a ferroelectric film formed on said lower electrode; and an upper electrode on said ferroelectric film, being in a form of a comb; wherein said upper and lower electrodes are so arranged that the teeth of said upper electrode cross those of said lower electrode.
Claim 12
Dependent Claim 38 words
A capacitor as claimed in claim 7, wherein said ferroelectric film is made of a ferroelectric material selected from a group consisting of lead zirconate-titanate (PZT) and (Pb x La 1-x )(Zr y Ti 1-y )O 3 (PLZT).

References Cited (Backward Citations)

US3737805A Cited
US5046043A Cited
US5109357A Cited
JPH02304796A Cited
US5136534A Cited
US5121353A Cited
US5043781A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-02-23 1996-08-24 1997-02-23 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-02-23 2000-08-24 2001-02-23 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-02-23 2004-08-24 2005-02-23 $7700.00 Window Closed / Lapsed

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