US5227012A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of manufacturing multi-layer thin film circuits containing integrated thin film resistors
Assignee: HIGHTEC MC AG
•
Filing: 1991-04-15
•
Granted: 1993-07-13
•
Expires: 2011-04-15
Abstract
Abstract In multi-layer thin film circuits, fabricated by alternate formation of conductor layers and insulating layers, there can be integrated thin film resistors which bear directly upon the substrate but nonetheless are not subjected, during manufacture, to the high temperatures of curing of the insulating layers and which then would be damaged. The manufacturing method also allows producing integrated electrical contacting between the thin film resistors and conductors of all of the conductor layers.
Inventors
- 👤 Gerold Brandli
- 👤 Guido Bachmann
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 05:31
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/01; H05; H05K; H05K1/00; H05K1/16; H05K1/167; H05K1/02; H05K1/03; H05K1/0306; H05K2201/00; H05K2201/03; H05K2201/0302; H05K2201/0317; H05K2201/09; H05K2201/09209; H05K2201/095; H05K2201/09509; H05K2201/09518; H05K2203/00; H05K2203/03; H05K2203/0361; H05K2203/17; H05K2203/171; H05K3/00; H05K3/10; H05K3/108; H05K3/38; H05K3/388; H05K3/46; H05K3/4644; Y; Y10; Y10S; Y10S428/00; Y10S428/901; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49082; Y10T29/49099; Y10T428/00; Y10T428/24; Y10T428/24802; Y10T428/24917
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
83 words
A method of manufacturing multi-layer thin film circuits containing integrated thin film resistors, comprising the steps of: alternately forming conductor and insulating layers upon a substrate; forming free zones in all of the formed conductor and insulating layers, with the exception of the last conductor layer located furthest from the substrate; thermally treating each formed insulating layer; and upon completion of the thermal treatment of each formed insulating layer forming within the free zones thin film resistors which directly bear upon the substrate.
Claim 2
Independent Claim
83 words
A method of manufacturing multi-layer thin film circuits containing integrated thin film resistors, comprising the steps of: alternately forming conductor and insulating layers upon a substrate; forming free zones in all of the formed conductor and insulating layers, with the exception of the last conductor layer located furthest from the substrate; thermally treating each formed insulating layer; and upon completion of the thermal treatment of each formed insulating layer forming within the free zones thin film resistors which directly bear upon the substrate.
Claim 3
Dependent Claim
141 words
The method as defined in claim 1, wherein: formation of the last conductor layer located furthest from the substrate comprises the steps of: (a) forming an entire surface adhesion film from a material suitable for thin film resistors; (b) forming an entire surface conductor film; (c) applying to the conductor film a photo-lacquer film (d) patterning the applied photo-lacquer film in correspondence with a desired conductor pattern of the last conductor layer; (e) producing conductor tracks at the conductor film; (f) removing the applied photo-lacquer film; (g) etching away exposed portions of the conductor film; (h) applying a further photo-lacquer film; (i) patterning the applied further photo-lacquer film in correspondence with a desired pattern of the thin film resistors and electrically contacting thereof with previously formed conductor layers; (j) etching the adhesion film; and (k) removing the further applied photo-lacquer film.
Claim 4
Dependent Claim
45 words
The method as defined in claim 2, further including the steps of: patterning each formed insulating layer located between conductor layers and patterning the last conductor layer in order to produce integrated electrical connections between the thin film resistors and conductors of other conductor layers.
Claim 5
Dependent Claim
45 words
The method as defined in claim 1, further including the steps of: patterning each formed insulating layer located between conductor layers and patterning the last conductor layer in order to produce integrated electrical connections between the thin film resistors and conductors of other conductor layers.
Claim 6
Dependent Claim
20 words
The method as defined in claim 1, further including the step of: using photoactive polyimide for forming each insulating layer.
Claim 7
Dependent Claim
28 words
The method as defined in claim 1, further including the step of: using a material selected from dry etchable polyimide, benzocyclobutene and polyphenylquinoxaline for forming each insulating layer.
Claim 8
Dependent Claim
34 words
The method as defined in claim 1, further including the step of: providing the free zones, in addition to the thin film resistors, with further components which produce a great deal of waste heat.
Claim 9
Independent Claim
111 words
A method of manufacturing multi-layer thin film circuits containing integrated thin film resistors, comprising the steps of: forming upon a substrate at least two conductor layers and at least one insulating layer located between the at least two conductor layers; the conductor layer located furthest from the substrate defining a last conductor layer; forming free zones in each of the formed conductor and insulating layers, with the exception of the last conductor layer located furthest from the substrate; thermally treating each formed insulating layer; and upon completion of the thermal treatment of each formed insulating layer forming within the free zones thin film resistor means which directly bear upon the substrate.
Claim 10
Independent Claim
111 words
A method of manufacturing multi-layer thin film circuits containing integrated thin film resistors, comprising the steps of: forming upon a substrate at least two conductor layers and at least one insulating layer located between the at least two conductor layers; the conductor layer located furthest from the substrate defining a last conductor layer; forming free zones in each of the formed conductor and insulating layers, with the exception of the last conductor layer located furthest from the substrate; thermally treating each formed insulating layer; and upon completion of the thermal treatment of each formed insulating layer forming within the free zones thin film resistor means which directly bear upon the substrate.
References Cited (Backward Citations)
FR2079345A1
Cited
US3726733A
Cited
GB1339071A
Cited
US4496435A
Cited
US4752555A
Cited
EP0286854A1
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1996-07-12 | 1997-01-11 | 1997-07-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2000-07-12 | 2001-01-11 | 2001-07-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2004-07-12 | 2005-01-11 | 2005-07-13 | $7700.00 | Window Closed / Lapsed |