US5299252A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Fluorescent X-ray film thickness measuring apparatus
Assignee: Hitachi High-Tech Analysis Corp
•
Filing: 1993-04-07
•
Granted: 1994-03-29
•
Expires: 2013-04-07
Abstract
Abstract A fluorescent X-ray thin film measuring apparatus having a collimator with an aperture which forms a primary X-ray beam to have a long and narrow cross-sectional shape and which can be rotated about the axis of the X-ray beam, and a display device for observing a sample surface by superposing a pattern on the sample surface, the pattern showing the angular position of the collimator aperture which defines the angular position of the long and narrow cross-sectional shape of the primary X-ray beam.
Inventors
- 👤 Masanori Takahashi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 07:43
CPC Classifications
G; G21; G21K; G21K1/00; G21K1/02; G21K1/04; G01; G01B; G01B15/00; G01B15/02
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
97 words
A fluorescent X-ray film thickness measuring apparatus for measuring a film thickness of a sample, said film thickness measuring apparatus comprising: a collimator having an aperture for forming a primary X-ray beam having a beam axis and a rectangular cross section; means connected to said collimator for rotating said collimator around the primary X-ray beam axis to a desired angular position; and means for monitoring a portion of the sample comprising means for overlapping a representation of the sample portion with a representation of the orientation of the rectangular cross section of the formed primary X-ray beam.
Claim 2
Dependent Claim
97 words
A fluorescent X-ray film thickness measuring apparatus for measuring a film thickness of a sample, said film thickness measuring apparatus comprising: a collimator having an aperture for forming a primary X-ray beam having a beam axis and a rectangular cross section; means connected to said collimator for rotating said collimator around the primary X-ray beam axis to a desired angular position; and means for monitoring a portion of the sample comprising means for overlapping a representation of the sample portion with a representation of the orientation of the rectangular cross section of the formed primary X-ray beam.
Claim 3
Dependent Claim
187 words
A fluorescent X-ray film thickness measuring apparatus comprising: an X-ray tube for generating a primary X-ray; a collimator having a rectangular aperture for forming the primary X-ray into a beam having a beam axis and a rectangular cross section, the rectangular aperture and the rectangular cross section each having a long dimension; means for holding a sample at a measuring position for irradiation of a portion of the sample by the beam in order to cause fluorescent X-rays to be emitted from the sample portion, the sample portion having a long dimension; an X-ray detector disposed for detecting the fluorescent X-rays; a mirror for reflecting an image of the sample at the measuring position; display means for displaying the image of the sample portion reflected by said mirror; a collimator drive motor coupled to said collimator for rotating said collimator about the beam axis and for matching the orientation of the long dimension of the aperture with the orientation of the long dimension of the sample portion; and indicating means for indicating the orientation of the aperture and sending information indicating the orientation to said display means.
Claim 4
Dependent Claim
187 words
A fluorescent X-ray film thickness measuring apparatus comprising: an X-ray tube for generating a primary X-ray; a collimator having a rectangular aperture for forming the primary X-ray into a beam having a beam axis and a rectangular cross section, the rectangular aperture and the rectangular cross section each having a long dimension; means for holding a sample at a measuring position for irradiation of a portion of the sample by the beam in order to cause fluorescent X-rays to be emitted from the sample portion, the sample portion having a long dimension; an X-ray detector disposed for detecting the fluorescent X-rays; a mirror for reflecting an image of the sample at the measuring position; display means for displaying the image of the sample portion reflected by said mirror; a collimator drive motor coupled to said collimator for rotating said collimator about the beam axis and for matching the orientation of the long dimension of the aperture with the orientation of the long dimension of the sample portion; and indicating means for indicating the orientation of the aperture and sending information indicating the orientation to said display means.
References Cited (Backward Citations)
US5237599A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1997-03-28 | 1997-09-27 | 1998-03-29 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-03-28 | 2001-09-27 | 2002-03-29 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-03-28 | 2005-09-27 | 2006-03-29 | $7700.00 | Window Closed / Lapsed |