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US5322712A Expired / Lapsed US ⏱️ 0.0 years remaining

Process for improved quality of CVD copper films

Assignee: Versum Materials US LLC
•
Filing: 1993-05-18
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Granted: 1994-06-21
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Expires: 2013-05-18
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Abstract

Abstract Chemical Vapor Deposition of copper films is enhanced by simultaneously introducing in the reactor vapor of an organometallic copper precursor and copper complex vapor of a volatile ligand or the hydrate of the ligand.

Inventors

  • 👤 John A. T. Norman
  • 👤 Arthur K. Hochberg
  • 👤 David A. Roberts

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 13:38
CPC Classifications
C; C23; C23C; C23C16/00; C23C16/06; C23C16/18

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 137 words
A method for chemical vapor deposition of copper films on a substrate comprising the steps of: introducing vapors of a copper (I) organometallic precursor compound into a chemical vapor deposition (CVD) reactor; and simultaneously introducing into the reactor copper complex vapor of a volatile ligand or ligand hydrate having the general formula, ##STR3## wherein R 1 , and R 3 , are selected from the group consisting of alkyl, aryl, fluoroalkyl or fluoroaryl, R 2 is a halogen, alkyl, fluoroalkyl or fluoroaryl, X and Y are selected so that when X═0, Y is OH, NH 2 or N(R 4 )H, when X═NH, Y is NH 2 or N(R 4 )H, when X═NR 5 , Y is (R 4 )H, and R 4 and R 5 are selected from the group consisting of alkyl, aryl, fluoroalkyl and fluoroaryl.
Claim 2
Independent Claim 137 words
A method for chemical vapor deposition of copper films on a substrate comprising the steps of: introducing vapors of a copper (I) organometallic precursor compound into a chemical vapor deposition (CVD) reactor; and simultaneously introducing into the reactor copper complex vapor of a volatile ligand or ligand hydrate having the general formula, ##STR3## wherein R 1 , and R 3 , are selected from the group consisting of alkyl, aryl, fluoroalkyl or fluoroaryl, R 2 is a halogen, alkyl, fluoroalkyl or fluoroaryl, X and Y are selected so that when X═0, Y is OH, NH 2 or N(R 4 )H, when X═NH, Y is NH 2 or N(R 4 )H, when X═NR 5 , Y is (R 4 )H, and R 4 and R 5 are selected from the group consisting of alkyl, aryl, fluoroalkyl and fluoroaryl.
Claim 3
Dependent Claim 21 words
A method according to claim 1 wherein the substrate is heated to a temperature of between 120° C. and 350° C.
Claim 4
Dependent Claim 22 words
A method according to claim 1 wherein the CVD reactor is maintained at a pressure of between 10 mTorr and 100 Torr.
Claim 5
Dependent Claim 53 words
A method according to claim 1 wherein the vapors of the copper (I) organometallic precursor compound are introduced via an inert carrier gas selected from the groups consisting of helium, argon, nitrogen, neon, xenon, krypton and mixtures thereof introduced into the CVD reactor at a rate of from 1 sccm to 1000 sccm.
Claim 6
Dependent Claim 24 words
A method according to claim 1 wherein the volatile ligand or ligand hydrate is selected from the group consisting of hexafluoroacetylacetone, heptafluoroacetylacetone and hexafluoroacetylacetonedihydrate.
Claim 7
Dependent Claim 24 words
A method according to claim 1 wherein the copper (I) organometallic precursor compound is 1,1,1,5,5,5-hexafluoro-2,4 pentanedionato copper (I) trimethylvinylsilane and the ligand is 1,1,1,5,5,5-hexafluoro-2,4-pentanedione.
Claim 8
Independent Claim 40 words
A method for chemical vapor deposition of copper films on a substrate comprising the steps of: introducing vapor of 1,1,1,5,5,5-hexafluoro-2,4pentanedianato copper (I) trimethylvinylsilane into a chemical vapor depositor reactor; and simultaneously introducing into the reactor copper complex vapor of 1,1,1,5,5,5-hexafluoro-2,4-pentanedione.
Claim 9
Independent Claim 40 words
A method for chemical vapor deposition of copper films on a substrate comprising the steps of: introducing vapor of 1,1,1,5,5,5-hexafluoro-2,4pentanedianato copper (I) trimethylvinylsilane into a chemical vapor depositor reactor; and simultaneously introducing into the reactor copper complex vapor of 1,1,1,5,5,5-hexafluoro-2,4-pentanedione.

References Cited (Backward Citations)

US5094701A Cited
US5098516A Cited
US5085731A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-06-20 1997-12-20 1998-06-21 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-06-20 2001-12-20 2002-06-21 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-06-20 2005-12-20 2006-06-21 $7700.00 Window Closed / Lapsed

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