US5381105A
Expired / Lapsed
US
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Method of testing a semiconductor device having a first circuit electrically isolated from a second circuit
Assignee: Apple Inc
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Filing: 1993-02-12
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Granted: 1995-01-10
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Expires: 2013-02-12
Abstract
Abstract Testing of a semiconductor device (10, 30) is facilitated by forming the semiconductor device (10, 30) to have a first portion (17) that is electrically isolated from a second portion (19, 27). Testing is first performed on the first portion (17) of the semiconductor device (10, 30). After the testing is complete, the first portion (17) of the semiconductor device (10, 30) is electrically coupled to the second portion (19, 27) of the semiconductor device (10, 30) .
Inventors
- 👤 John P. Phipps
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 04:19
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/3183; G01R31/318371; G01R31/2851; G01R31/2884
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
121 words
A method of testing a semiconductor device comprising: providing a power MOS FET having a gate electrode coupled to a gate bonding pad, and a source electrode coupled to a source bonding pad; providing an input protection network having a plurality of series connected back-to-back diode pairs, the input protection network having a first terminal coupled to the source bonding pad, and a second terminal coupled to an input protection bonding pad; testing a gate oxide rupture voltage of the power MOS FET by applying a test voltage between the gate bonding pad and the source bonding pad, and monitoring a gate-to-source current of the power MOS FET; and electrically connecting the gate bonding pad to the input protection bonding pad.
Claim 2
Independent Claim
121 words
A method of testing a semiconductor device comprising: providing a power MOS FET having a gate electrode coupled to a gate bonding pad, and a source electrode coupled to a source bonding pad; providing an input protection network having a plurality of series connected back-to-back diode pairs, the input protection network having a first terminal coupled to the source bonding pad, and a second terminal coupled to an input protection bonding pad; testing a gate oxide rupture voltage of the power MOS FET by applying a test voltage between the gate bonding pad and the source bonding pad, and monitoring a gate-to-source current of the power MOS FET; and electrically connecting the gate bonding pad to the input protection bonding pad.
Claim 3
Dependent Claim
36 words
The method of claim 1 wherein electrically connecting the gate bonding pad to the input protection bonding pad includes attaching a bonding wire that electrically shorts the gate bonding pad to the input protection bonding pad.
Claim 4
Dependent Claim
29 words
The method of claim 1 wherein testing the gate oxide rupture voltage includes applying approximately fourteen to thirty volts between the gate bonding pad and the source bonding pad.
Claim 5
Dependent Claim
42 words
The method of claim 1 wherein the step of providing the power MOS FET includes having the gate bonding pad that is approximately 100 to 120 microns square, and having the source bonding pad that is approximately 100 to 120 microns square.
Claim 6
Independent Claim
94 words
A method of testing a semiconductor device comprising: providing a transistor of the semiconductor device having a gate coupled to a first bonding pad of the semiconductor device, and a source coupled to a second bonding pad; providing an electrical circuit having a first terminal coupled to the source, and a second terminal coupled to a third bonding pad of the semiconductor device wherein the first bonding pad is electrically isolated from the third bonding pad; testing a portion of the transistor; and electrically coupling the third bonding pad to the first bonding pad.
Claim 7
Independent Claim
94 words
A method of testing a semiconductor device comprising: providing a transistor of the semiconductor device having a gate coupled to a first bonding pad of the semiconductor device, and a source coupled to a second bonding pad; providing an electrical circuit having a first terminal coupled to the source, and a second terminal coupled to a third bonding pad of the semiconductor device wherein the first bonding pad is electrically isolated from the third bonding pad; testing a portion of the transistor; and electrically coupling the third bonding pad to the first bonding pad.
Claim 8
Dependent Claim
22 words
The method of claim 5 wherein testing the portion of the transistor includes testing a gate oxide rupture voltage of the transistor.
Claim 9
Dependent Claim
32 words
The method of claim 5 wherein providing the transistor having the gate coupled to the first bonding pad includes having the first bonding pad that is approximately 100 to 120 microns square.
Claim 10
Dependent Claim
33 words
The method of claim 5 wherein the step of providing the electrical circuit includes separating the first bonding pad from the third bonding pad by a gap of approximately ten to twenty microns.
Claim 11
Dependent Claim
23 words
The method of claim 5 wherein providing the electrical circuit includes providing the electrical circuit having a plurality of series connected back-to-back diodes.
Claim 12
Independent Claim
65 words
A method of testing a semiconductor device comprising: providing a semiconductor device having a first circuit and a second circuit wherein a portion of the first circuit is electrically isolated from the second circuit; testing a portion of the first circuit; and electrically connecting the first circuit to the second circuit including electrically connecting an input protection network to a transistor of the semiconductor device.
Claim 13
Independent Claim
65 words
A method of testing a semiconductor device comprising: providing a semiconductor device having a first circuit and a second circuit wherein a portion of the first circuit is electrically isolated from the second circuit; testing a portion of the first circuit; and electrically connecting the first circuit to the second circuit including electrically connecting an input protection network to a transistor of the semiconductor device.
Claim 14
Dependent Claim
28 words
The method of claim 10 wherein electrically connecting the first circuit to the second circuit further includes electrically connecting a first bonding pad to a second bonding pad.
Claim 15
Dependent Claim
32 words
The method of claim 10 wherein electrically connecting the first circuit to the second circuit further includes attaching a bonding wire that overlaps a first bonding pad and a second bonding pad.
Claim 16
Dependent Claim
36 words
The method of claim 10 wherein electrically connecting the first circuit to the second circuit further includes electrically connecting a first bonding pad that is approximately 100 to 120 microns square to a second bonding pad.
Claim 17
Dependent Claim
49 words
The method of claim 10 wherein electrically connecting the first circuit to the second circuit further includes electrically connecting a first bonding pad to a second bonding pad wherein the first bonding pad and the second bonding pad are separated by a gap of approximately ten to twenty microns.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-01-09 | 1998-07-11 | 1999-01-10 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-01-09 | 2002-07-11 | 2003-01-10 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-01-09 | 2006-07-11 | 2007-01-10 | $7700.00 | Window Closed / Lapsed |