Memory with minimized redundancy access delay

Claim 2

A memory, comprising: (A) a main memory array having a plurality of memory locations; (B) a main select circuit coupled to the main memory array for decoding an address received from an external circuit to access a selected one of the plurality of memory locations; (C) a redundant memory array having a plurality of redundant memory locations; (D) a storage circuit for pre-storing the address of the selected one of the plurality of memory locations when the selected one of the plurality of memory locations is defective; (E) a redundant comparison circuit coupled to the redundant memory array and the storage circuit for comparing the address received from the external circuit with the address pre-stored in the storage circuit in order to access a selected one of the plurality of redundant memory locations; (F) a static decoding circuit coupled to the storage circuit and the main select circuit for decoding the address received from the storage circuit and for statically disabling the main select circuit from accessing the selected one of the plurality of memory locations such that when the redundant comparison circuit accesses the selected one of the plurality of redundant memory locations, the main select circuit has already been disabled from accessing the selected one of the plurality of memory locations, wherein the static decoding circuit decodes the address from the storage circuit to disable the main select circuit from accessing only the selected one of the plurality of memory locations based on the address pre-stored in the storage circuit, wherein when the static decoding circuit disables the main select circuit from accessing the selected one of the plurality of memory locations, the main select circuit can still access other ones of the plurality of memory locations that are not defective.

Claim 3

The memory of claim 1, wherein the static decoding circuit only disables the access to the selected one of the plurality of memory locations, wherein the main select circuit further comprises a decoder coupled to receive the address from the external circuit and a main select circuit coupled to the decoder for selecting the selected one of the plurality of memory locations for the address.

Claim 4

The memory of claim 2, wherein the select circuit further comprises an AND gate.

Claim 5

The memory of claim 1 wherein the storage circuit includes electrically erasable and programmable read only memory cells.

Claim 6

The memory of claim 1 wherein the memory is a read only memory.

Claim 7

The memory of claim 1 wherein the memory is an electrically programmable read only memory.

Claim 8

The memory of claim 1 wherein the memory is an electrically erasable and programmable read only memory.

Claim 9

The memory of claim 1 wherein the memory is a random access memory.

Claim 10

The memory of claim 1 wherein the storage circuit further comprises a storage location for storing the address and a logic circuit for generating an adjacent address of the address stored in the storage location.

Claim 11

A memory, comprising: (A) a main memory array having a plurality of memory locations; (B) a main select circuit coupled to the main memory array for decoding an address received from an external circuit to access a selected one of the plurality of memory locations; (C) a, redundant memory array having a plurality of redundant memory locations; (D) a storage circuit for pre-storing the address of the selected one of the plurality of memory locations when the selected one of the plurality of memory locations is defective: (E) a redundant comparison circuit coupled to the redundant memory array and the storage circuit for comparing the address received from the external circuit with the address pre-stored in the storage circuit in order to access a selected one of the plurality of redundant memory locations; (F) a static decoding circuit couched to the storage circuit and the main select circuit for decoding the address received from the storage circuit and for statically disabling the main select circuit from accessing the selected one of the plurality of memory locations such that when the redundant comparison circuit accesses the selected one of the plurality of redundant memory locations, the main select circuit has already been disabled from accessing the selected one of the plurality of memory locations, wherein the static decoding circuit further comprises (i) a decoding circuit coupled to the storage circuit for statically decoding the address received from the storage circuit to generate a control signal, wherein the decoding circuit decodes the address from the storage circuit when the address is stored in the storage circuit; (ii) a disabling circuit coupled to the main select circuit and the decoding circuit for receiving the control signal from the decoding circuit to statically disable the main select circuit from accessing the selected one of the plurality of memory locations before the redundant comparison circuit decodes the address from the external circuit to select the selected one of the plurality of redundant memory locations, wherein the disabling circuit only disables the main select circuit from accessing the selected one of the plurality of memory locations while the main select circuit can still access other ones of the plurality of memory locations that are not defective.

Claim 12

A memory, comprising: (A) a main memory array having a plurality of memory locations; (B) a main select circuit coupled to the main memory array for decoding an address received from an external circuit to access a selected one of the plurality of memory locations; (C) a, redundant memory array having a plurality of redundant memory locations; (D) a storage circuit for pre-storing the address of the selected one of the plurality of memory locations when the selected one of the plurality of memory locations is defective: (E) a redundant comparison circuit coupled to the redundant memory array and the storage circuit for comparing the address received from the external circuit with the address pre-stored in the storage circuit in order to access a selected one of the plurality of redundant memory locations; (F) a static decoding circuit couched to the storage circuit and the main select circuit for decoding the address received from the storage circuit and for statically disabling the main select circuit from accessing the selected one of the plurality of memory locations such that when the redundant comparison circuit accesses the selected one of the plurality of redundant memory locations, the main select circuit has already been disabled from accessing the selected one of the plurality of memory locations, wherein the static decoding circuit further comprises (i) a decoding circuit coupled to the storage circuit for statically decoding the address received from the storage circuit to generate a control signal, wherein the decoding circuit decodes the address from the storage circuit when the address is stored in the storage circuit; (ii) a disabling circuit coupled to the main select circuit and the decoding circuit for receiving the control signal from the decoding circuit to statically disable the main select circuit from accessing the selected one of the plurality of memory locations before the redundant comparison circuit decodes the address from the external circuit to select the selected one of the plurality of redundant memory locations, wherein the disabling circuit only disables the main select circuit from accessing the selected one of the plurality of memory locations while the main select circuit can still access other ones of the plurality of memory locations that are not defective.

Claim 13

A nonvolatile memory, comprising: (a) a main memory array having a plurality of memory locations; (b) a main select circuit coupled to the main memory array for selecting and accessing a selected one of the plurality of memory locations in the main memory array; (c) a main decoding circuit coupled to the main select circuit for decoding an address received from an external circuit to cause the main select circuit to access the selected one of the plurality of memory locations; (d) a redundant memory array having a plurality of redundant memory locations; (e) a redundant select circuit coupled to the redundant memory array for selecting and accessing a selected one of the plurality of redundant memory locations in the redundant memory array; (f) a storage circuit for pre-storing the address for the selected one of the plurality of memory locations when the selected one of the plurality of memory locations is defective; (g) a static decoding and disabling circuit coupled to the storage circuit and the main select circuit for decoding the address pre-stored in the storage circuit to disable the main select circuit from accessing the selected one of the plurality of memory locations before the main decoding circuit receives the address from the external circuit, wherein the static decoding and disabling circuit statically disables the main select circuit from accessing the selected one of the plurality of memory locations as soon as the address for the selected one of the plurality of memory locations is stored in the storage circuit, wherein the static decoding and disabling circuit decodes the address from the storage circuit only to disable the main select circuit from accessing the selected one of the plurality of memory locations based on the address pre-stored in the storage circuit, wherein when the static decoding and disabling circuit disables the main select circuit from accessing the selected one of the plurality of memory locations, the main select circuit can still access other ones of the plurality of memory locations that are not defective; (h) a redundancy comparison circuit coupled to the storage circuit and the redundant select circuit for comparing the address received from the storage circuit with the address from the external circuit and for enabling the redundant select circuit to access the selected one of the plurality of redundant memory locations when the stored address matches the address from the external circuit, wherein when the redundant comparison circuit causes the redundant select circuit to access the selected one of the plurality of redundant memory locations in the redundant memory array, the main select circuit has already been disabled from accessing the selected one of the plurality of memory locations.

Claim 14

A nonvolatile memory, comprising: (a) a main memory array having a plurality of memory locations; (b) a main select circuit coupled to the main memory array for selecting and accessing a selected one of the plurality of memory locations in the main memory array; (c) a main decoding circuit coupled to the main select circuit for decoding an address received from an external circuit to cause the main select circuit to access the selected one of the plurality of memory locations; (d) a redundant memory array having a plurality of redundant memory locations; (e) a redundant select circuit coupled to the redundant memory array for selecting and accessing a selected one of the plurality of redundant memory locations in the redundant memory array; (f) a storage circuit for pre-storing the address for the selected one of the plurality of memory locations when the selected one of the plurality of memory locations is defective; (g) a static decoding and disabling circuit coupled to the storage circuit and the main select circuit for decoding the address pre-stored in the storage circuit to disable the main select circuit from accessing the selected one of the plurality of memory locations before the main decoding circuit receives the address from the external circuit, wherein the static decoding and disabling circuit statically disables the main select circuit from accessing the selected one of the plurality of memory locations as soon as the address for the selected one of the plurality of memory locations is stored in the storage circuit, wherein the static decoding and disabling circuit decodes the address from the storage circuit only to disable the main select circuit from accessing the selected one of the plurality of memory locations based on the address pre-stored in the storage circuit, wherein when the static decoding and disabling circuit disables the main select circuit from accessing the selected one of the plurality of memory locations, the main select circuit can still access other ones of the plurality of memory locations that are not defective; (h) a redundancy comparison circuit coupled to the storage circuit and the redundant select circuit for comparing the address received from the storage circuit with the address from the external circuit and for enabling the redundant select circuit to access the selected one of the plurality of redundant memory locations when the stored address matches the address from the external circuit, wherein when the redundant comparison circuit causes the redundant select circuit to access the selected one of the plurality of redundant memory locations in the redundant memory array, the main select circuit has already been disabled from accessing the selected one of the plurality of memory locations.

Claim 15

The nonvolatile memory of claim 11, wherein the storage circuit further comprises electrically erasable and programmable read only memory cells.

Claim 16

The nonvolatile memory of claim 11, wherein the nonvolatile memory is an electrically programmable read only memory.

Claim 17

The nonvolatile memory of claim 11, wherein the nonvolatile memory is an electrically erasable and programmable read only memory.

Claim 18

The nonvolatile memory of claim 11, wherein the main select circuit further comprises an AND gate.

Claim 19

The nonvolatile memory of claim 11, wherein the storage circuit further comprises a storage location for storing the address and a logic circuit for generating an adjacent address of the address stored in the storage location.