US5420518A
Expired / Lapsed
US
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Sensor and method for the in situ monitoring and control of microstructure during rapid metal forming processes
Assignee: Individual
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Filing: 1993-09-23
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Granted: 1995-05-30
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Expires: 2013-09-23
Abstract
Abstract An electronic resonator is employed for the on-line nondestructive measurement of microstructure, as defined by the diameter of grains of the type found in ferritic steel alloys during high rate formation processes. The quality factor (Q) of an inductive-capacitive (LC) tank circuit is determined to obtain a measure of energy dissipated in a steel alloy sample inductively coupled to it. Dissipative energy in the sample results from two sources, hysteresis and eddy currents. Eddy current loss is relatively microstructure insensitive and is mainly related to chemical composition and temperature while hysteresis loss is determined by microstructural factors. If microstructural variables other than grain size, and the factors determining eddy current loss are held constant, grain size becomes the dominant factor in differential energy loss with grain size being inversely related to hysteresis loss. Under these condition grain size is inversely related to energy dissipation and thus the measured Q of the resonant circuit.
Inventors
- 👤 Kenneth L. Schafer, Jr.
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 12:10
CPC Classifications
B; B22; B22D; B22D46/00; G; G01; G01N; G01N27/00; G01N27/72; G01N33/00; G01N33/20; G01N33/204
Claims Analysis
Total Claims: 28
Claim 1
Independent Claim
265 words
A method for in situ measurement and process control of polycrystalline ferritic microstructure at a number of different depths in a material comprising the steps of: moving the materials and a predetermined measuring point relative to one another; inductively coupling the material to an LC resonator by means of a pure sinusoidal radio frequency electromagnetic field as the materials and the test point travel relative to one another; sensing the difference in energy dissipation produced by inductively coupling the material to the LC resonator at the test point as the materials and test point travel relative to one another; determining the microstructural status of material using the differential quality factor, Q, of the LC circuit while inductively coupled to the sample material at the test point as a dependent variable; determining the temperature of the sample material by non-contacting means at the test point as the material and the test point travel relative to each other; compensating the Q determined measure of microstructural status relative to the temperature of the sample material; obtaining mean temperature-compensated Q determined measures by averaging a number of successive temperature-compensated Q determinations; obtaining the standard deviation of the temperature-compensated Q determination for a number of successive temperature-compensated Q determinations; determining mean grain size, grain geometry, or grain orientation by using mean temperature-compensated Q determinations; determining frequency of inclusions or uniformity of coatings by using the standard deviation of temperature-compensated Q determinations; and varying at least one process parameter in response to the determined mean grain size of at least one depth to control grain size for at least one depth.
Claim 2
Independent Claim
265 words
A method for in situ measurement and process control of polycrystalline ferritic microstructure at a number of different depths in a material comprising the steps of: moving the materials and a predetermined measuring point relative to one another; inductively coupling the material to an LC resonator by means of a pure sinusoidal radio frequency electromagnetic field as the materials and the test point travel relative to one another; sensing the difference in energy dissipation produced by inductively coupling the material to the LC resonator at the test point as the materials and test point travel relative to one another; determining the microstructural status of material using the differential quality factor, Q, of the LC circuit while inductively coupled to the sample material at the test point as a dependent variable; determining the temperature of the sample material by non-contacting means at the test point as the material and the test point travel relative to each other; compensating the Q determined measure of microstructural status relative to the temperature of the sample material; obtaining mean temperature-compensated Q determined measures by averaging a number of successive temperature-compensated Q determinations; obtaining the standard deviation of the temperature-compensated Q determination for a number of successive temperature-compensated Q determinations; determining mean grain size, grain geometry, or grain orientation by using mean temperature-compensated Q determinations; determining frequency of inclusions or uniformity of coatings by using the standard deviation of temperature-compensated Q determinations; and varying at least one process parameter in response to the determined mean grain size of at least one depth to control grain size for at least one depth.
Claim 3
Dependent Claim
39 words
The method of claim 1 wherein the differential impedance (Z) of the LC circuit while inductively coupled to the sample material at the test point is used as the dependent variable in determining the microstructural status of the material.
Claim 4
Dependent Claim
59 words
The method of claim 1 wherein the differential lifetime expressed by the exponential response decay parameter, γ, to a pulse of sinusoidal radio frequency energy at the center frequency of the LC resonator circuit while inductively coupled to the sample material at the test point is used as a dependent variable in determining the microstructural status of the material.
Claim 5
Dependent Claim
38 words
The method of claim 1 wherein the LC resonator center frequency can be modified to allow sinusoidal radio frequency drive signals of different frequencies and thus sample material penetration depth, and hence the effective depth of microstructural measurement.
Claim 6
Dependent Claim
40 words
The method of claim 1 is further characterized in that said material is a material having a grain size gradient and the increment of the varying comprises controlling the grain size gradient responsive to determinations of the mean grain size.
Claim 7
Dependent Claim
21 words
The method of claim 5 wherein the grain geometry gradient and the increment of varying comprises the responsive parameter of control.
Claim 8
Dependent Claim
21 words
The method of claim 5 wherein the grain orientation gradient and the increment of varying comprises the responsive parameter of control.
Claim 9
Dependent Claim
42 words
The method of claim 1 is further characterized in that said material is a material having a distribution of inclusions and the increment of varying comprises controlling the frequency of inclusions responsive to determinations of the standard deviations of the microstructural status.
Claim 10
Dependent Claim
22 words
The method of claim 8 wherein the uniformity of a coating and the increment of varying comprises the responsive parameter of control.
Claim 11
Dependent Claim
35 words
The method of claim 8 wherein the uniformity of lines scribed in the surface of said material or coating perpendicular to the rolling direction and the increment of varying comprises the responsive parameter of control.
Claim 12
Dependent Claim
23 words
The method of claim 8 wherein the uniformity of selective coating ablation and the increment of varying comprises the responsive parameter of control.
Claim 13
Dependent Claim
22 words
The method of claim 8 wherein the uniformity of surface ablation and the increment of varying comprises the responsive parameter of control.
Claim 14
Dependent Claim
227 words
Apparatus for the in situ monitoring and process control of polycrystalline ferritic microstructure in materials comprising: means for moving the materials to a specified test point; means for inductively coupling the material to an LC resonator by a pure sinusoidal radio frequency electromagnetic field at the specified test point; means for measuring the difference in energy dissipation produced by inductively coupling the material to the LC resonator at the test point; means for determining the microstructural status of the material using the differential quality factor (Q) of the LC resonator while inductively coupled to the sample material at the test point; means for determining the temperature of the sample material by non-contacting sensor at the test point; means for compensating the Q determined measure of microstructural status relative to the temperature of the sample material; means for averaging a number of successive temperature-compensated Q measures; means for obtaining the standard deviation of a number of successive temperature-compensated Q measures; means for calculating average grain size, grain geometry, or grain orientation from temperature-compensated averaged Q measures; means for calculating the frequency of inclusions or uniformity of coating from the standard deviation of average temperature-compensated Q measures; means for controlling at least one processed parameter in response to the Q determined average grain size of at least one depth to control the grain size for at least one depth.
Claim 15
Dependent Claim
227 words
Apparatus for the in situ monitoring and process control of polycrystalline ferritic microstructure in materials comprising: means for moving the materials to a specified test point; means for inductively coupling the material to an LC resonator by a pure sinusoidal radio frequency electromagnetic field at the specified test point; means for measuring the difference in energy dissipation produced by inductively coupling the material to the LC resonator at the test point; means for determining the microstructural status of the material using the differential quality factor (Q) of the LC resonator while inductively coupled to the sample material at the test point; means for determining the temperature of the sample material by non-contacting sensor at the test point; means for compensating the Q determined measure of microstructural status relative to the temperature of the sample material; means for averaging a number of successive temperature-compensated Q measures; means for obtaining the standard deviation of a number of successive temperature-compensated Q measures; means for calculating average grain size, grain geometry, or grain orientation from temperature-compensated averaged Q measures; means for calculating the frequency of inclusions or uniformity of coating from the standard deviation of average temperature-compensated Q measures; means for controlling at least one processed parameter in response to the Q determined average grain size of at least one depth to control the grain size for at least one depth.
Claim 16
Dependent Claim
37 words
The apparatus of claim 13 wherein the differential impedance (Z) of the LC circuit while inductively coupled to the sample material at the test point comprises the dependent variable in determining the microstructural status of the material.
Claim 17
Dependent Claim
52 words
The apparatus of claim 13 wherein the differential value of the exponential response decay parameter, γ, to a sinusoidal radio frequency energy at the center frequency of the LC resonator while inductively coupled to the sample at the test point comprises the dependent variable in determining the microstructural status of the material.
Claim 18
Dependent Claim
22 words
The apparatus of claim 13 wherein the LC resonator center frequency can be modified to determine the effective depth of microstructural measurement.
Claim 19
Dependent Claim
31 words
The apparatus of claim 13 wherein said material has a grain size gradient and wherein the means for controlling controls the grain size gradient responsive to determination of average grain diameter.
Claim 20
Dependent Claim
31 words
The apparatus of claim 13 wherein said material has a grain geometry gradient and wherein the means for controlling controls the grain geometry gradient responsive to determination of average grain geometry.
Claim 21
Dependent Claim
31 words
The apparatus of claim 13 wherein said material has a grain orientation gradient and wherein the means for controlling controls the grain orientation gradient responsive to determination of average grain orientation.
Claim 22
Dependent Claim
43 words
The apparatus of claim 13 is further characterized in that said material is a material having a distribution of inclusions and wherein the means for controlling controls the frequency of inclusions responsive to determination of standard deviations of the Q determined microstructural status.
Claim 23
Dependent Claim
27 words
The apparatus of claim 20 wherein a coating on said material has a gradient of uniformity and wherein the means for controlling controls the gradient of uniformity.
Claim 24
Dependent Claim
40 words
The apparatus of claim 20 wherein lines scribed on the surface of said material or coating on said material perpendicular to the rolling direction have a gradient of uniformity and wherein the means for controlling controls the gradient of uniformity.
Claim 25
Dependent Claim
29 words
The apparatus of claim 20 wherein the selective coating ablation of said material has a gradient of uniformity and wherein the means for controlling controls the gradient of uniformity.
Claim 26
Dependent Claim
28 words
The apparatus of claim 20 wherein the surface ablation of said material has a gradient of uniformity and wherein the means for controlling controls the gradient of uniformity.
Claim 27
Dependent Claim
30 words
The apparatus of claim 13 wherein the LC resonator comprises a pair of thin film Y 1 B 2 C 3 O 7 planar inductors separated by a dielectric substrate.
Claim 28
Dependent Claim
14 words
The apparatus of claim 25 wherein the LC resonator is maintained at superconducting temperatures.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-05-29 | 1998-11-28 | 1999-05-30 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-05-29 | 2002-11-28 | 2003-05-30 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-05-29 | 2006-11-28 | 2007-05-30 | $7700.00 | Window Closed / Lapsed |