Particle analyzing apparatus and method wherein a one dimension image sensor optically tracks a particle

Claim 2

A particle image analyzing apparatus comprising: a flow cell for enclosing a solution containing particles to be analyzed in a sheathed flow to form the solution into a sample solution flow; an irradiation optical system for emitting light to irradiate an irradiation area on the sample solution flow; a one dimension image sensor for defining an elongated detection area across the sample solution flow within the irradiation area and receiving light transmitted through a part of the particle in the elongated detection area to scan the particle across the sample solution flow and output an image signal, the detection area having a width narrower than a diameter of the particle; optical deflection means disposed between said flow cell and said one dimension image sensor for variably deflecting the transmitted light introduced to the image sensor; control means for controlling a deflection angle of said optical deflection means such that said one dimension image sensor optically tracks the particle at a speed different from a travelling speed of said particle; and signal processing means for processing an output image signal of said one dimension image sensor to analyze the particle.

Claim 3

The apparatus according to claim 1 wherein said control means controls the deflection angle of said optical deflection means so that the one dimension image sensor optically tracks at a speed of V2, the particle traveling at a speed of V1, and the speeds V1 and V2 are related such that V1>V2>0, so that the image sensor scans the same particle a plurality of times.

Claim 4

The apparatus according to claim 1 wherein said control means initiates control of the deflection angle of said optical deflection means based on the output image signal of the one dimension image sensor.

Claim 5

The apparatus according to claim 1 wherein said signal processing means includes means for outputting a scanning signal in a cycle and said one dimension image sensor outputs the image signal in synchronization with the scanning signal.

Claim 6

The apparatus according to claim 1 wherein the sample solution flow is a flat flow and said irradiation optical system irradiates a wider side relative to the sample solution flow.

Claim 7

The apparatus according to claim 1 wherein said optical deflection means comprises an angle variable prism that deflects light by varying the thickness of an optical medium disposed between two transparent plates, the optical medium having a high refraction index.

Claim 8

The apparatus according to claim 1 wherein said optical deflection means comprises an acousto-optic deflector.

Claim 9

The apparatus according to claim 1 wherein said optical deflection means comprises a galvano-mirror.

Claim 10

A particle image analyzing apparatus comprising: a flow cell enclosing a solution containing a particle to be analyzed in a sheathed flow to form the solution into a sample solution flow; a first irradiation optical system for emitting first light to irradiate an irradiation area on the sample solution flow; a one dimension image sensor for defining an elongated detection area within the irradiation area and receiving the first light transmitted through a part of the particle in the detection area to scan the particle across the sample solution flow and output an image signal, a width of the detection area having a width narrower than a diameter of the particle; optical deflection means, disposed between said flow cell and said one dimension image sensor, for variably deflecting the transmitted first light introduced to said one dimension image sensor; control means for controlling a deflection angle of said optical deflection means such that said one dimension image sensor optically tracks the particle at a speed different from a travelling speed of said particle; a second irradiation optical system for emitting a second light to irradiate the particle irradiated with the first light; light detecting means for detecting at least one of scattered light and fluorescence from the particle caused by the second light and for outputting a detected signal; and signal processing means for analyzing the particle based on the image signal from said one dimension image sensor and the detected signal from said light detecting means.

Claim 11

A particle image analyzing apparatus comprising: a flow cell enclosing a solution containing a particle to be analyzed in a sheathed flow to form the solution into a sample solution flow; a first irradiation optical system for emitting first light to irradiate an irradiation area on the sample solution flow; a one dimension image sensor for defining an elongated detection area within the irradiation area and receiving the first light transmitted through a part of the particle in the detection area to scan the particle across the sample solution flow and output an image signal, a width of the detection area having a width narrower than a diameter of the particle; optical deflection means, disposed between said flow cell and said one dimension image sensor, for variably deflecting the transmitted first light introduced to said one dimension image sensor; control means for controlling a deflection angle of said optical deflection means such that said one dimension image sensor optically tracks the particle at a speed different from a travelling speed of said particle; a second irradiation optical system for emitting a second light to irradiate the particle irradiated with the first light; light detecting means for detecting at least one of scattered light and fluorescence from the particle caused by the second light and for outputting a detected signal; and signal processing means for analyzing the particle based on the image signal from said one dimension image sensor and the detected signal from said light detecting means.

Claim 12

The apparatus according to claim 9 wherein the first light is different from the second light in wavelength.

Claim 13

The apparatus according to claim 9 wherein said light detecting means comprises scattered light detecting means for detecting the scattered light from the particle, and said control means initiates control of the deflection angle of said optical deflection means based on an output signal from said scattered light detecting means.

Claim 14

An apparatus of claim 9 wherein said light detecting means comprises fluorescence detecting means for detecting the fluorescence from the particle, and said control means initiates control of the deflection angle of optical deflection means based on an output signal from said fluorescence detecting means.

Claim 15

The apparatus according to claim 9 wherein said optical deflection means comprises an angle variable prism that deflects light by varying the thickness of an optical medium disposed between two transparent plates, the optical medium having a high refraction index.

Claim 16

A particle image analyzing method comprising the steps of: enclosing a solution containing particles to be analyzed in a sheathed flow to form said solution into a sample solution flow; emitting light to irradiate said sample solution flow; scanning said particle by a one dimension image sensor which receives said light transmitted through said particle; controlling a deflection angle of said light after transmission through said particle such that said one dimension image sensor optically tracks said particle at a speed different from a travelling speed of said particle; and processing an output image signal of said one dimension image sensor to analyze said particle.

Claim 17

A particle image analyzing method comprising the steps of: enclosing a solution containing particles to be analyzed in a sheathed flow to form said solution into a sample solution flow; emitting light to irradiate said sample solution flow; scanning said particle by a one dimension image sensor which receives said light transmitted through said particle; controlling a deflection angle of said light after transmission through said particle such that said one dimension image sensor optically tracks said particle at a speed different from a travelling speed of said particle; and processing an output image signal of said one dimension image sensor to analyze said particle.

Claim 18

The particle image analyzing method of claim 14, wherein said controlling step comprises the substep of; controlling said deflection angle so that said one dimension image sensor optically tracks at a speed of V2, said particle traveling at a speed of V1, and said speed V1 and speed V2 are related such that V1>V2>0, so that said sensor scans the sample particle a plurality of times.

Claim 19

The particle image analyzing method of claim 14, wherein said controlling step comprises the substep of; initiating control of said deflection angle based on said output image signal of said one dimension image sensor.

Claim 20

The particle image analyzing method of claim 14, wherein said controlling step comprises the substep of; outputting a scanning signal in a cycle; and outputting said output image signal in synchronization with said scanning signal.

Claim 21

The particle image analyzing method of claim 14, wherein said scanning step comprises the substep of; scanning said particle in a direction across said sample solution flow.

Claim 22

A particle image analyzing method comprising the steps of: enclosing a solution containing particles to be analyzed in a sheathed flow to form said solution into a sample solution flow; emitting first light to irradiate said sample solution flow; scanning said particle by a one dimension image sensor which receives said first light transmitted through said particle; controlling a deflection angle of said first light after transmission through said particle such that said one dimension image sensor optically tracks said particle at a speed different from a travelling speed of said particle; emitting second light to irradiate said particle; detecting at least one of scattered light and fluorescence from said particle caused by said second light; and analyzing said particle based on a signals obtained by said scanning step and said detecting step.

Claim 23

A particle image analyzing method comprising the steps of: enclosing a solution containing particles to be analyzed in a sheathed flow to form said solution into a sample solution flow; emitting first light to irradiate said sample solution flow; scanning said particle by a one dimension image sensor which receives said first light transmitted through said particle; controlling a deflection angle of said first light after transmission through said particle such that said one dimension image sensor optically tracks said particle at a speed different from a travelling speed of said particle; emitting second light to irradiate said particle; detecting at least one of scattered light and fluorescence from said particle caused by said second light; and analyzing said particle based on a signals obtained by said scanning step and said detecting step.

Claim 24

The particle image analyzing method of claim 19, wherein a wavelength of said first light is different from a wavelength of said second light.

Claim 25

The particle image analyzing method of claim 19, wherein said controlling step further comprises the substep of: initiating control of said deflection angle based on an output signal obtained by a detection of said scattered light in said controlling step.

Claim 26

The particle image analyzing method of claim 19, wherein said controlling step further comprises the substep of: initiating control of said deflection angle based on an output signal obtained by a detection of said fluorescence in said controlling step.