Test timing program automatic generator

Claim 1

An automatic test timing condition setting program generator for automatically generating a test timing condition setting program which defines a test timing condition of a test program for a semiconductor device, comprising: input means for inputting product inspection specification data, said product inspection specification data being data describing to a timing of test signals which are given to said semiconductor device during a test of said semiconductor device, said product inspection specification data including set time data which defines a test start timing; memory means for storing information about a predetermined check item regarding which said product inspection specification data is checked; intermediate data generating means for checking said product inspection specification data which is inputted using said input means with regard to said check item which is stored in said memory means and, when said check item is satisfied, converting said product inspection specification data into intermediate data in accordance with said set time data, said intermediate data being written in terms of timing in which said test start timing is used as a reference timing; and conversion means for converting a format of said intermediate data into a test program format acceptable to a particular semiconductor tester thereby producing a source program of said test timing condition setting program.