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US5437777A Expired / Lapsed US ⏱️ 0.0 years remaining

Apparatus for forming a metal wiring pattern of semiconductor devices

Assignee: NEC Corp
•
Filing: 1992-12-28
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Granted: 1995-08-01
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Expires: 2012-12-28
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Abstract

Abstract A plating apparatus for forming a wiring pattern on a surface of a semiconductor wafer by causing a plating liquid into contact with the surface of the semiconductor wafer, comprises a storage tank storing and heating a plating liquid, a plating tank provided adjacent to the storage tank and having an opening formed in a wall at the side opposite to the side adjacent to the storage tank. The plating tank is supplied with the plating liquid from the storage tank, and the opening is configured to bring the surface of the semiconductor wafer into contact with the treatment liquid within the treatment tank. A holding mechanism is provided for holding the semiconductor wafer vertically and pushing the surface of the semiconductor wafer to the opening. With this arrangement, it is possible to prevent the unevenness of the plating which would otherwise have been caused by the bubbles generated in the process of the plating.

Inventors

  • 👤 Shuji Kishi

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 11:50
CPC Classifications
H; H10; H10P; H10P72/00; H10P72/04; H10P72/0448

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 127 words
A plating apparatus for forming a wiring pattern on a surface of a semiconductor wafer by causing a plating liquid into contact with the surface of the semiconductor wafer, the plating apparatus comprising a storage tank storing and heating a treatment liquid, a treatment tank provided adjacent to said storage tank and having an opening formed in a wall at the side opposite to the side adjacent to said storage tank, said treatment tank being supplied with said treatment liquid from said storage tank, said opening being configured to bring the surface of the semiconductor wafer into contact with said treatment liquid within said treatment tank, and a holding mechanism for holding said semiconductor wafer vertically and pushing said surface of said semiconductor wafer to said opening.
Claim 2
Dependent Claim 127 words
A plating apparatus for forming a wiring pattern on a surface of a semiconductor wafer by causing a plating liquid into contact with the surface of the semiconductor wafer, the plating apparatus comprising a storage tank storing and heating a treatment liquid, a treatment tank provided adjacent to said storage tank and having an opening formed in a wall at the side opposite to the side adjacent to said storage tank, said treatment tank being supplied with said treatment liquid from said storage tank, said opening being configured to bring the surface of the semiconductor wafer into contact with said treatment liquid within said treatment tank, and a holding mechanism for holding said semiconductor wafer vertically and pushing said surface of said semiconductor wafer to said opening.
Claim 3
Dependent Claim 50 words
A plating apparatus claimed in claim 1 further including a gas blowing mechanism provided in said treatment tank for blowing a gas into said treatment liquid within said treatment tank toward said surface of said semiconductor wafer which is held by said holding mechanism to be pushed to said opening.
Claim 4
Dependent Claim 64 words
A plating apparatus claimed in claim 2 further including a plurality of needle electrodes provided at a periphery of said opening and configured to be brought into contact with said surface of said semiconductor wafer which is held by said holding mechanism to be pushed to said opening, and a plate electrode located on an inner wall at a position opposing to said opening.
Claim 5
Dependent Claim 64 words
A plating apparatus claimed in claim 1 further including a plurality of needle electrodes provided at a periphery of said opening and configured to be brought into contact with said surface of said semiconductor wafer which is held by said holding mechanism to be pushed to said opening, and a plate electrode located on an inner wall at a position opposing to said opening.

References Cited (Backward Citations)

JPH03190134A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1998-07-31 1999-01-30 1999-08-01 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2002-07-31 2003-01-30 2003-08-01 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2006-07-31 2007-01-30 2007-08-01 $7700.00 Window Closed / Lapsed

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