US5554564A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Pre-oxidizing high-dielectric-constant material electrodes
Assignee: Texas Instruments Inc
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Filing: 1994-08-01
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Granted: 1996-09-10
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Expires: 2014-08-01
Abstract
Abstract An improved method of forming a capacitor electrode for a microelectronic structure such as a dynamic read only memory is disclosed which has a high dielectric constant (HDC) material as a capacitor dielectric. According to an embodiment of the present invention, the sidewall of the adhesion layer (e.g. TiN 36) in a lower electrode is pre-oxidized after deposition of an unreactive noble metal layer (e.g. Pt 38) but before deposition of an HDC material (e.g. BST 42). An important aspect of the present invention is that the pre-oxidation of the sidewall generally causes a substantial amount of the potential sidewall expansion (and consequent noble metal layer deformation) to occur before deposition of the HDC material.
Inventors
- 👤 Yasushiro Nishioka
- 👤 Scott R. Summerfelt
- 👤 Kyung-ho Park
- 👤 Pijush Bhattacharya
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 17:36
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/60; H10D1/68; H10D1/692; H10D1/682; H10D1/696; Y; Y10; Y10S; Y10S257/00; Y10S257/915
Claims Analysis
Total Claims: 24
Claim 1
Independent Claim
136 words
A method of forming a microelectronic structure, said method comprising steps: (a) forming a supporting layer having a principal surface; (b) forming an adhesion layer on said principal surface of said supporting layer, said adhesion layer comprising a substantially unoxidized sidewall; (c) forming a noble metal layer on a top surface of said adhesion layer; (d) oxidizing said unoxidized sidewall of said adhesion layer to form a pre-oxidized sidewall; and (e) subsequent to oxidizing said sidewall depositing a high-dielectric-constant material layer on said noble metal layer, wherein said pre-oxidized sidewall inhibits further oxidation and expansion of said adhesion layer adjacent said pre-oxidized sidewall during the deposition of the high-dielectric-constant material as compared to oxidation and expansion that would occur in the adhesion layer when the adhesion layer is not oxidized prior to depositing the high-dielectric-constant material.
Claim 2
Independent Claim
136 words
A method of forming a microelectronic structure, said method comprising steps: (a) forming a supporting layer having a principal surface; (b) forming an adhesion layer on said principal surface of said supporting layer, said adhesion layer comprising a substantially unoxidized sidewall; (c) forming a noble metal layer on a top surface of said adhesion layer; (d) oxidizing said unoxidized sidewall of said adhesion layer to form a pre-oxidized sidewall; and (e) subsequent to oxidizing said sidewall depositing a high-dielectric-constant material layer on said noble metal layer, wherein said pre-oxidized sidewall inhibits further oxidation and expansion of said adhesion layer adjacent said pre-oxidized sidewall during the deposition of the high-dielectric-constant material as compared to oxidation and expansion that would occur in the adhesion layer when the adhesion layer is not oxidized prior to depositing the high-dielectric-constant material.
Claim 3
Dependent Claim
27 words
The method according to claim 1, wherein said step (d) of forming said pre-oxidized sidewall deforms a portion of said noble metal layer overlying said pre-oxidized sidewall.
Claim 4
Dependent Claim
24 words
The method according to claim 1, said step (e) further comprising depositing said high-dielectric-constant material layer on said pre-oxidized sidewall of said adhesion layer.
Claim 5
Dependent Claim
14 words
The method according to claim 1, wherein said pre-oxidized sidewall comprises a conductive oxide.
Claim 6
Dependent Claim
19 words
The method according to claim 4, wherein said adhesion layer comprises ruthenium and said pre-oxidized sidewall comprises ruthenium dioxide.
Claim 7
Dependent Claim
32 words
The method according to claim 4, said method further comprising oxidizing said top surface of said adhesion layer prior to said step of forming said noble metal layer on said top surface.
Claim 8
Dependent Claim
19 words
The method according to claim 6, wherein said adhesion layer comprises ruthenium and said pre-oxidized sidewall comprises ruthenium dioxide.
Claim 9
Dependent Claim
27 words
The method according to claim 4, said method further comprising oxidizing said top surface of said adhesion layer during said step of depositing the high-dielectric-constant material layer.
Claim 10
Dependent Claim
19 words
The method according to claim 1, said method further comprising forming an upper electrode on said high-dielectric-constant material layer.
Claim 11
Dependent Claim
26 words
The method according to claim 9, wherein said upper electrode is selected from the group consisting of: palladium, ruthenium, rhodium, gold, iridium, silver, and combinations thereof.
Claim 12
Dependent Claim
14 words
The method according to claim 1, wherein said pre-oxidized sidewall comprises an insulating oxide.
Claim 13
Dependent Claim
20 words
The method according to claim 11, wherein said adhesion layer comprises titanium nitride and said insulating oxide comprises titanium dioxide.
Claim 14
Dependent Claim
37 words
The method according to claim 1, wherein said adhesion layer is selected from the group of conductive materials consisting of: metals, metal nitrides, metal oxides, metal silicides, metal carbides, metal borides, ternary amorphous nitrides, and combinations thereof.
Claim 15
Dependent Claim
48 words
The method according to claim 1, wherein said adhesion layer is selected from the group consisting of: titanium aluminum nitride, Zr nitride, Hf nitride, Y nitride, Sc nitride, La nitride, N deficient A1 nitride, doped A1 nitride, Mg nitride, Ca nitride, Sr nitride, Ba nitride, and combinations thereof.
Claim 16
Dependent Claim
51 words
The method according to claim 1, wherein said high-dielectric-constant material layer is selected from the group consisting off barium strontium titanate, lead zirconate titanate, lead lanthanum titanate, lead lanthanum zirconate titanate, bismuth titanate, potassium tantalate, lead scandium tantalate, lead niobate, lead zinc niobate, potassium niobate, lead magnesium niobate, and combinations thereof.
Claim 17
Dependent Claim
25 words
The method according to claim 1, wherein said noble metal layer is selected from the group consisting off platinum, palladium, iridium, rhodium, and combinations thereof.
Claim 18
Independent Claim
138 words
A method of forming a microelectronic structure, said method comprising steps: (a) forming a supporting layer having a principal surface; (b) forming a conductive adhesion layer on said principal surface of said supporting layer, said adhesion layer comprising a substantially unoxidized sidewall; (c) forming a noble metal layer on a top surface of said adhesion layer; (d) oxidizing said unoxidized sidewall of said adhesion layer to form a conductive preoxidized sidewall; and (e) subsequent to oxidizing said sidewall depositing a high-dielectric-constant material layer on said noble metal layer, wherein said pre-oxidized sidewall inhibits further oxidation and expansion of said adhesion layer adjacent said pre-oxidized sidewall during the deposition of the high-dielectric-constant material as compared to oxidation and expansion that would occur in the adhesion layer when the adhesion layer is not oxidized prior to depositing the high-dielectric-constant material.
Claim 19
Independent Claim
138 words
A method of forming a microelectronic structure, said method comprising steps: (a) forming a supporting layer having a principal surface; (b) forming a conductive adhesion layer on said principal surface of said supporting layer, said adhesion layer comprising a substantially unoxidized sidewall; (c) forming a noble metal layer on a top surface of said adhesion layer; (d) oxidizing said unoxidized sidewall of said adhesion layer to form a conductive preoxidized sidewall; and (e) subsequent to oxidizing said sidewall depositing a high-dielectric-constant material layer on said noble metal layer, wherein said pre-oxidized sidewall inhibits further oxidation and expansion of said adhesion layer adjacent said pre-oxidized sidewall during the deposition of the high-dielectric-constant material as compared to oxidation and expansion that would occur in the adhesion layer when the adhesion layer is not oxidized prior to depositing the high-dielectric-constant material.
Claim 20
Dependent Claim
32 words
The method according to claim 17, said method further comprising oxidizing said top surface of said adhesion layer prior to said step of forming said noble metal layer on said top surface.
Claim 21
Dependent Claim
27 words
The method according to claim 17, wherein said step (d) of forming said preoxidized sidewall deforms a portion of said noble metal layer overlying said preoxidized sidewall.
Claim 22
Dependent Claim
24 words
The method according to claim 17, said step (e) further comprising depositing said high-dielectric-constant material layer on said pre-oxidized sidewall of said adhesion layer.
Claim 23
Independent Claim
97 words
A method of forming a microelectronic capacitor, said method comprising steps: (a) forming a supporting layer having a principal surface; (b) forming a ruthenium layer on said principal surface of said supporting layer; (c) forming a platinum layer on a top surface of said ruthenium layer, said ruthenium layer comprising a substantially unoxidized sidewall; (d) oxidizing said unoxidized sidewall of said ruthenium layer to form a ruthenium dioxide sidewall; (e) subsequent to oxidizing said sidewall depositing a barium strontium titanate layer on said platinum layer; and (f) forming an upper electrode on said barium strontium titanate layer.
Claim 24
Independent Claim
97 words
A method of forming a microelectronic capacitor, said method comprising steps: (a) forming a supporting layer having a principal surface; (b) forming a ruthenium layer on said principal surface of said supporting layer; (c) forming a platinum layer on a top surface of said ruthenium layer, said ruthenium layer comprising a substantially unoxidized sidewall; (d) oxidizing said unoxidized sidewall of said ruthenium layer to form a ruthenium dioxide sidewall; (e) subsequent to oxidizing said sidewall depositing a barium strontium titanate layer on said platinum layer; and (f) forming an upper electrode on said barium strontium titanate layer.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1999-09-10 | 2000-03-11 | 2000-09-10 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-09-10 | 2004-03-11 | 2004-09-10 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-09-10 | 2008-03-11 | 2008-09-10 | $7700.00 | Window Closed / Lapsed |