Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
153 words
An edge enhancement X-ray imaging system for inspecting an object, comprising: a source of penetrating radiation; means for forming radiation emitted by said source into a beam of predetermined cross-section; means for scanning said beam across said object to be inspected; responsive to radiation sidescattered by said object, a first pair of radiant detectors symmetrically positioned opposite each other and being adjacent two sides of said object for converting sidescattered radiation into a first pair of electrical signals including information defining a location of an edge of a component of said object; processing means responsive to said first pair of electrical signals for determining a difference in magnitude therebetween, said difference being dependent on a position of said beam during the scanning of said object; and display means responsive to said processing means for producing a first visual image which includes a representation of said edge of a component located on said object.
Claim 2
Dependent Claim
153 words
An edge enhancement X-ray imaging system for inspecting an object, comprising: a source of penetrating radiation; means for forming radiation emitted by said source into a beam of predetermined cross-section; means for scanning said beam across said object to be inspected; responsive to radiation sidescattered by said object, a first pair of radiant detectors symmetrically positioned opposite each other and being adjacent two sides of said object for converting sidescattered radiation into a first pair of electrical signals including information defining a location of an edge of a component of said object; processing means responsive to said first pair of electrical signals for determining a difference in magnitude therebetween, said difference being dependent on a position of said beam during the scanning of said object; and display means responsive to said processing means for producing a first visual image which includes a representation of said edge of a component located on said object.
Claim 3
Dependent Claim
56 words
The system according to claim 1, further comprising storage means for storing information representative of atomic numbers of components in correspondence with said difference in magnitude, wherein said processing means access said storage means for determining an approximate atomic number of said component based on said difference in magnitude between electrical signals of said first pair.
Claim 4
Dependent Claim
26 words
The system according to claim 1, wherein each detector of said first pair of radiant detectors has an effective detecting surface substantially parallel to said beam.
Claim 5
Dependent Claim
28 words
The system according to claim 1, wherein said processing means include means for calculating said difference in magnitude between electrical signals in said first pair of electrical signals.
Claim 6
Dependent Claim
91 words
The system according to claim 1, further comprising a second pair of detectors located closer to said source than said first pair of detectors, said second pair of detectors having an effective detecting surface substantially perpendicular to said beam and being responsive to radiation backscattered by said object, wherein said second pair of detectors converts said backscattered radiation into a second pair of electrical signals including information for generating a second visual image superimposed onto said first visual image on said display means, thereby providing an enhanced detection of said component.
Claim 7
Dependent Claim
30 words
The system according to claim 1, wherein each detector of said first pair of detectors is positioned substantially outside a cross sectional area of said object scanned by said beam.
Claim 8
Independent Claim
109 words
A method of inspecting an object using an edge enhancement X-ray imaging system, said method comprising the steps of: scanning a beam of penetrating radiation across said object; moving said object relative to said scanning beam; detecting radiation sidescattered by said object; converting sidescattered radiation into a first pair of electrical signals which include information defining a location of an edge of a component of said object; determining a difference in magnitude between electrical signals of said first pair, said difference being dependent on a position of said beam during the scanning of said object; and producing a first visual image of said edge in response to said determination.
Claim 9
Independent Claim
109 words
A method of inspecting an object using an edge enhancement X-ray imaging system, said method comprising the steps of: scanning a beam of penetrating radiation across said object; moving said object relative to said scanning beam; detecting radiation sidescattered by said object; converting sidescattered radiation into a first pair of electrical signals which include information defining a location of an edge of a component of said object; determining a difference in magnitude between electrical signals of said first pair, said difference being dependent on a position of said beam during the scanning of said object; and producing a first visual image of said edge in response to said determination.
Claim 10
Dependent Claim
25 words
The method according to claim 7, wherein said determination comprises calculating a difference in magnitude between electrical signals of said first pair of electrical signals.
Claim 11
Dependent Claim
61 words
The method according to claim 7, further comprising: detecting radiation backscattered by said object; converting said backscattered radiation into a second pair of electrical signals representative of said component; producing a second visual image of said component in response to said conversion; and superimposing said second visual image onto said first visual image to provide an enhanced detection of said component.
Claim 12
Dependent Claim
53 words
The method according to claim 7, further comprising: providing storage means for storing information representative of atomic numbers of components in correspondence with said difference in magnitude; accessing said storage means; and determining an approximate atomic number of said component based on said difference in magnitude between electrical signals of said first pair.