US6163485A
Expired / Lapsed
US
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Semiconductor integrated circuit data processing system
Assignee: Renesas Electronics Corp
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Filing: 2000-03-09
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Granted: 2000-12-19
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Expires: 2020-03-09
Abstract
Abstract A control of a flash memory includes control for supplying a pulse-shaped voltage to each of non-volatile memory cells until a threshold voltage of the non-volatile memory cell having a first threshold voltage is changed to a second threshold voltage. The control involves a first write mode (coarse write) in which the amount of change in threshold voltage of each non-volatile memory cell, which is varied each time the pulse-shaped voltage is applied, is relatively rendered high, and a second write mode (high-accuracy write) in which the amount of change in threshold voltage thereof is relatively rendered low. As compared with the high-accuracy mode, the number of pulses required to change the threshold voltage of each memory cell is smaller than that in the coarse write mode. Therefore, the number of verify operations at the time that the coarse write mode is used, is small and hence the entire write operation can be speeded up.
Inventors
- 👤 Takayuki Kawahara
- 👤 Hiroshi Sato
- 👤 Atsushi Nozoe
- 👤 Keiichi Yoshida
- 👤 Satoshi Noda
- 👤 Shoji Kubono
- 👤 Hiroaki Kotani
- 👤 Katsutaka Kimura
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 16:13
CPC Classifications
G; G11; G11C; G11C16/00; G11C16/02; G11C16/04; G11C16/0483; G11C11/00; G11C11/56; G11C11/5621; G11C11/5628; G11C11/5642; G11C16/06; G11C16/10; G11C16/34; G11C16/3436; G11C16/3454; G11C16/3459; G11C2211/00; G11C2211/56; G11C2211/562; G11C2211/5621; G11C2211/564; G11C2211/5641; G11C2211/5642; G11C29/00
Claims Analysis
Total Claims: 30
Claim 1
Independent Claim
199 words
A nonvolatile semiconductor memory device comprising: a plurality of memory cells each of which has a threshold voltage corresponding to data, wherein a threshold voltage of each of said plurality of memory cells is allocated in a threshold voltage area indicating one of an erasing state and a programming state, and a controller setting a threshold voltage of a memory cell allocated in said threshold voltage area indicating said erasing state to said threshold voltage area indicating said programming state in accordance with a program command, wherein said program command has a first program command and a second program command, wherein a threshold voltage of a memory cell allocated in said threshold voltage area indicating said erasing state is set to a first threshold voltage area indicating said programming state in accordance with said first program command, thereafter, said threshold voltage of said memory cell set to said first threshold voltage area in accordance with said first program command is set to a second threshold voltage area indicating said programming state in accordance with said second program command, and wherein a width of said first threshold voltage area is different from a width of said second threshold voltage area.
Claim 2
Dependent Claim
199 words
A nonvolatile semiconductor memory device comprising: a plurality of memory cells each of which has a threshold voltage corresponding to data, wherein a threshold voltage of each of said plurality of memory cells is allocated in a threshold voltage area indicating one of an erasing state and a programming state, and a controller setting a threshold voltage of a memory cell allocated in said threshold voltage area indicating said erasing state to said threshold voltage area indicating said programming state in accordance with a program command, wherein said program command has a first program command and a second program command, wherein a threshold voltage of a memory cell allocated in said threshold voltage area indicating said erasing state is set to a first threshold voltage area indicating said programming state in accordance with said first program command, thereafter, said threshold voltage of said memory cell set to said first threshold voltage area in accordance with said first program command is set to a second threshold voltage area indicating said programming state in accordance with said second program command, and wherein a width of said first threshold voltage area is different from a width of said second threshold voltage area.
Claim 3
Dependent Claim
29 words
A nonvolatile semiconductor memory device according to claim 1, wherein said width of said first threshold voltage area is wider than said width of said second threshold voltage area.
Claim 4
Dependent Claim
49 words
A nonvolatile semiconductor memory device according to claim 2, further comprising a program voltage generating circuit applying a first pulse train to said memory cell in accordance with said first program command and applying a second pulse train to said memory cell in accordance with said second program command.
Claim 5
Dependent Claim
49 words
A nonvolatile semiconductor memory device according to claim 3, wherein the amount of change in a threshold voltage of a memory cell applied with said first pulse train is larger than the amount of change in a threshold voltage of a memory cell applied with said second pulse train.
Claim 6
Dependent Claim
35 words
A nonvolatile semiconductor memory device according to claim 4, wherein a width of each pulse included in said first pulse train is different from a width of each pulse included in said second pulse train.
Claim 7
Dependent Claim
65 words
A nonvolatile semiconductor memory device according to claim 5, wherein said threshold voltage of said memory cell set to said first threshold voltage area is set to said second threshold voltage area in accordance with said second program command, after said threshold voltage of said memory cell set to said first threshold voltage area is set in a threshold voltage area indicating said erasing state.
Claim 8
Dependent Claim
218 words
A nonvolatile semiconductor memory device comprising: a plurality of memory cells each of which has a threshold voltage corresponding to data indicating one of a program state and an erase state, a controller controlling a program operation in accordance with a program command, and a voltage generator generating a voltage in said program operation, wherein said program command has a first program command and a second program command, wherein said controller controls a first program operation in accordance with said first program command, and controls a second program operation in accordance with said second program command, wherein said voltage generator generates a first program voltage and a first verify voltage in said first program operation, and generates a second program voltage and a second verify voltage in said second program operation, wherein a threshold voltage of a memory cell applied with said first program voltage is changed so as to move to a first region across said first verify voltage in said first program operation, and a threshold voltage of a memory cell applied with said second program voltage is changed so as to move to a second region across said second verify voltage in said second program operation, and wherein a value of said first verify voltage is different from a value of said second verify voltage.
Claim 9
Dependent Claim
218 words
A nonvolatile semiconductor memory device comprising: a plurality of memory cells each of which has a threshold voltage corresponding to data indicating one of a program state and an erase state, a controller controlling a program operation in accordance with a program command, and a voltage generator generating a voltage in said program operation, wherein said program command has a first program command and a second program command, wherein said controller controls a first program operation in accordance with said first program command, and controls a second program operation in accordance with said second program command, wherein said voltage generator generates a first program voltage and a first verify voltage in said first program operation, and generates a second program voltage and a second verify voltage in said second program operation, wherein a threshold voltage of a memory cell applied with said first program voltage is changed so as to move to a first region across said first verify voltage in said first program operation, and a threshold voltage of a memory cell applied with said second program voltage is changed so as to move to a second region across said second verify voltage in said second program operation, and wherein a value of said first verify voltage is different from a value of said second verify voltage.
Claim 10
Dependent Claim
69 words
A nonvolatile semiconductor memory device according to claim 7, wherein said controller verifies whether or not said threshold voltage of said memory cell applied with said first program voltage is across said first verify voltage in said first program operation, and verifies whether or not said threshold voltage of said memory cell applied with said second program voltage is across said second verify voltage in said second program operation.
Claim 11
Dependent Claim
55 words
A nonvolatile semiconductor memory device according to claim 8, wherein width of a first threshold voltage distribution formed in said first region by memory cells applied with said first program voltage is wider than width of a second threshold voltage distribution formed in said second region by memory cells applied with said second program voltage.
Claim 12
Dependent Claim
33 words
A nonvolatile semiconductor memory device according to claim 9, wherein said voltage generator generates a first pulse train having said first program voltage and a second pulse train having said second program voltage.
Claim 13
Dependent Claim
49 words
A nonvolatile semiconductor memory device according to claim 10, wherein the amount of change in a threshold voltage of a memory cell applied with said first pulse train is larger than the amount of change in a threshold voltage of a memory cell applied with said second pulse train.
Claim 14
Dependent Claim
35 words
A nonvolatile semiconductor memory device according to claim 11, wherein a width of each pulse included in said first pulse train is different from a width of each pulse included in said second pulse train.
Claim 15
Dependent Claim
51 words
A nonvolatile semiconductor memory device according to claim 12, wherein said memory cell moved to said first region is moved to said second region in accordance with said second program command, after said memory cell moved to said first region is moved in a threshold voltage area indicating an erasing state.
Claim 16
Independent Claim
174 words
A system comprising: a nonvolatile semiconductor memory; a data output circuit outputting data to be stored in said nonvolatile semiconductor memory; and a command supply circuit, said nonvolatile semiconductor memory including: a plurality of memory cells each of which has a threshold voltage corresponding to data, wherein a threshold voltage of each of said plurality of memory cells is allocated in a threshold voltage area indicating one of an erasing state and a programming state, and a controller setting a threshold voltage of a memory cell allocated in said threshold voltage area indicating said erasing state to a first threshold voltage area indicating said programming state by programming data outputted from said data output circuit, wherein said controller sets said threshold voltage of said memory cell to said first threshold voltage area to a second threshold voltage area indicating said programming state when a reprogram command is supplied from said command supply circuit, and wherein a width of said first threshold voltage area is different from a width of said second threshold voltage area.
Claim 17
Independent Claim
174 words
A system comprising: a nonvolatile semiconductor memory; a data output circuit outputting data to be stored in said nonvolatile semiconductor memory; and a command supply circuit, said nonvolatile semiconductor memory including: a plurality of memory cells each of which has a threshold voltage corresponding to data, wherein a threshold voltage of each of said plurality of memory cells is allocated in a threshold voltage area indicating one of an erasing state and a programming state, and a controller setting a threshold voltage of a memory cell allocated in said threshold voltage area indicating said erasing state to a first threshold voltage area indicating said programming state by programming data outputted from said data output circuit, wherein said controller sets said threshold voltage of said memory cell to said first threshold voltage area to a second threshold voltage area indicating said programming state when a reprogram command is supplied from said command supply circuit, and wherein a width of said first threshold voltage area is different from a width of said second threshold voltage area.
Claim 18
Dependent Claim
26 words
A system according to claim 14, wherein said width of said first threshold voltage area is wider than said width of said second threshold voltage area.
Claim 19
Dependent Claim
58 words
A system according to claim 15, wherein said nonvolatile semiconductor memory includes a program voltage generating circuit applying a first pulse train to said memory cell to program data supplied from said data output circuit and applying a second pulse train to said memory cell set to said first threshold voltage area in accordance with said reprogram command.
Claim 20
Dependent Claim
46 words
A system according to claim 16, wherein the amount of change in a threshold voltage of a memory cell applied with said first pulse train is larger than the amount of change in a threshold voltage of a memory cell applied with said second pulse train.
Claim 21
Dependent Claim
32 words
A system according to claim 17, wherein a width of each pulse included in said first pulse train is different from a width of each pulse included in said second pulse train.
Claim 22
Dependent Claim
61 words
A system according to claim 18, wherein said threshold voltage of said memory cell set to said first threshold voltage area is set to said second threshold voltage area in accordance with said reprogram command, after said threshold voltage of said memory cell set to said first threshold voltage area is set in a threshold voltage area indicating said erasing state.
Claim 23
Independent Claim
230 words
A system comprising: a nonvolatile semiconductor memory; a data output circuit outputting data to be stored in said nonvolatile semiconductor memory; and a command supply circuit, said nonvolatile semiconductor memory including: a plurality of memory cells each of which has a threshold voltage corresponding to data indicating one of a program state and an erase state, a controller controlling a program operation, and a voltage generator generating a voltage in said program operation, wherein said controller controls a first program operation for programming data outputted from said data output circuit, and controls a second program operation in accordance with a reprogram command supplied from said command supply circuit, wherein said voltage generator generates a first program voltage and a first verify voltage in said first program operation, and generates a second program voltage and a second verify voltage in said second program operation, wherein a threshold voltage of a memory cell applied with said first program voltage is changed so as to move to a first region across said first verify voltage in said first program operation, and a threshold voltage of a memory cell applied with said second program voltage is changed so as to move to a second region across said second verify voltage in said second program operation, and wherein a value of said first verify voltage is different from a value of said second verify voltage.
Claim 24
Independent Claim
230 words
A system comprising: a nonvolatile semiconductor memory; a data output circuit outputting data to be stored in said nonvolatile semiconductor memory; and a command supply circuit, said nonvolatile semiconductor memory including: a plurality of memory cells each of which has a threshold voltage corresponding to data indicating one of a program state and an erase state, a controller controlling a program operation, and a voltage generator generating a voltage in said program operation, wherein said controller controls a first program operation for programming data outputted from said data output circuit, and controls a second program operation in accordance with a reprogram command supplied from said command supply circuit, wherein said voltage generator generates a first program voltage and a first verify voltage in said first program operation, and generates a second program voltage and a second verify voltage in said second program operation, wherein a threshold voltage of a memory cell applied with said first program voltage is changed so as to move to a first region across said first verify voltage in said first program operation, and a threshold voltage of a memory cell applied with said second program voltage is changed so as to move to a second region across said second verify voltage in said second program operation, and wherein a value of said first verify voltage is different from a value of said second verify voltage.
Claim 25
Dependent Claim
66 words
A system according to claim 20, wherein said controller verifies whether or not said threshold voltage of said memory cell applied with said first program voltage is across said first verify voltage in said first program operation, and verifies whether or not said threshold voltage of said memory cell applied with said second program voltage is across said second verify voltage in said second program operation.
Claim 26
Dependent Claim
54 words
A system according to claim 21, wherein a width of a first threshold voltage distribution formed in said first region by memory cells applied with said first program voltage is wider than a width of a second threshold voltage distribution formed in said second region by memory cells applied with said second program voltage.
Claim 27
Dependent Claim
30 words
A system according to claim 22, wherein said voltage generator generates a first pulse train having said first program voltage and a second pulse train having said second program voltage.
Claim 28
Dependent Claim
46 words
A system according to claim 23, wherein the amount of change in a threshold voltage of a memory cell applied with said first pulse train is larger than the amount of change in a threshold voltage of a memory cell applied with said second pulse train.
Claim 29
Dependent Claim
32 words
A system according to claim 24, wherein a width of each pulse included in said first pulse train is different from a width of each pulse included in said second pulse train.
Claim 30
Dependent Claim
48 words
A system according to claim 25, wherein said memory cell moved to said first region is moved to said second region in accordance with said second program command, after said memory cell moved to said first region is moved in a threshold voltage area indicating an erasing state.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2003-12-19 | 2004-06-19 | 2004-12-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2007-12-19 | 2008-06-19 | 2008-12-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2011-12-19 | 2012-06-19 | 2012-12-19 | $7700.00 | Window Closed / Lapsed |