8 bit per cell non-volatile semiconductor memory structure utilizing trench technology and dielectric floating gate

Claim 2

A non-volatile semiconductor memory device for storing up to six-bits of information comprising: a semiconductor substrate of one conductivity type; a bottom diffusion region having a conductivity type opposite to the conductivity type of said semiconductor substrate on top of a portion of said semiconductor substrate; a second semiconductor layer on top of said bottom diffusion region, said second semiconductor layer having the same conductivity type of said semiconductor substrate; a right diffusion region formed in said second semiconductor layer apart from said bottom diffusion channel thus forming a first vertical channel between said right and bottom diffusion regions; a left diffusion region formed in said second semiconductor layer apart from both said right and bottom diffusion regions thus forming a first horizontal channel between said right and left diffusion regions and a second vertical channel between said left and bottom diffusion regions, said left, right and bottom diffusion regions having the same conductivity type; a trapping dielectric layer formed over exposed portions of said semiconductor substrate, bottom diffusion region and second semiconductor layer; and a wordline formed over said trapping dielectric layer, whereby each of said first and second vertical channels and first horizontal channel are capable of having two bits of information programmed, read and erased.

Claim 3

The non-volatile semiconductor memory device of claim 1 wherein said trapping dielectric layer comprises: a tunneling oxide layer; a nitride layer on said tunneling oxide layer and an insulating oxide layer on said nitride layer.

Claim 4

The non-volatile semiconductor memory device of claim 1 wherein said trapping dielectric layer comprises: a tunneling oxide layer; an aluminum oxide layer on said tunneling oxide layer and an insulating oxide layer on said aluminum oxide layer.

Claim 5

A non-volatile semiconductor memory device for storing up to eight-bits of information comprising: a semiconductor substrate of one conductivity type; a central bottom diffusion region having a conductivity type opposite to the conductivity type of said semiconductor substrate on top of a portion of said semiconductor substrate; a second semiconductor layer on top of said central bottom diffusion region, said second semiconductor layer having the same conductivity type of said semiconductor substrate; a right diffusion region formed in said second semiconductor layer apart from said central bottom diffusion channel thus forming a first vertical channel between said right and central bottom diffusion regions; a left diffusion region formed in said second semiconductor layer apart from both said right and central bottom diffusion regions thus forming a first horizontal channel between said right and left diffusion regions and a second vertical channel between said left and central bottom diffusion regions, said left, right and central bottom diffusion regions having the same conductivity type; left and right bottom diffusion regions having a conductivity type opposite to the conductivity type of said semiconductor substrate positioned on top of a portion of said semiconductor substrate apart from said central bottom diffusion region forming between said left and central bottom diffusion regions a left second horizontal channel and between said right and central bottom diffusion regions a right second horizontal channel; a trapping dielectric layer formed over exposed portions of said semiconductor substrate, left, central and right bottom diffusion regions and second semiconductor layer; and a wordline formed over said trapping dielectric layer, whereby each of said first and second vertical channels and first and second horizontal channels are capable of having two bits of information programmed, read and erased.

Claim 6

A non-volatile semiconductor memory device for storing up to eight-bits of information comprising: a semiconductor substrate of one conductivity type; a central bottom diffusion region having a conductivity type opposite to the conductivity type of said semiconductor substrate on top of a portion of said semiconductor substrate; a second semiconductor layer on top of said central bottom diffusion region, said second semiconductor layer having the same conductivity type of said semiconductor substrate; a right diffusion region formed in said second semiconductor layer apart from said central bottom diffusion channel thus forming a first vertical channel between said right and central bottom diffusion regions; a left diffusion region formed in said second semiconductor layer apart from both said right and central bottom diffusion regions thus forming a first horizontal channel between said right and left diffusion regions and a second vertical channel between said left and central bottom diffusion regions, said left, right and central bottom diffusion regions having the same conductivity type; left and right bottom diffusion regions having a conductivity type opposite to the conductivity type of said semiconductor substrate positioned on top of a portion of said semiconductor substrate apart from said central bottom diffusion region forming between said left and central bottom diffusion regions a left second horizontal channel and between said right and central bottom diffusion regions a right second horizontal channel; a trapping dielectric layer formed over exposed portions of said semiconductor substrate, left, central and right bottom diffusion regions and second semiconductor layer; and a wordline formed over said trapping dielectric layer, whereby each of said first and second vertical channels and first and second horizontal channels are capable of having two bits of information programmed, read and erased.

Claim 7

The non-volatile semiconductor memory device of claim 4 wherein said trapping dielectric layer comprises: a tunneling oxide layer; a nitride layer on said tunneling oxide layer and an insulating oxide layer on said nitride layer.

Claim 8

The non-volatile semiconductor memory device of claim 4 wherein said trapping dielectric layer comprises: a tunneling oxide layer; an aluminum oxide layer on said tunneling oxide layer and an insulating oxide layer on said aluminum oxide layer.