Patent EP0081785A2 successfully refreshed from Google Patents.
← Back to Patent Explorer
EP0081785A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Plasma monitor

Assignee: Hitachi Ltd
•
Filing: 1982-12-06
•
Granted: —
•
Expires: 2002-12-06
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract Disclosed is a plasma monitor which measures the distribution of particular chemical species (atom, molecule, ion) in plasma generated inside an instrument making use of the plasma. Laser light having a particular wavelength is radiated to the particular chemical species so as to let it generate fluorescence. The fluorescence is picked up for each of a plurality of zones divided in the radiating direction of the laser light and the concentration of the chemical species in each zone is determined on the basis of the intensity of the fluorescence in each zone in order to determine the concentration distribution of the particular chemical species contained in the plasma. The operative condition within the sealed vessel can be grasped more accurately by measuring the distribution of the concentration of the chemical species which is closely related with the condition of deposition or etching.

Inventors

  • 👤 Hisajiro Osada
  • 👤 Yutaka Hiratsuka

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-10-29 16:18
CPC Classifications
H; H05; H05H; H05H1/00; H05H1/0006; H05H1/0012; C; C23; C23C; C23C14/00; C23C14/22; C23C14/54; G; G01; G01N; G01N21/00; G01N21/62; G01N21/63; G01N21/64; G01N21/6402

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 139 words
In a plasma monitor for measuring a particular chemical species inside plasma generated in a instrument in order to grasp the operative condition inside said instrument making use of the plasma, the improvement characterized by means (11) for generating laser light having a wavelength exciting a chemical species to be measured and moving the radiating position of the laser light to the plasma so as to scan the plasma; and means (31) for receiving the fluorescence generated by the chemical species excited by the laser light, determining the concentration of the chemical species on the basis of the intensity of the fluorescence, determining the measuring position on the basis of the scanning position and the receiving position of the laser light and displaying the measuring position as well as the concentration of the chemical species at that measuring position.
Claim 2
Dependent Claim 139 words
In a plasma monitor for measuring a particular chemical species inside plasma generated in a instrument in order to grasp the operative condition inside said instrument making use of the plasma, the improvement characterized by means (11) for generating laser light having a wavelength exciting a chemical species to be measured and moving the radiating position of the laser light to the plasma so as to scan the plasma; and means (31) for receiving the fluorescence generated by the chemical species excited by the laser light, determining the concentration of the chemical species on the basis of the intensity of the fluorescence, determining the measuring position on the basis of the scanning position and the receiving position of the laser light and displaying the measuring position as well as the concentration of the chemical species at that measuring position.
Claim 3
Dependent Claim 244 words
In a plasma monitor for measuring a particular chemical species inside plasma generated in a instrument in order to grasp the operative condition inside said instrument making use of the plasma, the improvement comprising: laser light generation means (11) for generating laser light having a particular wavelength for exciting a particular chemical species contained in the plasma and letting it generate fluorescence; scanning means (21) for moving the radiating position of the laser light generated by said laser light generation means to the plasma and thus scanning the plasma by the laser light; light receiving means (31) for receiving the plasma inside the light receiving angle thereof and the fluorescence generated by the chemical species excited by the laser light, and capable of changing the light receiving position; detection means (41) for taking out the fluorescence generated by the particular chemical species among the light received by said light receiving means and converting it into an electric signal in accordance with the intensity of the fluorescence; control means (35) for calculating the ordinates of the detection position inside the plasma from the instruction signal given by said control means (35) to said scanning means (21) and to said light receiving means (31), and calculating the concentration of the particular chemical species at the detection position on the basis of the electric signal applied thereto by said detection means (41); and display means for displaying the results of calculation applied thereto by said control means.
Claim 4
Dependent Claim 244 words
In a plasma monitor for measuring a particular chemical species inside plasma generated in a instrument in order to grasp the operative condition inside said instrument making use of the plasma, the improvement comprising: laser light generation means (11) for generating laser light having a particular wavelength for exciting a particular chemical species contained in the plasma and letting it generate fluorescence; scanning means (21) for moving the radiating position of the laser light generated by said laser light generation means to the plasma and thus scanning the plasma by the laser light; light receiving means (31) for receiving the plasma inside the light receiving angle thereof and the fluorescence generated by the chemical species excited by the laser light, and capable of changing the light receiving position; detection means (41) for taking out the fluorescence generated by the particular chemical species among the light received by said light receiving means and converting it into an electric signal in accordance with the intensity of the fluorescence; control means (35) for calculating the ordinates of the detection position inside the plasma from the instruction signal given by said control means (35) to said scanning means (21) and to said light receiving means (31), and calculating the concentration of the particular chemical species at the detection position on the basis of the electric signal applied thereto by said detection means (41); and display means for displaying the results of calculation applied thereto by said control means.

References Cited (Backward Citations)

No citation records indexed.

USPTO Annuity & Maintenance Windows

Maintenance schedule is calculated for granted US utility patents.

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag