Abstract A semiconductor memory device, including a plurality of programmable read only memory cells arranged at intersection points of a matrix formed by a plurality of word-lines and that of bit-lines crossed each other, independently having first column transfer gate transistors locating between a programming circuit and the bit-lines to transfer a programming data signal from the programming circuit to a selected memory cell located on one of the bit-lines when the memory device is in a programming mode and second column transfer gate transistors locating between a sense amplifier and the bit-lines to transfer a read out data signal from a selected memory cell located on one of the bit-lines to a sensing amplifier when the memory device is in a reading mode.
A semiconductor memory device to which a datum, given from the exterior of said memory device, is programmed by a programming address signal given from the exterior of said memory device when said memory device is in a programming mode in which a datum is programmed into said memory device, and from which a datum, stored in said memory device, is read out to the exterior of said memory device by a reading address signal given from the exterior of said memory device when said memory device is in a reading mode in which a datum is read out from said memory device, said memory device comprising: a plurality of word-lines; a plurality of bit-lines extending accross said word-lines to form a plurality of intersection points a plurality of memory cells formed at said intersection points; a column decoder means for providing a first column selecting signal in response to said programming address signal when said memory device is in said programming mode and a second column selecting signal in response to said reading address signal when said memory device is in said reading mode; a programming circuit for providing a selected memory cell with a data signal corresponding to said datum given from the exterior of said memory device when said memory device is in said programming mode; a sense amplifier for amplifying a data signal obtained from said datum read out from a selected memory cell when said memory device is in said reading mode; a plurality of first column transfer gate transistors for selectively connecting a selected bit-line to said programming circuit in response to said first column selecting signal during said programming mode, said first column transfer gate transistors being made non-conductive during said reading mode; and a plurality of second column transfer gate transistors for selectively connecting a selected bit-line to said sense amplifier in response to said second column selecting signal during said reading mode.
Claim 2
Dependent Claim
321 words
A semiconductor memory device to which a datum, given from the exterior of said memory device, is programmed by a programming address signal given from the exterior of said memory device when said memory device is in a programming mode in which a datum is programmed into said memory device, and from which a datum, stored in said memory device, is read out to the exterior of said memory device by a reading address signal given from the exterior of said memory device when said memory device is in a reading mode in which a datum is read out from said memory device, said memory device comprising: a plurality of word-lines; a plurality of bit-lines extending accross said word-lines to form a plurality of intersection points a plurality of memory cells formed at said intersection points; a column decoder means for providing a first column selecting signal in response to said programming address signal when said memory device is in said programming mode and a second column selecting signal in response to said reading address signal when said memory device is in said reading mode; a programming circuit for providing a selected memory cell with a data signal corresponding to said datum given from the exterior of said memory device when said memory device is in said programming mode; a sense amplifier for amplifying a data signal obtained from said datum read out from a selected memory cell when said memory device is in said reading mode; a plurality of first column transfer gate transistors for selectively connecting a selected bit-line to said programming circuit in response to said first column selecting signal during said programming mode, said first column transfer gate transistors being made non-conductive during said reading mode; and a plurality of second column transfer gate transistors for selectively connecting a selected bit-line to said sense amplifier in response to said second column selecting signal during said reading mode.
Claim 3
Dependent Claim
44 words
A semiconductor memory device according to claim 1, wherein said first column transfer gate transistor comprises a metal oxide semiconductor transistor having a drain connected to said bit-line, a source connected to said programming circuit, and a gate connected to said column decoder means.
Claim 4
Dependent Claim
46 words
A semiconductor memory device according to claim 1 or 2, wherein said second column transfer gate transistor comprises a metal oxide semiconductor transistor having a drain connected to said bit-line, a source connected to said sensing amplifier, and a gate connected to said column decoder means.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
Maintenance schedule is calculated for granted US utility patents.