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EP0241934A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Ultrahigh-density recording system utilizing focused beam

Assignee: Hitachi Ltd
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Filing: 1987-04-16
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Granted: —
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Expires: 2007-04-16
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Abstract

Abstract The present invention relates to a recording system used to record information with an ion beam and read the recorded information with an electron beam, and the specification discloses an ultrahigh-density recording system utilizing a focused beam, comprising the steps of arranging a focused beam generating source (1) in opposition to a recording medium (8), and applying a focused ion beam from the focused beam generating source (1) to the recording medium (8) in accordance with digital information while varying the relative position of the recording medium and focused beam generating source, to thereby record information on the recording medium; and then applying a weak focused beam from the focused beam generating source to the recording medium while varying the relative position of the recording medium and focused beam generating source, to thereby vary the secondary electrons, fluorescent X-rays of an absorption current, which is generated in the recording medium, and reproduce the information.

Inventors

  • 👤 Toshiyuki Aida
  • 👤 Shigeyuki Hosoki
  • 👤 Tohru Ishitani
  • 👤 Sumio Hosaka

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-10-30 15:10
CPC Classifications
G; G11; G11B; G11B9/00; G11B9/10

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 132 words
An ultrahigh-density recording system ulilizing a focused beam, comprising the steps of arranging focused beam generating source (1) in opposition to a recording medium (8), and applying a focused ion beam (4) from said focused beam generating source (1) to said recording medium (8) in accordance with digital information while varying the relative position of said recording medium (8) and said focused beam generating source (1), to thereby record information on said recording medium (8); and then applying a weak focused beam from said focused beam generating source (1) to said recording medium (8) while varying the relative position of said recording medium and said focused beam generating source, to thereby vary the secondary electrons, fluorescent X-rays or an absorption current, which is generated in said recording medium, and reproduce the information.
Claim 2
Dependent Claim 132 words
An ultrahigh-density recording system ulilizing a focused beam, comprising the steps of arranging focused beam generating source (1) in opposition to a recording medium (8), and applying a focused ion beam (4) from said focused beam generating source (1) to said recording medium (8) in accordance with digital information while varying the relative position of said recording medium (8) and said focused beam generating source (1), to thereby record information on said recording medium (8); and then applying a weak focused beam from said focused beam generating source (1) to said recording medium (8) while varying the relative position of said recording medium and said focused beam generating source, to thereby vary the secondary electrons, fluorescent X-rays or an absorption current, which is generated in said recording medium, and reproduce the information.
Claim 3
Dependent Claim 62 words
An ultrahigh-density recording system utilizing a focused beam according to Claim 1, wherein said recording medium (8) consists of a disc type material, the varying of the relative position of said recording medium and said focused beam generating source (1) being done by rotating said recording medium while moving said focused beam generating source in the radial direction of said recording medium.
Claim 4
Dependent Claim 68 words
An ultrahigh-density recording system utilizing a focused beam according to Claim 1, wherein the recording of information is done by switching an operation for deflecting the focused ion to the outside of a track (5) in said recording medium (8) in accordance with the information to be recorded, and an operation for focusing the same ion beam to the interior of said track (5), to each other suitably.

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