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JP3201368B2
Expired / Lapsed
JP
⏱️ 0.0 years remaining
Semiconductor integrated circuit and test method therefor
Assignee: NEC Corp
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Filing: 1999-01-18
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Granted: 2001-08-20
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Expires: 2019-01-18
Abstract
No abstract record available.
Inventors
- 👤 潤 伊藤
Bibliographic Details
Application Number
—
Jurisdiction
JP
Data Source
google_patents
Last Synchronized
2026-10-29 17:01
CPC Classifications
A; A61; A61B; A61B17/00; A61B2017/0046; A61B2017/00473
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
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