Patent US3445769A successfully refreshed from Google Patents.
US3445769A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method and apparatus for in-circuit semiconductor characteristic measurements by establishing a predetermined voltage across the semiconductor and an externally connected impedance
Assignee: TEST EQUIPMENT CORP
•
Filing: 1963-08-15
•
Granted: 1969-05-20
•
Expires: 1983-08-15
Abstract
No abstract record available.
Inventors
- 👤 Louis W Erath
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 23:44
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/2607; G01R31/2608
Claims Analysis
Total Claims: 0
No claims parsed yet. Click Sync Now above to re-index claims from Google Patents.
References Cited (Backward Citations)
US2922954A
Cited
US3227953A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1972-05-19 | 1972-11-18 | 1973-05-20 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1976-05-19 | 1976-11-18 | 1977-05-20 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1980-05-19 | 1980-11-18 | 1981-05-20 | $7700.00 | Window Closed / Lapsed |