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US3473977A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor fabrication technique permitting examination of epitaxially grown layers

Assignee: Westinghouse Electric Corp
•
Filing: 1967-02-02
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Granted: 1969-10-21
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Expires: 1987-02-02
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Abstract

No abstract record available.

Inventors

  • 👤 Glenn W Skouson
  • 👤 Marvin H White

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 08:42
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/2644; H; H10; H10D; H10D84/00; H10D84/01; H10D84/0112; H10D84/02; H10D84/03; H10D84/038; H10P; H10P32/00; H10P32/10; H10P32/15; H10P95/00; Y; Y10; Y10S; Y10S148/00; Y10S148/037; Y10S148/085; Y10S148/098

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

US3099579A Cited
US3189494A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1972-10-20 1973-04-21 1973-10-21 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1976-10-20 1977-04-21 1977-10-21 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1980-10-20 1981-04-21 1981-10-21 $7700.00 Window Closed / Lapsed

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