Patent US3676776A successfully refreshed from Google Patents.
US3676776A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Testing probe construction
Assignee: Siemens AG
•
Filing: 1970-01-19
•
Granted: 1972-07-11
•
Expires: 1990-01-19
Abstract
Abstract Precise testing of printed circuit boards having closely spaced contact bores is made possible by an apparatus comprising a plurality of predisposed, closely spaced contact needle probes each of which has a flexible, slender construction to automatically compensate for spacing variations of the contacts within manufacturing tolerances and each of which may have a detachable contact head to compensate for variations in contact bore diameters. A generally spherical contact probe head surface assures a uniform contact with the edge of the bore and hence equal contact resistances, regardless of the angle of the probe with the bore.
Inventors
- 👤 Franz Bauer
- 👤 Karl Friedrich Besemer
- 👤 Gotthard Kinner
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 15:13
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07357; G01R1/06711; G01R1/06716; G01R1/06722
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
162 words
An electrical testing apparatus for the simultaneous testing of a plurality of bore-type contacts of a circuit board comprising a carrier means supporting a plurality of elongated, slender probe members, said probe members each having at a first end thereof a generally spherically shaped contact head enlarged with respect to said probe member, said contact head being adapted to be seated in one of said bore-type contacts so that excellent electrical contact is effected therebetween, said contacts on said circuit boards being positioned thereon in a predetermined arrangement and said probes being posiTioned in said carrier means in a corresponding arrangement so that said spherical contact heads will each seat in a predetermined contact, said probes being flexible and axially slidably movable in said carrier so that minor deviations in arrangement of said contacts may be accommodated by said probes, said individual probes having a resilient coil spring means disposed about said probe member between said probe carrier and said contact head.
Claim 2
Dependent Claim
162 words
An electrical testing apparatus for the simultaneous testing of a plurality of bore-type contacts of a circuit board comprising a carrier means supporting a plurality of elongated, slender probe members, said probe members each having at a first end thereof a generally spherically shaped contact head enlarged with respect to said probe member, said contact head being adapted to be seated in one of said bore-type contacts so that excellent electrical contact is effected therebetween, said contacts on said circuit boards being positioned thereon in a predetermined arrangement and said probes being posiTioned in said carrier means in a corresponding arrangement so that said spherical contact heads will each seat in a predetermined contact, said probes being flexible and axially slidably movable in said carrier so that minor deviations in arrangement of said contacts may be accommodated by said probes, said individual probes having a resilient coil spring means disposed about said probe member between said probe carrier and said contact head.
Claim 3
Dependent Claim
29 words
A probe construction according to claim 1 wherein said probe members are slidably guided through electrically insulated bearing bushings in said carrier, said bushings being of a polytetrafluorethylene material.
Claim 4
Dependent Claim
30 words
A probe construction according to claim 1 wherein said probe members include insulated sleeves forming the outer surface thereof, said insulated sleeves sliding directly in bores in said carrier means.
Claim 5
Dependent Claim
23 words
A probe construction according to claim 1 wherein said contact points are heated by means of resistant heaters disposed adjacent the probe carrier.
Claim 6
Dependent Claim
25 words
A probe construction according to claim 3 wherein said coil spring is disposed about said insulated sleeve and in electrical connection with said contact head.
Claim 7
Dependent Claim
16 words
A probe construction according to claim 1 wherein said probe members consist of thin metal tubes.
Claim 8
Dependent Claim
24 words
A probe construction according to claim 2 wherein said bearing bushings take the form of a collar so that long leaking paths are provided.
Claim 9
Dependent Claim
18 words
A probe construction according to claim 1 wherein said contact heads are detachably connected to said probe members.
Claim 10
Dependent Claim
33 words
A probe construction according to claim 8 wherein said contact head is a ball having a sleeve affixed thereto, said sleeve having an inner diameter receiving the probe in a detachable frictional engagement.
Claim 11
Dependent Claim
44 words
A probe construction according to claim 8 wherein said contact head comprises at least a semi-spherical portion having a pin means affixed thereto, said pin means being adapted to be received within a lower end of said probe member in generally axial alignment therewith.
References Cited (Backward Citations)
US3274534A
Cited
US3512084A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1975-07-11 | 1976-01-10 | 1976-07-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1979-07-11 | 1980-01-10 | 1980-07-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1983-07-11 | 1984-01-10 | 1984-07-11 | $7700.00 | Window Closed / Lapsed |