Patent US4054391A successfully refreshed from Google Patents.
US4054391A
Expired / Lapsed
US
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Specular reflectance microdensitometer
Assignee: Xerox Corp
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Filing: 1975-12-18
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Granted: 1977-10-18
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Expires: 1995-12-18
Abstract
Abstract A specular reflectance microdensitometer including an illuminating microscope and a collecting microscope, disposed on optical axes at equal and opposite angles relative to a reflecting test surface. The illuminating microscope illuminates a known area on the test surface from which light is reflected into the collecting microscope. The objective lens of the collecting microscope images the illuminated test surface on a field lens which in turn images the objective lens on the face of a fiber optic bundle. The light incident on the fiber bundle is transmitted to a photomultiplier tube for quantitative determination of light level. The amount of light specularly reflected by the test surface is correlated to the density of particle coverage on the surface, and plotted on an X-Y record.
Inventors
- 👤 John C. Witte
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 17:29
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/17; G01N21/55
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
203 words
A microdensitometer for measuring and recording relative reflectance of a specularly reflecting surface, including: an illuminating microscope disposed on an illumination optical axis relative to said reflecting surface and including a light source, a condensor lens, an aperture and a first objective lens in optical alignment along said illumination optical axis, said light source and said first objective lens being in conjugate relationship to said condenser lens, said aperture and said reflecting surface being in conjugate relationship relative to said first objective lens, A collecting microscope disposed on a reflection optical axis to said reflecting surface and including a second objective lens, a field lens, and an optical probe in optical alignment along said reflection optical axis, said reflecting surface and said field lens being in conjugate relationship relative to said second objective lens, said second objective lens and said optical probe being in conjugate relationship relative to said field lens, said illumination and reflection optical axes being disposed at equal and opposite angles relative to said reflecting surface, whereby an image of said reflecting surface is projected to said field lens to attenuate the light transmission of said field lens in proportion to the extent of particle coverage of said reflective surface.
Claim 2
Dependent Claim
203 words
A microdensitometer for measuring and recording relative reflectance of a specularly reflecting surface, including: an illuminating microscope disposed on an illumination optical axis relative to said reflecting surface and including a light source, a condensor lens, an aperture and a first objective lens in optical alignment along said illumination optical axis, said light source and said first objective lens being in conjugate relationship to said condenser lens, said aperture and said reflecting surface being in conjugate relationship relative to said first objective lens, A collecting microscope disposed on a reflection optical axis to said reflecting surface and including a second objective lens, a field lens, and an optical probe in optical alignment along said reflection optical axis, said reflecting surface and said field lens being in conjugate relationship relative to said second objective lens, said second objective lens and said optical probe being in conjugate relationship relative to said field lens, said illumination and reflection optical axes being disposed at equal and opposite angles relative to said reflecting surface, whereby an image of said reflecting surface is projected to said field lens to attenuate the light transmission of said field lens in proportion to the extent of particle coverage of said reflective surface.
Claim 3
Dependent Claim
35 words
A microdensitometer as defined in claim 1 further including a focusing eyepiece selectively positionable into and out of said reflection optical axis to focus said illumination and said collecting microscope relative to said reflective surface.
Claim 4
Dependent Claim
63 words
A microdensitometer as defined in claim 1 further including a photosensitive element to sense light incident on said optical probe, a drive means to effect relative movement between said reflective surface and said microdensitometer, a recorder operatively connected to said photosensitive element and to said drive means to concurrently record intensity signals from said photosensitive element and position signals from said drive means.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-10-17 | 1981-04-18 | 1981-10-18 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-10-17 | 1985-04-18 | 1985-10-18 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-10-17 | 1989-04-18 | 1989-10-18 | $7700.00 | Window Closed / Lapsed |