Patent US4291990A successfully refreshed from Google Patents.
US4291990A
Expired / Lapsed
US
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Apparatus for measuring the distribution of irregularities on a mirror surface
Assignee: Toshiba Corp
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Filing: 1979-01-22
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Granted: 1981-09-29
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Expires: 1999-01-22
Abstract
Abstract An optical apparatus for measuring irregularities on the mirror surface of, for example, a silicon wafer used to provide a semiconductor integrated circuit. Irradiates on the mirror surface light fluxes arranged in a special form, for example, in the lattice form. By observing the pattern of light fluxes reflected from said mirror surface, one can measure the surface irregularities. A light flux issued from a light source is divided by a photomask or diffraction grating into first light fluxes irradiated all over the mirror surface and second light fluxes surrounding the respective first light fluxes in the continuous or discontinuous annular form, thereby ensuring the simultaneous measurement of the distribution of extensive irregularities over the entire mirror surface by the first light fluxes and the distribution of local irregularities on said mirror surface by the second light fluxes.
Inventors
- 👤 Shinichiro Takasu
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 07:45
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/84; G01N21/88
Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
182 words
An apparatus for measuring the distribution of extensive and local irregularities on a mirror surface comprising: light generating means for irradiating a coherent light flux onto said mirror surface; light dividing means, positioned between said light generating means and said mirror surface, for dividing the light flux irradiated from said light generating means into a plurality of first light fluxes, arranged in a prescribed lattice form to cover said mirror surface, for measuring extensive irregularities on said mirror surface and a plurality of second light fluxes, surrounding each of the first light fluxes but not overlapping or coinciding with each other, for measuring the distribution of local irregularities on the surface; and means for receiving light fluxes reflected from the mirror surface and for permitting the inspection of the pattern of reflections, whereby the distribution of extensive irregularities on the mirror surface are determined through the inspection of the pattern of reflections of the first light fluxes and the distribution of local irregularities on the mirror surface are determined through the inspection of the pattern of reflections from the second light fluxes.
Claim 2
Independent Claim
182 words
An apparatus for measuring the distribution of extensive and local irregularities on a mirror surface comprising: light generating means for irradiating a coherent light flux onto said mirror surface; light dividing means, positioned between said light generating means and said mirror surface, for dividing the light flux irradiated from said light generating means into a plurality of first light fluxes, arranged in a prescribed lattice form to cover said mirror surface, for measuring extensive irregularities on said mirror surface and a plurality of second light fluxes, surrounding each of the first light fluxes but not overlapping or coinciding with each other, for measuring the distribution of local irregularities on the surface; and means for receiving light fluxes reflected from the mirror surface and for permitting the inspection of the pattern of reflections, whereby the distribution of extensive irregularities on the mirror surface are determined through the inspection of the pattern of reflections of the first light fluxes and the distribution of local irregularities on the mirror surface are determined through the inspection of the pattern of reflections from the second light fluxes.
Claim 3
Dependent Claim
32 words
The apparatus of claim 1 wherein said light dividing means includes a photomask provided with a plurality of holes arranged in a prescribed form for generating said first and second light fluxes.
Claim 4
Dependent Claim
14 words
The apparatus of claim 1 wherein said light dividing means comprises a diffraction grating.
Claim 5
Dependent Claim
19 words
The apparatus of claim 1 wherein said light dividing means includes two plane lattices disposed to execute double diffraction.
Claim 6
Dependent Claim
30 words
The apparatus of claim 4 wherein one of the plane lattices has a lattice constant which is at least twice as large as the lattice constant of the other lattice.
Claim 7
Dependent Claim
35 words
The apparatus of claim 4 wherein one plane lattice is a square lattice for generating the first light flux, and the other plane lattice is a plane multiregion lattice for generating the second light flux.
Claim 8
Dependent Claim
28 words
The apparatus of claim 6 wherein the multiregion lattice has a lattice constant which is at least twice as large as the lattice constant of said square lattice.
Claim 9
Dependent Claim
41 words
The apparatus of claim 4 wherein one lattice is a square lattice for generating the first light flux and the other lattice is a hexagonal lattice, having a larger lattice constant than the square lattice, for generating the second light flux.
Claim 10
Dependent Claim
42 words
The apparatus of claim 4 where one of said lattices is a first stationary square lattice for generating the first light flux and the other lattice is a second square lattice rotatably mounted for producing said second light flux upon its rotation.
Claim 11
Dependent Claim
31 words
The apparatus of claim 1 wherein said light flux dividing means comprises a super lattice comprised of a plurality of plane lattices of different lattice constants arranged on the same plane.
Claim 12
Independent Claim
228 words
An apparatus for measuring the distribution of extensive and local irregularities on a mirror surface comprising: light generating means for irradiating a coherent light flux onto said mirror surface, a square lattice, positioned between said light generating means and said mirror surface, for dividing the light flux irradiated from said light generating means into a plurality of first light fluxes, arranged in a prescribed lattice form to cover said mirror surface, for measuring the extensive irregularities on said mirror surface a plane multiregion lattice positioned between said light generating means and said mirror surface and having a lattice constant that is at least twice as large as the lattice constant of said square lattice, for dividing the light flux irradiated from said light generating means into a plurality of second light fluxes, surrounding each of the first light fluxes but not overlapping or coinciding with each other, for measuring the distribution of local irregularities on the surface; and means for receiving light fluxes reflected from the mirror surface and for permitting the inspection of the pattern of reflections, whereby the distribution of extensive irregularities on the mirror surface are determined through the inspection of the pattern of reflections of the first light fluxes and the distribution of local irregularities on the mirror surface are determined through the inspection of the pattern of reflections from the second light fluxes.
Claim 13
Independent Claim
228 words
An apparatus for measuring the distribution of extensive and local irregularities on a mirror surface comprising: light generating means for irradiating a coherent light flux onto said mirror surface, a square lattice, positioned between said light generating means and said mirror surface, for dividing the light flux irradiated from said light generating means into a plurality of first light fluxes, arranged in a prescribed lattice form to cover said mirror surface, for measuring the extensive irregularities on said mirror surface a plane multiregion lattice positioned between said light generating means and said mirror surface and having a lattice constant that is at least twice as large as the lattice constant of said square lattice, for dividing the light flux irradiated from said light generating means into a plurality of second light fluxes, surrounding each of the first light fluxes but not overlapping or coinciding with each other, for measuring the distribution of local irregularities on the surface; and means for receiving light fluxes reflected from the mirror surface and for permitting the inspection of the pattern of reflections, whereby the distribution of extensive irregularities on the mirror surface are determined through the inspection of the pattern of reflections of the first light fluxes and the distribution of local irregularities on the mirror surface are determined through the inspection of the pattern of reflections from the second light fluxes.
Claim 14
Dependent Claim
14 words
The apparatus of claim 11 wherein the light generating means generates a laser beam.
Claim 15
Dependent Claim
41 words
The apparatus of claim 12 wherein said means for receiving and permitting inspection of said light fluxes includes a screen for viewing the reflected fluxes and a half mirror for directing the reflected fluxes from said mirror surface to said screen.
Claim 16
Dependent Claim
27 words
The apparatus of claim 12 further comprising means for electrically comparing the reflected fluxes with a standard to determine the distribution or irregularities on the mirror surface.
References Cited (Backward Citations)
US3439988A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1984-09-28 | 1985-03-30 | 1985-09-29 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1988-09-28 | 1989-03-30 | 1989-09-29 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1992-09-28 | 1993-03-30 | 1993-09-29 | $7700.00 | Window Closed / Lapsed |