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Patent US4317036A successfully refreshed from Google Patents.
US4317036A
Expired / Lapsed
US
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Scanning X-ray microscope
Assignee: NanoDynamics Inc USA
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Filing: 1980-03-11
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Granted: 1982-02-23
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Expires: 2000-03-11
Abstract
Abstract A scanning X-ray microscope including an X-ray source capable of emitting a beam of X-rays, a collimator positioned to receive the beam of X-rays and, to collimate this beam, a focusing cone means to focus the beam of X-rays, directed by the collimator, onto a focal plane, a specimen mount for supporting a specimen in the focal plane to receive the focused beam of X-rays, and X-ray beam scanning means to relatively move the specimen and the focusing cone means and collimator to scan the focused X-ray beam across the specimen, a detector disposed adjacent the specimen to detect flourescent photons emitted by the specimen upon exposure to the focused beam of X-rays to provide an electrical output representative of this detection, means for displaying and/or recording the information provided by the output from the detector, means for providing information to the recording and/or display means representative of the scan rate and position of the focused X-ray beam relative to the specimen whereby the recording and/or display means can correlate the information received to record and/or display quantitive and distributive information as to the quantity and distribution of elements detected in the specimen. Preferably there is provided an X-ray beam modulation means upstream, relative to the direction of emission of the X-ray beam, of the focusing cone means.
Inventors
- 👤 Chia-Gee Wang
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 18:18
CPC Classifications
G; G01; G01N; G01N23/00; G01N23/22; G01N23/223; G01N2223/00; G01N2223/07; G01N2223/076
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
190 words
A scanning X-ray microscope including an X-ray source capable of emitting a beam of X-rays, a collimator positioned to receive the beam of X-rays, to collimate this beam, a focusing cone means to focus the beam of X-rays, directed by the collimator, onto a focal plane, a specimen mount for supporting a specimen in the focal plane to receive the focused beam of X-rays, an X-ray beam scanning means to relatively move the specimen and the focusing cone means and collimator to scan the focused X-ray beam across the specimen, a detector disposed adjacent the specimen to detect emmissions by the specimen upon exposure to the focused beam of X-rays to provide an electrical output representative of this detection, means for displaying and/or recording the information provided by the output from the detector, means for providing information to the recording and/or display means representative of the scan rate and position of the focused X-ray beam relative to the specimen whereby the recording and/or display means can correlate the information received to record and/or display quantitative and distributive information as to the quantity and distribution of elements detected in the specimen.
Claim 2
Dependent Claim
190 words
A scanning X-ray microscope including an X-ray source capable of emitting a beam of X-rays, a collimator positioned to receive the beam of X-rays, to collimate this beam, a focusing cone means to focus the beam of X-rays, directed by the collimator, onto a focal plane, a specimen mount for supporting a specimen in the focal plane to receive the focused beam of X-rays, an X-ray beam scanning means to relatively move the specimen and the focusing cone means and collimator to scan the focused X-ray beam across the specimen, a detector disposed adjacent the specimen to detect emmissions by the specimen upon exposure to the focused beam of X-rays to provide an electrical output representative of this detection, means for displaying and/or recording the information provided by the output from the detector, means for providing information to the recording and/or display means representative of the scan rate and position of the focused X-ray beam relative to the specimen whereby the recording and/or display means can correlate the information received to record and/or display quantitative and distributive information as to the quantity and distribution of elements detected in the specimen.
Claim 3
Dependent Claim
29 words
A scanning X-ray microscope according to claim 1, comprising X-ray beam modulation means upstream, relative to the direction of emission of the X-ray beam, of the focusing cone means.
Claim 4
Dependent Claim
18 words
A scanning X-ray microscope according to claim 2, wherein the modulation means is disposed upstream of the collimator.
Claim 5
Dependent Claim
42 words
A scanning X-ray microscope according to claim 2, wherein the modulation means modulates the X-ray beam to provide an alternating energy level which is alternately above and below one or more characteristic peaks of responsiveness to X-rays of a desired target element.
Claim 6
Dependent Claim
53 words
A scanning X-ray microscope according to claim 4, wherein the modulation means is a modulator for the anode biasing electrical supply of the X-ray generator and this modulator modulates that supply to provide a square wave the respective high levels and low levels of which provide the desired modulation of the X-ray beam.
Claim 7
Dependent Claim
86 words
A scanning X-ray microscope according to claim 4, wherein the modulation means is a modulator filter disposed between the X-ray source and the focusing cone means, the modulator filter consisting of a least a first area consisting of a filter material which will filter unwanted frequencies from the X-ray generated by the X-ray source and a second discrete area consisting of a material which will filter said unwanted frequencies and the frequency of X-rays required to excite the desired peak or peaks of the target element.
Claim 8
Dependent Claim
80 words
A scanning X-ray microscope according to claim 2, wherein a lock-in amplifier receives the information produced by the detector and modulation information from the modulator and compares these to determine the difference between signals from the detector when the specimen is exposed to the different levels of modulation of the X-ray beam, the lock-in amplifier providing an output to the record and/or display means representing the difference between the signals produced by the detector with the different levels of modulation.
Claim 9
Dependent Claim
21 words
A scanning X-ray microscope according to claim 1, wherein the record and/or display means is a cathode ray tube display device.
Claim 10
Dependent Claim
15 words
A scanning X-ray microscope according to claim 1, wherein the detector is a scintillation detector.
Claim 11
Dependent Claim
28 words
A scanning X-ray microscope according to claim 1, wherein the X-ray beam scanning means deflects the collimator and focusing cone means to scan the beam across a specimen.
Claim 12
Dependent Claim
38 words
A scanning X-ray microscope according to claim 10 wherein the X-ray beam scanning means scans the beam in a step-by-step manner sequentially exposing discrete areas of the specimen to the focused X-ray beam for discrete periods of time.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1985-02-22 | 1985-08-24 | 1986-02-23 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1989-02-22 | 1989-08-24 | 1990-02-23 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1993-02-22 | 1993-08-24 | 1994-02-23 | $7700.00 | Window Closed / Lapsed |