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US4514857A Expired / Lapsed US ⏱️ 0.0 years remaining

X-Ray lithographic system

Assignee: Hitachi Ltd
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Filing: 1983-10-13
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Granted: 1985-04-30
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Expires: 2003-10-13
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Abstract

Abstract While a convex mirror is being rotated or rotatingly vibrated about a rotational axis which is parallel to the center axis of the convex mirror and which is eccentric to the convex mirror, a synchrotron radiation flux is caused to be incident on the convex mirror, and a radiation sensitive resist film is irradiated with the reflected radiation flux through a mask. Thus, an area of uniform irradiation can be increased remarkably as compared with that in a prior art, and the invention is well suited to the irradiation of a semiconductor wafer having a large area.

Inventors

  • 👤 Takashi Kimura
  • 👤 Kozo Mochiji
  • 👤 Hidehito Obayashi

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 19:06
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/70; G03F7/70058; G03F7/70075; H; H10; H10P; H10P95/00

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 85 words
In an X-ray lithographic system having means to cause a synchrotron radiation flux of desired diameter to be incident on a convex mirror, and means to irradiate a radiation sensitive resist film with reflected light from the convex mirror, through a mask having a desired pattern; an X-ray lithographic system characterized by comprising means to rotate or rotatingly vibrate said convex mirror about a rotational axis which is parallel to a center axis of said convex mirror and which is eccentric to said convex mirror.
Claim 2
Dependent Claim 85 words
In an X-ray lithographic system having means to cause a synchrotron radiation flux of desired diameter to be incident on a convex mirror, and means to irradiate a radiation sensitive resist film with reflected light from the convex mirror, through a mask having a desired pattern; an X-ray lithographic system characterized by comprising means to rotate or rotatingly vibrate said convex mirror about a rotational axis which is parallel to a center axis of said convex mirror and which is eccentric to said convex mirror.
Claim 3
Dependent Claim 18 words
An X-ray lithographic system according to claim 1, wherein said convex mirror has an arcuate or circular section.
Claim 4
Dependent Claim 33 words
An X-ray lithographic system according to claim 2, wherein the rotational axis of said convex mirror intersects substantially orthogonally to an optic axis of the synchrotron radiation flux incident on said convex mirror.
Claim 5
Dependent Claim 50 words
An X-ray lithographic system according to claim 3, wherein the rotational axis of said convex mirror lies within the synchrotron radiation flux, and it lies in agreement with or in the vicinity of a side end of the radiation flux located on a reflective surface side of said convex mirror.

References Cited (Backward Citations)

US4242588A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1988-04-29 1988-10-29 1989-04-30 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1992-04-29 1992-10-29 1993-04-30 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1996-04-29 1996-10-29 1997-04-30 $7700.00 Window Closed / Lapsed

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