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Pattern detector

Assignee: Hitachi Ltd
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Filing: 1983-10-07
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Granted: 1986-07-01
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Expires: 2003-10-07
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Abstract

Abstract A pattern detector according to the present invention adopts a processing method wherein means is provided anew with which the intensity distribution of light reflected from or transmitted through an illuminated specimen is photoelectrically converted, and a pattern position is detected at high speed from the ratio between the primary moment and integral value of a detection signal thus derived, whereupon a symmetry calculation is executed within a narrow range around the detected value, whereby the pattern position is found fast and precisely.

Inventors

  • 👤 Tsuneo Terasawa
  • 👤 Shinji Kuniyoshi
  • 👤 Akihiro Takanashi
  • 👤 Toshiei Kurosaki
  • 👤 Yoshio Kawamura
  • 👤 Sumio Hosaka

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 09:54
CPC Classifications
G; G03; G03F; G03F9/00; G03F9/70; H; H10; H10P; H10P95/00

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 127 words
A pattern detector comprising: a detection signal deriving portion in which a specimen is illuminated, whereupon an intensity distribution of light reflected from or transmitted through the specimen is photoelectrically converted and then derived as a detection signal; and a processing portion which executes signal processing for measuring a specimen position from the derived detection signal; wherein said processing portion comprises (a) means for calculating a centroid of the detection signal, including means for calculating a primary moment of the detection signal, means for calculating an integral value of the detection signal, and means for dividing the primary moment by the integral value; and (b) a symmetry calculating portion which detects the specimen position near the centroid of the detection signal calculated by said centroid calculating means.
Claim 2
Dependent Claim 127 words
A pattern detector comprising: a detection signal deriving portion in which a specimen is illuminated, whereupon an intensity distribution of light reflected from or transmitted through the specimen is photoelectrically converted and then derived as a detection signal; and a processing portion which executes signal processing for measuring a specimen position from the derived detection signal; wherein said processing portion comprises (a) means for calculating a centroid of the detection signal, including means for calculating a primary moment of the detection signal, means for calculating an integral value of the detection signal, and means for dividing the primary moment by the integral value; and (b) a symmetry calculating portion which detects the specimen position near the centroid of the detection signal calculated by said centroid calculating means.
Claim 3
Dependent Claim 39 words
A pattern detector as defined in claim 1, wherein said detection signal deriving portion includes an A/D converter which converts a photoelectric signal into a digital value, and a memory which stores the value of the A/D-converted detection signal.
Claim 4
Dependent Claim 54 words
A pattern detector as defined in claim 2, wherein said primary moment calculating means includes a multiplier circuit which multiplies the value of the signal stored in said memory and a counter value indicative of an address of said memory which stores the detection signal, and an adder circuit which adds the multiplied results.

References Cited (Backward Citations)

US3514612A Cited
US4115762A Cited
US4380395A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1989-06-30 1989-12-30 1990-07-01 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1993-06-30 1993-12-30 1994-07-01 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1997-06-30 1997-12-30 1998-07-01 $7700.00 Window Closed / Lapsed

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