Patent US4623836A successfully refreshed from Google Patents.
US4623836A
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Sampling method for fast potential determination in electron beam mensuration
Assignee: Advantest Corp
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Filing: 1985-01-22
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Granted: 1986-11-18
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Expires: 2005-01-22
Abstract
Abstract A sampling method for potential determination in electron beam mensuration, in which a progression of a periodic signal is to be identified at a measuring point, makes it possible to clearly increase the speed in electron beam potential measurement. The progression of the periodic signal is sampled by the pulsed electron beam repeatedly during a period of the progression of the periodic signal, namely at the specified times t 1 , t 2 . . . t n .
Inventors
- 👤 Jurgen Frosien
- 👤 Burkhard Lischke
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 23:39
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/302; G01R31/305
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
127 words
In a method of sampling a progression of a periodic signal for potential determination of the periodic signal at a measuring point in an integrated circuit, the improvement comprising the steps of: during one period of the progression of the periodic signal, repeatedly sampling and therby measuring the progression of the periodic signal by producing secondary electron signals by applying an electron beam to the measuring point while gating the electron beam in synchronism with the periodic signal to produce electron beam pulses having a varying phase relation relative to the phase of the periodic signal and with a spacing of the electron beam pulses which is greater than the decay time of the secondary electron signals; and storing the individual secondary electron signals in chronological succession.
Claim 2
Dependent Claim
127 words
In a method of sampling a progression of a periodic signal for potential determination of the periodic signal at a measuring point in an integrated circuit, the improvement comprising the steps of: during one period of the progression of the periodic signal, repeatedly sampling and therby measuring the progression of the periodic signal by producing secondary electron signals by applying an electron beam to the measuring point while gating the electron beam in synchronism with the periodic signal to produce electron beam pulses having a varying phase relation relative to the phase of the periodic signal and with a spacing of the electron beam pulses which is greater than the decay time of the secondary electron signals; and storing the individual secondary electron signals in chronological succession.
Claim 3
Dependent Claim
61 words
The improved method of claim 1, wherein the step of gating is further defined as: gating the electron beam to produce electron beam pulses of constant spacing while shifting the phase of the electron beam pulses over phase regions whose individual sizes correspond to the overall phase region divided by the electron beam pulses of the period of the periodic signal.
Claim 4
Dependent Claim
25 words
The improved method of claim 1, and further comprising the steps of: reading the stored signals in individual chronological succession; and recording the read signals.
Claim 5
Dependent Claim
22 words
The improved method of claim 3, wherein the step of recording is further defined as: recording the read signals with an oscilloscope.
Claim 6
Dependent Claim
23 words
The improved method of claim 3, wherein the step of recording is further defined as: recording the read signals with an x-y recorder.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-11-17 | 1990-05-19 | 1990-11-18 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-11-17 | 1994-05-19 | 1994-11-18 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-11-17 | 1998-05-19 | 1998-11-18 | $7700.00 | Window Closed / Lapsed |