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Fluxless soldering process using a silane atmosphere

Assignee: International Business Machines Corp
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Filing: 1985-10-31
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Granted: 1987-03-03
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Expires: 2005-10-31
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Abstract

Abstract Solder reflow or solder chip joining can be accomplished in a fluxless system by conducting the solder reflow or chip joining procedure in a carrier gas which comprises from about 0.1 to about 10% by volume SiH 4 , based on the volume of carrier gas and SiH 4 . A preferred carrier gas for the reflow is hydrogen and a preferred carrier gas for the chip joining is nitrogen.

Inventors

  • 👤 Robert T. Howard, Jr.

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 09:21
CPC Classifications
B; B23; B23K; B23K35/00; B23K35/22; B23K35/38; H; H05; H05K; H05K3/00; H05K3/30; H05K3/32; H05K3/34; H05K3/3489; H10; H10W; H10W72/00; H10W72/071; H10W72/072; H10W72/07231; H10W72/07236; H10W72/20; H10W72/251; H10W72/252

Claims Analysis

Total Claims: 16
Claim 1
Independent Claim 60 words
In a process for joining a semiconductor chip to a substrate by soldering in a carrier gas, the improvement which comprises: performing the soldering step in the presence of SiH 4 , thereby reducing any oxide on the solder, resulting in the formation of H 2 O and SiO 2 which exit with the carrier gas and SiH 4 .
Claim 2
Dependent Claim 60 words
In a process for joining a semiconductor chip to a substrate by soldering in a carrier gas, the improvement which comprises: performing the soldering step in the presence of SiH 4 , thereby reducing any oxide on the solder, resulting in the formation of H 2 O and SiO 2 which exit with the carrier gas and SiH 4 .
Claim 3
Dependent Claim 54 words
In a process for reflowing solder in a carrier gas, the improvement which comprises: performing the reflowing step in the presence of SiH 4 , thereby reducing any oxide on the solder, resulting in the formation of H 2 O and SiO 2 which exit with the carrier gas and the SiH 4 .
Claim 4
Dependent Claim 54 words
In a process for reflowing solder in a carrier gas, the improvement which comprises: performing the reflowing step in the presence of SiH 4 , thereby reducing any oxide on the solder, resulting in the formation of H 2 O and SiO 2 which exit with the carrier gas and the SiH 4 .
Claim 5
Dependent Claim 13 words
A process as claimed in claim 1, wherein the carrier gas is nitrogen.
Claim 6
Dependent Claim 32 words
A process as claimed in claim 3, wherein there is used from about 0.1 to about 10% SiH 4 , based on the total volume of carrier gas and SiH 4 .
Claim 7
Dependent Claim 22 words
A process as claimed in claim 4, wherein the solder comprises from about 0.1 to about 5% tin, balance lead, by weight.
Claim 8
Dependent Claim 17 words
A process as claimed in claim 4, wherein the solder comprises over 50% tin, balance substantially lead.
Claim 9
Dependent Claim 13 words
A process as claimed in claim 2, wherein the carrier gas is hydrogen.
Claim 10
Dependent Claim 32 words
A process as claimed in claim 7, wherein there is used from about 0.1 to about 10% SiH 4 , based on the total volume of carrier gas and SiH 4 .
Claim 11
Dependent Claim 22 words
A process as claimed in claim 8, wherein the solder comprises from about 0.1% to about 5% tin, balance lead, by weight.
Claim 12
Dependent Claim 17 words
A process as claimed in claim 8, wherein the solder comprises over 50% tin, balance substantially lead.
Claim 13
Dependent Claim 108 words
In a process for joining a semiconductor chip to a substrate which includes a solder reflow step and joining the semiconductor chip to a substrate by soldering, both of these steps being conducted in a carrier gas, the improvement which comprises: performing the solder reflow step in the presence of hydrogen containing from about 0.1 to about 10% by volume silane, based on the total volume of hydrogen and silane; and joining the semiconductor chip to the substrate in a carrier gas which comprises nitrogen containing from about 0.1 to about 10% by volume SiH 4 , based on the total volume of nitrogen plus SiH 4 .
Claim 14
Dependent Claim 108 words
In a process for joining a semiconductor chip to a substrate which includes a solder reflow step and joining the semiconductor chip to a substrate by soldering, both of these steps being conducted in a carrier gas, the improvement which comprises: performing the solder reflow step in the presence of hydrogen containing from about 0.1 to about 10% by volume silane, based on the total volume of hydrogen and silane; and joining the semiconductor chip to the substrate in a carrier gas which comprises nitrogen containing from about 0.1 to about 10% by volume SiH 4 , based on the total volume of nitrogen plus SiH 4 .
Claim 15
Dependent Claim 22 words
A process as claimed in claim 11, wherein the solder comprises from about 0.1 to about 5% tin, balance lead, by weight.
Claim 16
Dependent Claim 17 words
A process as claimed in claim 11, wherein the solder comprises over 50% tin, balance substantially lead.

References Cited (Backward Citations)

US3012903A Cited
US3665590A Cited
US3754698A Cited
US4576659A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1990-03-02 1990-09-01 1991-03-03 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1994-03-02 1994-09-01 1995-03-03 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1998-03-02 1998-09-01 1999-03-03 $7700.00 Window Closed / Lapsed

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