Surface-derivatized semiconductors with chemically sensitive luminescence

Claim 3

The apparatus of claim 1 wherein said source of radiation comprises visible light.

Claim 4

The apparatus of claim 1 wherein said semiconductor comprises a solid state solution of at least two elements selected from the group consisting of (a) cadmium, selenium and sulfur, (b) zinc, selenium and sulfur, (c) cadmium, zinc and selenium, (d) cadmium, zinc and sulfur, (e) cadmium and selenium, (f) cadmium and sulfur, (g) zinc and selenium doped with aluminum, (h) gallium and arsenic, (i) gallium, arsenic and phosphorus, and (j) gallium and phosphorus.

Claim 5

The apparatus of claim 3 wherein said means for detecting changes in the characteristics of the radiation is a radiometer.

Claim 6

The apparatus of claim 3 wherein said reacted material comprises a ferrocene compound.

Claim 7

The apparatus of claim 1 wherein said means for detecting changes in the characteristics of the radiation is a radiometer.

Claim 8

The apparatus of claim 6 wherein said source of radiation comprises visible light.

Claim 9

The apparatus of claim 6 wherein said reacted material comprises a ferrocene compound.

Claim 10

The apparatus of claim 8 wherein said source of radiation comprises visible light.

Claim 11

The process for detecting the presence of chemical components comprising providing a photoluminescent semiconductor having on at least one radiation emitting surface a reacted material bonded to said radiation emitting surface, said reacted material being capable of undergoing a redox reaction with an oxidizing or reducing compound to produce a redox product bonded to said radiation emitting surface, which reacted material has an ionic charge distribution which is vertical with respect to the radiation emitting surface, said charge distribution being capable of altering an electric field in said semiconductor, irradiating said surface with actinic radiation, observing the radiation emitted from said surface, then exposing said surface to an environment having chemical compounds capable of oxidizing or reducing said reacted material therein and detecting any changes in the radiation emitted from said surface.

Claim 12

The process for detecting the presence of chemical components comprising providing a photoluminescent semiconductor having on at least one radiation emitting surface a reacted material bonded to said radiation emitting surface, said reacted material being capable of undergoing a redox reaction with an oxidizing or reducing compound to produce a redox product bonded to said radiation emitting surface, which reacted material has an ionic charge distribution which is vertical with respect to the radiation emitting surface, said charge distribution being capable of altering an electric field in said semiconductor, irradiating said surface with actinic radiation, observing the radiation emitted from said surface, then exposing said surface to an environment having chemical compounds capable of oxidizing or reducing said reacted material therein and detecting any changes in the radiation emitted from said surface.

Claim 13

The process of claim 10 wherein said actinic radiation is visible light.

Claim 14

The process of claim 10 wherein light from a light bulb, laser, or light emitting diode provides said actinic radiation.