Apparatus for limiting minority carrier injection in CMOS memories

Claim 2

In a metal-oxide-semiconductor (MOS) memory where a plurality of memory cells are fabricated in a well of a first conductivity type, said well being formed in a substrate of a second conductivity type, an improvement comprising: a separate distribution bus disposed on said substrate for providing power to said memory cells formed in said well and coupled to said well for biasing said well; and, a resistor formed on said substrate, in series with said bus for providing filtering of power distributed to said memory cells by said bus, whereby minority carrier generation in said well is reduced.

Claim 3

The improvement defined by claim 1 wherein a plurality of contacts are used from said bus to said well to reduce the resistance associated with said biasing of said well.

Claim 4

The improvement defined by claim 1 wherein said memory includes sense amplifiers, said sense amplifiers being disposed in a second well of said first conductivity type.

Claim 5

The improvement defined by claim 3 wherein said separate bus is connected to said second well for biasing said second well.

Claim 6

The improvement defined by claim 4 wherein a plurality of contacts are coupled between said separate bus and said second well.

Claim 7

The improvement defined by claim 5 wherein said separate bus is coupled to a generator which provides the sense amplifier strobe signal for driving bit lines to the power supply potential.

Claim 8

The improvement defined by claims 1 or 5 wherein said memory cells includes polysilicon plates which are coupled to said separate bus.

Claim 9

In a metal-oxide-semiconductor (MOS) dynamic random-access memory (RAM) where a plurality of memory cells are fabricated in an n-type well formed in a p-type substrate, an improvement comprising: a first and a second power distribution bus, said first power distribution bus being coupled to power, at least some decoders and buffers; said second power distribution bus being coupled to provide power to said memory cells and coupled to said well for biasing said well; a resistor formed on said substrate and coupled to said second bus for providing filtering of power distributed by said second bus; whereby minority carrier generation in said well is reduced.

Claim 10

In a metal-oxide-semiconductor (MOS) dynamic random-access memory (RAM) where a plurality of memory cells are fabricated in an n-type well formed in a p-type substrate, an improvement comprising: a first and a second power distribution bus, said first power distribution bus being coupled to power, at least some decoders and buffers; said second power distribution bus being coupled to provide power to said memory cells and coupled to said well for biasing said well; a resistor formed on said substrate and coupled to said second bus for providing filtering of power distributed by said second bus; whereby minority carrier generation in said well is reduced.

Claim 11

The improvement defined by claim 8 wherein a plurality of contacts are used between said second bus and said well to reduce the resistance associated with said biasing of said well.

Claim 12

The improvement defined by claim 8 wherein said memory includes a plurality of sense amplifiers, said sense amplifiers being disposed in second n-type wells, said second wells being spaced-apart from said wells which contain said memory cells.

Claim 13

The improvement defined in claim 10 wherein a plurality of contacts are used to interconnect said second well with said second bus.

Claim 14

The improvement defined by claims 8 or 10 wherein said second bus supplies power to a generator which generates a sense amplifier strobe signal for driving bit lines to the power supply potential.

Claim 15

The improvement defined by claims 8 or 10 wherein said second bus is coupled to supply power to plates which are part of said memory cells.

Claim 16

The improvement defined by claims 8 or 10 wherein said second bus provides a clamping potential for word lines used in said memory.