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US4751455A Expired / Lapsed US ⏱️ 0.0 years remaining

Low frequency noise measurement system using sliding pole for fast settling

Assignee: Analog Devices Inc
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Filing: 1985-12-04
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Granted: 1988-06-14
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Expires: 2005-12-04
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Abstract

Abstract Apparatus and method for performing low-frequency noise measurements on active devices such as operational amplifiers, instrumentation amplifiers and the like. A device under test is settled thermally in a short, controlled interval. The device under test is placed in a test fixture within a closed housing which shields against air flow. A substantial heat sink is urged against the device under test while a pre-heat circuit preheats the device for about 1-2 seconds by forcing it to consume a predetermined amount of energy. The voltage output of the device under test is supplied to a band-pass filter which includes a high-pass filter having a single dominant pole whose frequency may be varied. A control circuit smoothly moves that pole from a first, higher frequency of about 50 Hz to a second, lower frequency of about 0.1 Hz in an interval of only 3 seconds or so, rapidly settling the filter.

Inventors

  • 👤 Charles H. Ayres

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 06:44
CPC Classifications
G; G01; G01R; G01R29/00; G01R29/26

Claims Analysis

Total Claims: 15
Claim 1
Independent Claim 127 words
Apparatus for providing the low frequency noise signal of an energized device under test, comprising: a. a housing containing a socket for receiving the device under test; b. within said housing, a heat sink adapted to be brought into contact with the device under test; c. means for electrically preheating the device under test to stabilize its input offset voltage thermally; d. a high-pass filter connected to receive a voltage output from the device under test for output to a noise measurement apparatus; e. the frequency response of the high-pass filter having one dominant pole; f. means for smoothly sliding the frequency of said dominant pole from a first, higher frequency to a second, lower frequency over a relatively short interval; to facilitate settling of said filter.
Claim 2
Dependent Claim 127 words
Apparatus for providing the low frequency noise signal of an energized device under test, comprising: a. a housing containing a socket for receiving the device under test; b. within said housing, a heat sink adapted to be brought into contact with the device under test; c. means for electrically preheating the device under test to stabilize its input offset voltage thermally; d. a high-pass filter connected to receive a voltage output from the device under test for output to a noise measurement apparatus; e. the frequency response of the high-pass filter having one dominant pole; f. means for smoothly sliding the frequency of said dominant pole from a first, higher frequency to a second, lower frequency over a relatively short interval; to facilitate settling of said filter.
Claim 3
Dependent Claim 26 words
The apparatus of claim 1 wherein the means for preheating the device under test is adapted to cause an electrical current to flow through the device.
Claim 4
Dependent Claim 21 words
The apparatus of claim 1 wherein said means for preheating the device under test places an electrical load across the device.
Claim 5
Dependent Claim 31 words
The apparatus of claim 3 wherein the energy consumed by the device under test is controlled by varying at least one of the load and the time the load is driven.
Claim 6
Dependent Claim 31 words
The apparatus of claim 1 further comprising a low pass filter connected in series with said high pass filter between the output of the device under test and the measurement apparatus.
Claim 7
Dependent Claim 15 words
The apparatus of claim 5 wherein said low pass filter is a two-pole Butterworth filter.
Claim 8
Dependent Claim 19 words
The apparatus of claim 5 or claim 6 wherein said low pass filter has a pole near 10 Hz.
Claim 9
Dependent Claim 26 words
The apparatus of claim 1 or claim 5 wherein said first, higher frequency is about 50 Hz and said second, lower frequency is about 0.1 Hz.
Claim 10
Dependent Claim 53 words
The apparatus of claim 1 wherein the high pass filter further comprises a voltage controlled resistor whose resistance is established by a control voltage, the frequency of the dominant pole being established in part by said resistor, and means for providing a smoothly variable control voltage for application to the voltage controlled resistor.
Claim 11
Dependent Claim 13 words
The apparatus of claim 9 wherein the voltage controlled resistor is a JFET.
Claim 12
Independent Claim 121 words
A method for performing a low frequency noise measurement on a device under test comprising the steps of: (a) placing the device under test in contact with a heat sink; (b) electrically energizing the device under test; (c) electrically heating the device under test by passing a current therethrough; (d) passing the output of the device under test through a high-pass filter having one dominant pole; (e) sliding the frequency of said dominant pole from a first, higher frequency to a second, lower frequency over a relatively short interval, to facilitate settling of said filter; and at the output of the high-pass filter, measuring the filtered noise output of the device under test in the absence of an applied input signal.
Claim 13
Independent Claim 121 words
A method for performing a low frequency noise measurement on a device under test comprising the steps of: (a) placing the device under test in contact with a heat sink; (b) electrically energizing the device under test; (c) electrically heating the device under test by passing a current therethrough; (d) passing the output of the device under test through a high-pass filter having one dominant pole; (e) sliding the frequency of said dominant pole from a first, higher frequency to a second, lower frequency over a relatively short interval, to facilitate settling of said filter; and at the output of the high-pass filter, measuring the filtered noise output of the device under test in the absence of an applied input signal.
Claim 14
Independent Claim 158 words
A system for measuring the low frequency noise of a plurality of devices under test (DUT), comprising: (a) a plurality of test sockets for receiving DUTs; (b) a heat sink for placement in contact with a DUT placed in the socket; (c) means for electrically preheating each DUT; (d) associated with each socket, a high pass filter connectable via the socket to the output of the DUT placed therein, said filter having one dominant pole and means for smoothly sliding the frequency of said dominant pole from a first, higher frequency to a second, lower frequency over a relatively short interval, to facilitate settling of said filter; (e) a multiplexer having a single output and a plurality of inputs, each input being connected to an output of one of said filters; (f) a measurement system connected to the output of the multiplexer for measuring the noise generated by the DUT whose output is connected to the multiplexer output.
Claim 15
Independent Claim 158 words
A system for measuring the low frequency noise of a plurality of devices under test (DUT), comprising: (a) a plurality of test sockets for receiving DUTs; (b) a heat sink for placement in contact with a DUT placed in the socket; (c) means for electrically preheating each DUT; (d) associated with each socket, a high pass filter connectable via the socket to the output of the DUT placed therein, said filter having one dominant pole and means for smoothly sliding the frequency of said dominant pole from a first, higher frequency to a second, lower frequency over a relatively short interval, to facilitate settling of said filter; (e) a multiplexer having a single output and a plurality of inputs, each input being connected to an output of one of said filters; (f) a measurement system connected to the output of the multiplexer for measuring the noise generated by the DUT whose output is connected to the multiplexer output.

References Cited (Backward Citations)

US3541462A Cited
US3619780A Cited
US3863165A Cited
US3832642A Cited
US3842346A Cited
US4045733A Cited
US4114096A Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-06-14 1991-12-14 1992-06-14 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-06-14 1995-12-14 1996-06-14 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-06-14 1999-12-14 2000-06-14 $7700.00 Window Closed / Lapsed

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