Semiconductor device with source and drain depth extenders and a method of making the same

Claim 2

A semiconductor device, comprising: an insulating substrate; a layer of semiconductor material disposed on said insulating substrate; source and drain depth extenders of a first conductivity type disposed within said layer of semiconductor material so that at least a portion of each of said extenders has a common boundary with said insulating substrate; and source and drain regions of a first conductivity type disposed within said layer of semiconductor material so that each of said source and drain depth extenders subtend and contact the respective source and drain regions, said source and drain regions each having an impurity concentration which is greater than the impurity concentration of the respective source and drain depth extenders and a depth which is less than the thickness of said layer of semiconductor material.

Claim 3

A semiconductor device in accordance with claim 1, further comprising: a channel region having a defined channel length disposed between said source and drain regions; and said source and drain depth extenders being separated by a distance greater than said channel length.

Claim 4

A semiconductor device in accordance with claim 2 wherein said source and drain regions each having an impurity concentration of at least three orders of magnitude greater than the impurity concentration of the respective source and drain depth extenders.

Claim 5

In a complimentary metal-oxide-semiconductor device including an insulating substrate, a layer of semiconductor material disposed on said insulating substrate, a P-channel metal-oxide-semiconductor transistor disposed in a first predetermined portion of said layer and an N-channel metal-oxide-semiconductor transistor disposed in a second predetermined portion of said layer, the improvement comprising: P-type source and drain depth extenders for said P-channel transistor disposed within said first predetermined portion of said layer so that at least a portion of each of said extenders has a common boundary with said insulating substrate; N-type source and drain depth extenders for said N-channel transistor disposed within said second predetermined portion of said layer so that at least a portion of each of said extenders has a common boundary with said insulating substrate; P-type source and drain regions disposed within said first predetermined portion of said layer so that each of said P-type source and drain depth extenders subtend and contact the respective P-type source and drain regions, said P-type source and drain regions each having an impurity concentration which is greater than the impurity concentration of the respective P-type source and drain depth extenders and a depth which is less than the thickness of said layer of semiconductor material; and N-type source and drain regions disposed within said second predetermined portion of said layer so that each of said N-type source and drain depth extenders subtend and contact the respective N-type source and drain regions, said N-type source and drain regions each having an impurity concentration which is greater than the impurity concentration of the respective N-type source and drain depth extenders and a depth which is less than the thickness of said layer of semiconductor material.

Claim 6

In a complimentary metal-oxide-semiconductor device including an insulating substrate, a layer of semiconductor material disposed on said insulating substrate, a P-channel metal-oxide-semiconductor transistor disposed in a first predetermined portion of said layer and an N-channel metal-oxide-semiconductor transistor disposed in a second predetermined portion of said layer, the improvement comprising: P-type source and drain depth extenders for said P-channel transistor disposed within said first predetermined portion of said layer so that at least a portion of each of said extenders has a common boundary with said insulating substrate; N-type source and drain depth extenders for said N-channel transistor disposed within said second predetermined portion of said layer so that at least a portion of each of said extenders has a common boundary with said insulating substrate; P-type source and drain regions disposed within said first predetermined portion of said layer so that each of said P-type source and drain depth extenders subtend and contact the respective P-type source and drain regions, said P-type source and drain regions each having an impurity concentration which is greater than the impurity concentration of the respective P-type source and drain depth extenders and a depth which is less than the thickness of said layer of semiconductor material; and N-type source and drain regions disposed within said second predetermined portion of said layer so that each of said N-type source and drain depth extenders subtend and contact the respective N-type source and drain regions, said N-type source and drain regions each having an impurity concentration which is greater than the impurity concentration of the respective N-type source and drain depth extenders and a depth which is less than the thickness of said layer of semiconductor material.

Claim 7

A complimentary metal-oxide-semiconductor device according to claim 4, further comprising: channel regions having defined channel lengths disposed between the source and drain regions of each of said N-channel and P-channel transistors; and each of said source and drain depth extenders for said N-channel and P-channel transistors being separated by a distance greater than the channel length of the respective N-channel and P-channel transistors.

Claim 8

A complimentary metal-oxide-semiconductor device according to claim 5 wherein said P-type and N-type source and drains each having an impurity concentration of at least three orders of magnitude greater than the impurity concentration of the respective P-type and N-type source and drain depth extenders.

Claim 9

A complimentary metal-oxide-semiconductor device according to claim 4 wherein said first and second predetermined portions are disposed in a common island of said layer of semiconductor material.

Claim 10

A complimentary metal-oxide-semiconductor device according to claim 4 wherein said first and second predetermined portions are disposed in separate islands of said layer of semiconductor material.