Stress analyzer with automatic overload response

Claim 2

In an apparatus for analyzing stress in an object, including a detector for detecting stress-related radiation emitted by the object and for generating signals indicative thereof, a scanner for scanning the detector across the object in response to scan control signals applied thereto, a variable gain amplifier for amplifying the signals generated by the detector, and a control unit for acquiring the amplified signals form the amplifier and generating the scan control signals, characterized by the control unit comprising: means for detecting an overload condition; and means for automatically causing the scanner to rescan a portion of the object if the overload condition disappears within a certain time period.

Claim 3

The control unit of claim 1, further comprising: means for stopping acquisition of signals from the detector in response to detection of the overload condition and before the object is rescanned; and means for resuming acquisition of signals from the detector as the object is rescanned.

Claim 4

The control unit of claim 1, further comprising: means for automatically adjusting the gain of the variable gain amplifier in response to occurrence of the overload condition.

Claim 5

The apparatus of claim 3, further comprising: a monitor for displaying data acquired by the control unit, the control unit comprising means for delaying automatic gain adjustment for a certain time period if data acquired by the control unit is being displayed on the monitor.

Claim 6

The control unit of claim 1, further comprising: means for automatically adjusting a scaling factor relating to data acquired before and after ocurrence of the overload condition.

Claim 7

The control unit of claim 1, wherein the overload detecting means comprises: means for counting overload occurrences during a certain time period.

Claim 8

In an apparatus for analyzing stress in an object, including a detector for detecting stress-related radiation emitted by the object, a scanner for scanning the detector across the object in response to scan control signals applied thereto, a variable gain amplifier for amplifying signals from the detector, and a control unit for acquiring amplified detector signals and generating scan control signals, characterized by the control unit comprising: means for detecting an overload condition; means for stopping acquisition of signals from the detector; means for automatically adjusting the gain of the variable gain amplifier; means for automatically adjusting a scaling factor relating to detector signals acquired by the control unit before and after the overload condition; and means for automatically causing the scanner to rescan a previously scanned portion of the object and then to continue scanning unscanned portions of the object.

Claim 9

In an apparatus for analyzing stress in an object, including a detector for detecting stress-related radiation emitted by the object, a scanner for scanning the detector across the object in response to scan control signals applied thereto, a variable gain amplifier for amplifying signals from the detector, and a control unit for acquiring amplified detector signals and generating scan control signals, characterized by the control unit comprising: means for detecting an overload condition; means for stopping acquisition of signals from the detector; means for automatically adjusting the gain of the variable gain amplifier; means for automatically adjusting a scaling factor relating to detector signals acquired by the control unit before and after the overload condition; and means for automatically causing the scanner to rescan a previously scanned portion of the object and then to continue scanning unscanned portions of the object.