CMOS RAM data compare circuit

Claim 2

A data compare circuit for use with a complementary metal-oxide-semiconductor random-access-memory (CMOS RAM) to check the equality of a bit field in an accessed RAM word against data values, said circuit comprising: an inverter (I1) having an input connected to receive a true data signal and an output to provide a complementary data signal; a first group of series-connected transistors formed of a first P-channel transistor (P1), a second P-channel transistor (P2), a first N-channel transistor (N1) and a second N-channel transistor (N2); said first P-channel transistor (P1) having its source connected to a supply potential (VCC), its gate connected to the output of the inverter (I1), and its drain connected to the source of said second P-channel transistor (P2); said second P-channel transistor (P2) having its gate connected to a first sense node (X) and its drain connected to an intermediate node (A); said first N-channel transistor (N1) having its drain connected to the intermediate node (A), its gate connected to the first sense node (X), and its source connected to the drain of said second N-channel transistor (N2); said second N-channel transistor (N2) having its gate connected to the input of the inverter (I1) and its source connected to a ground potential; a second group of series-connected transistors formed of a third P-channel transistor (P3), a fourth P-channel transistor (P4), a third N-channel transistor (N3), and a fourth N-channel transistor (N4); said third P-channel transistor (P3) having its source connected to the supply potential (VCC), its gate connected to the input of said inverter (I1), and its drain connected to the source of said fourth P-channel transistor (P4); said fourth P-channel transistor (P4) having its gate connected to a second sense node (Y) and its drain connected to the intermediate node (A); said third N-channel transistor (N3) having its drain connected to the intermediate node (A), its gate connected to the second sense node (Y) and its source connected to the drain of said fourth N-channel transistor (N4); said fourth N-channel transistor (N4) having its gate connected to the output of the inverter (I1) and its source connected to the ground potential; and an N-channel switching transistor (N5) having its source connected to the ground potential, its gate connected to the intermediate node (A) and its drain connected to an output line (18) for generating an equal signal (E) which is discharged from a precharged high voltage level to a low logic level when the bit field in the accessed RAM word and the data values are different.

Claim 3

A data compare circuit as claimed in claim 1, further comprising means for precharging said output line to the precharged high voltage level.

Claim 4

A data compare circuit as claimed in claim 2, wherein precharging means comprises a P-channel transistor (P5) which has its source connected to the supply potential (VCC), its gate connected to receive a precharge signal (C4) and its drain connected to the output line (18).

Claim 5

A data compare circuit for use with a complementary metal-oxide-semiconductor random-access-memory (CMOS RAM) to check the equality of a bit field in an accessed RAM word against data values, said circuit comprising: inverter means having an input connected to receive a true data signal and an output to provide a complementary data signal; first sensing means being connected to receive a true sense signal at a first sense node of a sense amplifier and being responsive to said true and complementary data signals for generating a first high logic signal at an intermediate node when the true sense signal is at a low logic level and the true data signal is at a high logic level; second sensing means being connected to receive a complementary sense signal at a second sense node of the sense amplifier and being responsive to said true and complementary data signals for generating a second high logic signal at the intermediate node when the complementary sense signal is at a low logic level and the true data signal is at a low logic level; and switching means connected to said intermediate node and being responsive to said first and second high logic signals for generating an equal signal which is discharged from a precharged high voltage level to a low logic level when the bit field in the accessed RAM word and the data values are different.

Claim 6

A data compare circuit for use with a complementary metal-oxide-semiconductor random-access-memory (CMOS RAM) to check the equality of a bit field in an accessed RAM word against data values, said circuit comprising: inverter means having an input connected to receive a true data signal and an output to provide a complementary data signal; first sensing means being connected to receive a true sense signal at a first sense node of a sense amplifier and being responsive to said true and complementary data signals for generating a first high logic signal at an intermediate node when the true sense signal is at a low logic level and the true data signal is at a high logic level; second sensing means being connected to receive a complementary sense signal at a second sense node of the sense amplifier and being responsive to said true and complementary data signals for generating a second high logic signal at the intermediate node when the complementary sense signal is at a low logic level and the true data signal is at a low logic level; and switching means connected to said intermediate node and being responsive to said first and second high logic signals for generating an equal signal which is discharged from a precharged high voltage level to a low logic level when the bit field in the accessed RAM word and the data values are different.

Claim 7

A data compare circuit as claimed in claim 4, wherein said first sensing means comprises a first group of series-connected transistors formed of a first P-channel transistor (P1), a second P-channel transistor (P2), a first N-channel transistor (N1) and a second N-channel transistor (N2).

Claim 8

A data compares circuit as claimed in claim 5, wherein said second sensing means comprises a second group of series-connected transistors formed of a third P-channel transistor (P3), a fourth P-channel transistor (P4), a third N-channel transistor (N3), and a fourth N-channel transistor (N4).

Claim 9

A data compare circuit as claimed in claim 6, wherein said switching means comprises an N-channel switching transistor (N5).

Claim 10

A data compare circuit as claimed in claim 7, wherein said inverter means comprises an inverter (I1).

Claim 11

A data compare network formed of a plurality of compare circuits for use with a complementary metal-oxide-semiconductor random-access-memory (CMOS RAM) to check the equality of n-bit field in an accessed RAM word against data values on a bit-by-bit basis, each of said circuits comprising: an inverter (I1) having an input connected to receive a true data signal and an output to provide a complementary data signal; a first group of series-connected transistors formed of a first P-channel transistor (P1), a second P-channel transistor (P2), a first N-channel transistor (N1) and a second N-channel transistor (N2); said first P-channel transistor (P1) having its source connected to a supply potential (VCC), its gate connected to the output of the inverter (I1), and its drain connected to the source of said second P-channel transistor (P2); said second P-channel transistor (P2) having its gate connected to a first sense node (X) and its drain connected to an intermediate node (A); said first N-channel transistor (N1) having its drain connected to the intermediate node (A), its gate connected to the first sense node (X), and its source connected to the drain of said second N-channel transistor (N2); said second N-channel transistor (N2) having its gate connected to the input of the inverter (I1) and its source connected to a ground potential; a second group of series-connected transistors formed of a third P-channel transistor (P3), a fourth P-channel transistor (P4), a third N-channel transistor (N3), and a fourth N-channel transistor (N4); said third P-channel transistor (P3) having its source connected to the supply potential (VCC), its gate connected to the input of said inverter (I1), and its drain connected to the source of said fourth P-channel transistor (P4); said fourth P-channel transistor (P4) having its gate connected to a second sense node (Y) and its drain connected to the intermediate node (A); said third N-channel transistor (N3) having its drain connected to the intermediate node (A), its gate connected to the second sense node (Y) and its source connected to the drain of said fourth N-channel transistor (N4); said fourth N-channel transistor (N4) having its gate connected to the output of the inverter (I1) and its source connected to the ground potential; and an N-channel switching transistor (N5) having its source connected to the ground potential, its gate connected to the intermediate node (A) and its drain connected to an output line (18) for generating an equal signal (E) which is discharged from a precharged high voltage level to a low logic level when a corresponding bit of the n-bit field in the accessed RAM word and the data values are different.

Claim 12

A data compare network formed of a plurality of compare circuits for use with a complementary metal-oxide-semiconductor random-access-memory (CMOS RAM) to check the equality of n-bit field in an accessed RAM word against data values on a bit-by-bit basis, each of said circuits comprising: an inverter (I1) having an input connected to receive a true data signal and an output to provide a complementary data signal; a first group of series-connected transistors formed of a first P-channel transistor (P1), a second P-channel transistor (P2), a first N-channel transistor (N1) and a second N-channel transistor (N2); said first P-channel transistor (P1) having its source connected to a supply potential (VCC), its gate connected to the output of the inverter (I1), and its drain connected to the source of said second P-channel transistor (P2); said second P-channel transistor (P2) having its gate connected to a first sense node (X) and its drain connected to an intermediate node (A); said first N-channel transistor (N1) having its drain connected to the intermediate node (A), its gate connected to the first sense node (X), and its source connected to the drain of said second N-channel transistor (N2); said second N-channel transistor (N2) having its gate connected to the input of the inverter (I1) and its source connected to a ground potential; a second group of series-connected transistors formed of a third P-channel transistor (P3), a fourth P-channel transistor (P4), a third N-channel transistor (N3), and a fourth N-channel transistor (N4); said third P-channel transistor (P3) having its source connected to the supply potential (VCC), its gate connected to the input of said inverter (I1), and its drain connected to the source of said fourth P-channel transistor (P4); said fourth P-channel transistor (P4) having its gate connected to a second sense node (Y) and its drain connected to the intermediate node (A); said third N-channel transistor (N3) having its drain connected to the intermediate node (A), its gate connected to the second sense node (Y) and its source connected to the drain of said fourth N-channel transistor (N4); said fourth N-channel transistor (N4) having its gate connected to the output of the inverter (I1) and its source connected to the ground potential; and an N-channel switching transistor (N5) having its source connected to the ground potential, its gate connected to the intermediate node (A) and its drain connected to an output line (18) for generating an equal signal (E) which is discharged from a precharged high voltage level to a low logic level when a corresponding bit of the n-bit field in the accessed RAM word and the data values are different.

Claim 13

A data compare circuit as claimed in claim 9, further comprising means for precharging said output line to the precharged high voltage level.

Claim 14

A data compare circuit as claimed in claim 10, wherein precharging means comprises a P-channel transistor (P5) which has its source connected to the supply potential (VCC), its gate connected to receive a precharge signal (C4) and its drain connected to the output line (18).