Micro-dimensional measurement apparatus

Claim 2

A micro-dimensional measurement apparatus for optically measuring a distance between opposed edges formed on a surface of a substrate, which comprises: a light source for generating a light beam having a predetermined light intensity distribution; an optical scanning system for scanning the substrate with the light beam so that the light beam crosses over said distance between said opposed edges formed thereon; means for detecting intensity information of the light reflected from the substrate; means for providing a reflected light intensity data pattern for a scanning distance of said light beam in accordance with the detected light intensity information; means for calculating reflection data corresponding to both data of a first kind and data of a second kind different from the first kind from said reflected light intensity data pattern; means for storing reference data corresponding to said calculated reflection data, of said first and second kind for a series of reflected light intensity sample data patterns of predetermined sample distances; said first and second different kinds corresponding to a combination of either a peak value and an integrated value, or a combination of a peak value and a slice pitch value at a predetermined level, or a combination of an integrated value and a slice pitch value at a predetermined level; means utilizing said stored reference data of both the first and second kind for calculating two corresponding values relating to the distance to be measured between said opposed edges in accordance with calculated reflection data values of the first and second kind respectively; means for calculating the difference between said two calculated distance values; means for determining whether or not said difference falls within a permissible range; and means for calculating a mean value from said two calculated distance values for determining the distance between said opposed edges at times when said calculated difference falls within said permissible range.

Claim 3

A micro-dimensional measurement apparatus as set forth in claim 1, wherein said optical scanning system includes an acoustic optical element, and an acoustic optical element driver for generating ultrasonic acoustic travelling waves, for deflecting said light beam from the acoustic optical element to scan the substrate.

Claim 4

A micro-dimensional measurement apparatus as set forth in claim 1, wherein said means for calculating the two distance values from said two kinds of reference data in accordance with said two kinds of reflection data includes means for interpolating the reference data and reflection data.

Claim 5

A micro-dimensional measurement apparatus as set forth in claim 1, wherein the light intensity distribution of said light beam is a Gaussian distribution.

Claim 6

A micro-dimensional measurement apparatus as set forth in claim 1, wherein a reflectivity of a measuring zone to be scanned between said opposed edges is variable and said series of reflected light intensity sample data patterns is provided for predetermined sample distances of each of predetermined variable sample reflectivities for the measuring zone to be scanned between said opposed edges.

Claim 7

A micro-dimensional measurement apparatus as set forth in claim 5, wherein said optical scanning system includes an acoustic optical element, and an acoustic optical element driver for generating ultrasonic acoustic travelling waves, for deflecting said light beam from the acoustic optic element to scan the substrate.

Claim 8

A micro-dimensional measurement apparatus as set forth in claim 5, wherein said means for calculating the two distance values from said two kinds of reference data in accordance with said two kinds of reflection data includes means for interpolating the reference data and reflection data.

Claim 9

A micro-dimensional measurement apparatus as set forth in claim 5, wherein the light intensity distribution of said light beam is a Gaussian distribution.

Claim 10

A micro-dimensional measurement apparatus for optically measuring a distance between opposed edges formed on a surface of a substrate, which comprises: a light source for generating a light beam having a predetermined light intensity distribution; an optical scanning system for scanning the substrate with the light beam so that the light beam crosses over said distance between said opposed edges formed thereon; means for detecting intensity information of the light reflected from the substrate; means for providing a reflected light intensity data pattern for a scanning distance of said light beam in accordance with the detected light intensity information; means for calculating three different kinds of reflection data from said reflected light intensity data pattern, one of said three different kinds of reflection data consisting of a peak value of said reflected light intensity data pattern, another of said three different kinds of reflection data consisting of an integrated value of said reflected light intensity data pattern, and the other of said three different kinds of reflection data consisting of a slice pitch value obtained by slicing said reflected light intensity data pattern at a predetermined level; means for storing three different kind of reference data corresponding to said three different kinds of reflection data, respectively, one of said three different kinds of reference data consisting of peak values of a series of reflected light intensity sample patterns corresponding to said reflected light intensity data pattern, another of said three different kinds of reference data consisting of integrated values of said series of reflected light intensity sample patterns, and the other of said three different kinds of reference data consisting of slice pitch values obtained by slicing said series of reflected light intensity sample patterns at said predetermined level, said series of reflected light intensity sample patterns being provided for predetermined sample distances; means for calculating three distance values for the distance to be measured between said opposed edges from said three kinds of reference data in accordance with said three kinds of reflection data, respectively; means for determining whether or not said three distance values fall within a permissible range; and means for calculating a mean value from said three distance values as a distance dimension between said opposed edges at times when said three distance values fall within said permissible range.

Claim 11

A micro-dimensional measurement apparatus for optically measuring a distance between opposed edges formed on a surface of a substrate, which comprises: a light source for generating a light beam having a predetermined light intensity distribution; an optical scanning system for scanning the substrate with the light beam so that the light beam crosses over said distance between said opposed edges formed thereon; means for detecting intensity information of the light reflected from the substrate; means for providing a reflected light intensity data pattern for a scanning distance of said light beam in accordance with the detected light intensity information; means for calculating three different kinds of reflection data from said reflected light intensity data pattern, one of said three different kinds of reflection data consisting of a peak value of said reflected light intensity data pattern, another of said three different kinds of reflection data consisting of an integrated value of said reflected light intensity data pattern, and the other of said three different kinds of reflection data consisting of a slice pitch value obtained by slicing said reflected light intensity data pattern at a predetermined level; means for storing three different kind of reference data corresponding to said three different kinds of reflection data, respectively, one of said three different kinds of reference data consisting of peak values of a series of reflected light intensity sample patterns corresponding to said reflected light intensity data pattern, another of said three different kinds of reference data consisting of integrated values of said series of reflected light intensity sample patterns, and the other of said three different kinds of reference data consisting of slice pitch values obtained by slicing said series of reflected light intensity sample patterns at said predetermined level, said series of reflected light intensity sample patterns being provided for predetermined sample distances; means for calculating three distance values for the distance to be measured between said opposed edges from said three kinds of reference data in accordance with said three kinds of reflection data, respectively; means for determining whether or not said three distance values fall within a permissible range; and means for calculating a mean value from said three distance values as a distance dimension between said opposed edges at times when said three distance values fall within said permissible range.

Claim 12

A micro-dimensional measurement apparatus for optically measuring a distance between opposed edges formed on a surface of a substrate, comprising: a light source for generating a light beam having a predetermined light intensity distribution; an optical scanning system for scanning the substrate with the light beam so that the light beam crosses over said distance between said opposed edges formed thereon; means for detecting intensity information of the light reflected from the substrate; means for providing a reflected light intensity data pattern for a scanning distance of said light beam in accordance with the detected light intensity information; means for calculating three different kinds of reflection data from said reflected light intensity data pattern, one of said three different kinds of reflection data consisting of a peak value of said reflected light intensity data pattern, another of said three different kinds of reflection data consisting of an integrated value of said reflected light intensity data pattern, and the other of said three different kind of reflection data consisting of a slice pitch value obtained by slicing said reflected light intensity data pattern at a predetermined level; means for storing three different kinds of reference data which correspond to said three different kinds of reflection data, respectively, one of said three different kinds of reference data consisting of peak values of a series of reflected light intensity sample patterns corresponding to said reflected light intensity data pattern, another of said three different kinds of reference data consisting of integrated values of said series of reflected light intensity sample patterns, and the other of said three different kind of reference data consisting of slice pitch values obtained by slicing said series of reflected light intensity sample patterns at said predetermined level, said series of reflected light intensity sample patterns being provided for predetermined sample distances; means for calculating three distance values for the distance to be measured between said opposed edges from said three different kinds of reference data in accordance with said three kinds of reflection data, respectively; means for calculating the maximum, intermediate and minimum values from said three distance values; means for calculating the difference between the maximum and minimum values; means for determining whether or not the calculated difference between the maximum and minimum values falls within a permissible range; means for calculating a mean value from said three calculated distance values as a dimension to be measured between said opposed edges at times when the distance value between the maximum and minimum values falls within said permissible range; means for calculating the difference between the intermediate value and one of either the minimum or maximum value at times when the calculated difference is outside said permissible range; means for determining whether or not said calculated two difference falls within a permissible range narrower than one half of said permissible range; and means for calculating, at times when said calculated difference falls within the narrower permissible range, a mean value from the intermediate value and the corresponding one of either the minimum and maximum values used in obtaining the calculated difference as a measured dimension between said opposed edges.

Claim 13

A micro-dimensional measurement apparatus for optically measuring a distance between opposed edges formed on a surface of a substrate, comprising: a light source for generating a light beam having a predetermined light intensity distribution; an optical scanning system for scanning the substrate with the light beam so that the light beam crosses over said distance between said opposed edges formed thereon; means for detecting intensity information of the light reflected from the substrate; means for providing a reflected light intensity data pattern for a scanning distance of said light beam in accordance with the detected light intensity information; means for calculating three different kinds of reflection data from said reflected light intensity data pattern, one of said three different kinds of reflection data consisting of a peak value of said reflected light intensity data pattern, another of said three different kinds of reflection data consisting of an integrated value of said reflected light intensity data pattern, and the other of said three different kind of reflection data consisting of a slice pitch value obtained by slicing said reflected light intensity data pattern at a predetermined level; means for storing three different kinds of reference data which correspond to said three different kinds of reflection data, respectively, one of said three different kinds of reference data consisting of peak values of a series of reflected light intensity sample patterns corresponding to said reflected light intensity data pattern, another of said three different kinds of reference data consisting of integrated values of said series of reflected light intensity sample patterns, and the other of said three different kind of reference data consisting of slice pitch values obtained by slicing said series of reflected light intensity sample patterns at said predetermined level, said series of reflected light intensity sample patterns being provided for predetermined sample distances; means for calculating three distance values for the distance to be measured between said opposed edges from said three different kinds of reference data in accordance with said three kinds of reflection data, respectively; means for calculating the maximum, intermediate and minimum values from said three distance values; means for calculating the difference between the maximum and minimum values; means for determining whether or not the calculated difference between the maximum and minimum values falls within a permissible range; means for calculating a mean value from said three calculated distance values as a dimension to be measured between said opposed edges at times when the distance value between the maximum and minimum values falls within said permissible range; means for calculating the difference between the intermediate value and one of either the minimum or maximum value at times when the calculated difference is outside said permissible range; means for determining whether or not said calculated two difference falls within a permissible range narrower than one half of said permissible range; and means for calculating, at times when said calculated difference falls within the narrower permissible range, a mean value from the intermediate value and the corresponding one of either the minimum and maximum values used in obtaining the calculated difference as a measured dimension between said opposed edges.

Claim 14

A micro-dimensional measurement apparatus as set forth in claim 10, wherein said optical scanning system includes an acoustic-optical element, and an acoustic-optical element driver for generating ultrasonic acoustic travelling waves, for deflecting said light beam from the acoustic optical element to scan the substrate.

Claim 15

A micro-dimensional measurement apparatus as set forth in claim 10, wherein said means for calculating the three distance values from said three kinds of reference data in accordance with said three kinds of reflection data includes means for interpolating the reference data and reflection data.

Claim 16

A micro-dimensional measurement apparatus as set forth in claim 10, wherein the light intensity distribution of said light beam is a Gaussian distribution.

Claim 17

A micro-dimensional measurement apparatus as set forth in claim 10, wherein reflectivity of a measuring zone to be scanned between said opposed edges is variable; and said series of reflected light intensity sample patterns is provided for predetermined sample distances of each of predetermined variable sample reflectivities for the measuring one to be scanned between said opposed edges.

Claim 18

A micro-dimensional measurement apparatus as set forth in claim 14, wherein said optical scanning system includes an acoustic-optical element, and an acoustic-optical element driver for generating ultrasonic acoustic travelling waves, for deflecting said light beam from the acoustic optical element to scan the substrate.

Claim 19

A micro-dimensional measurement apparatus as set forth in claim 14, wherein said means for calculating the three distance values from said three kinds of reference data in accordance with said three kinds of reflection data includes means for interpolating the reference data and reflection data.

Claim 20

A micro-dimensional measurement apparatus as set forth in claim 14, wherein the light intensity distribution of said light beam is a Gaussian distribution.

Claim 21

A micro-dimensional measurement apparatus as set forth in claim 9, wherein said optical scanning system includes an acoustic-optical element, and an acoustic-optical element driver for generating ultrasonic acoustic travelling waves, for deflecting said light beam from the acoustic optical element to scan the substrate.

Claim 22

A micro-dimensional measurement apparatus as set forth in claim 9, wherein said means for calculating the three distance values from said three kinds of reference data in accordance with said three kinds of reflection data includes means for interpolating the reference data and reflection data.

Claim 23

A micro-dimensional measurement apparatus as set forth in claim 9, wherein the light intensity distribution of said light beam is a Gaussian distribution.

Claim 24

A micro-dimensional measurement apparatus as set forth in claim 9, wherein reflectivity of a measuring zone to be scanned between said opposed edges is variable; and said series of reflected light intensity sample patterns is provided for predetermined sample distances of each of predetermined variable sample reflectivities for the measuring zone to be scanned between said opposed edges.

Claim 25

A micro-dimensional measurement apparatus as set forth in claim 21, wherein said optical scanning system includes an acoustic-optical element, and an acoustic-optical element driver for generating ultrasonic acoustic travelling waves, for deflecting said light beam from the acoustic optical element to scan the substrate.

Claim 26

A micro-dimensional measurement apparatus as set forth in claim 21, wherein said means for calculating the three distance values from said three kinds of reference data in accordance with said three kinds of reflection data includes means for interpolating the reference data and reflection data.

Claim 27

A micro-dimensional measurement apparatus as set forth in claim 21, wherein the light intensity distribution of said light beam is a Gaussian distribution.

Claim 28

A micro-dimensional measurement apparatus for optically measuring a distance between opposed edges formed on a surface of a substrate, reflectivity of a measuring zone between said opposed edges being variable, which comprises: a light source for generating a light beam having a predetermined light intensity distribution; an optical scanning system for scanning the substrate with the light beam so that the light beam crosses over said distance between said opposed edges formed thereon; means for detecting intensity information of the light reflected from the substrate; means for providing a reflected light intensity data pattern for a scanning distance of said light beam in accordance with the detected light intensity information; means for calculating three different kinds of reflection data from said reflected light intensity data pattern, one of said three different kinds of reflection data consisting of a peak value of said reflected light intensity data pattern, another of said three different kinds of reflection data consisting of an integrated value of said reflected light intensity data pattern, and the other of said three kinds of reflection data consisting of a slice pitch value obtained by slicing said reflected light intensity data pattern at a predetermined level; means for storing three different kinds of reference data which correspond to said three kinds of reflection data, respectively, one of said three different kinds of reference data consisting of peak values of a series of reflected light intensity sample patterns corresponding to said reflected light intensity data pattern, another of said three different kinds of reference data consisting of integrated values of said series of reflected light intensity sample patterns, and the other of said three different kinds of reference data consisting of slice pitch values obtained by slicing said series of reflected light intensity sample patterns at said predetermined level, said series of reflected light intensity sample patterns being prepared with respect to predetermined sample distances of each of predetermined sample reflectivities for the measuring zone to be scanned between said opposed edges; means for calculating a distance value for the distance to be measured between said opposed edges from the peak and integrated values of said three different kinds of reference data in accordance with the peak and integrated values of said three different kinds of reflection data; means for calculating another distance value for the distance to be measured between said opposed edges from the peak and slice pitch values of said three different kinds of reference data in accordance with the peak and slice pitch values of said three different kinds of reflection data; means for calculating the difference between said one and another calculated distance values; means for determining whether or not said difference falls within a permissible range; and means for calculating a mean value from said two distance values as a measured dimension between said opposed edges at times when said difference falls within said permissible range.

Claim 29

A micro-dimensional measurement apparatus for optically measuring a distance between opposed edges formed on a surface of a substrate, reflectivity of a measuring zone between said opposed edges being variable, which comprises: a light source for generating a light beam having a predetermined light intensity distribution; an optical scanning system for scanning the substrate with the light beam so that the light beam crosses over said distance between said opposed edges formed thereon; means for detecting intensity information of the light reflected from the substrate; means for providing a reflected light intensity data pattern for a scanning distance of said light beam in accordance with the detected light intensity information; means for calculating three different kinds of reflection data from said reflected light intensity data pattern, one of said three different kinds of reflection data consisting of a peak value of said reflected light intensity data pattern, another of said three different kinds of reflection data consisting of an integrated value of said reflected light intensity data pattern, and the other of said three kinds of reflection data consisting of a slice pitch value obtained by slicing said reflected light intensity data pattern at a predetermined level; means for storing three different kinds of reference data which correspond to said three kinds of reflection data, respectively, one of said three different kinds of reference data consisting of peak values of a series of reflected light intensity sample patterns corresponding to said reflected light intensity data pattern, another of said three different kinds of reference data consisting of integrated values of said series of reflected light intensity sample patterns, and the other of said three different kinds of reference data consisting of slice pitch values obtained by slicing said series of reflected light intensity sample patterns at said predetermined level, said series of reflected light intensity sample patterns being prepared with respect to predetermined sample distances of each of predetermined sample reflectivities for the measuring zone to be scanned between said opposed edges; means for calculating a distance value for the distance to be measured between said opposed edges from the peak and integrated values of said three different kinds of reference data in accordance with the peak and integrated values of said three different kinds of reflection data; means for calculating another distance value for the distance to be measured between said opposed edges from the peak and slice pitch values of said three different kinds of reference data in accordance with the peak and slice pitch values of said three different kinds of reflection data; means for calculating the difference between said one and another calculated distance values; means for determining whether or not said difference falls within a permissible range; and means for calculating a mean value from said two distance values as a measured dimension between said opposed edges at times when said difference falls within said permissible range.

Claim 30

A micro-dimensional measurement apparatus as set forth in claim 25, wherein said optical scanning system includes an acoustic-optical element, and an acoustic-optical element driver for generating ultrasonic acoustic travelling waves, for deflecting said light beam from the acoustic optical element to scan the substrate.

Claim 31

A micro-dimensional measurement apparatus as set forth in claim 25, wherein each of said means for calculating the two distance values includes means for interpolating the corresponding reference data and reflection data.

Claim 32

A micro-dimensional measurement apparatus as set forth in claim 25, wherein the light intensity distribution of said light beam is a Gaussian distribution.

Claim 33

A micro-dimensional measurement apparatus for optically measuring a distance between opposed edges formed on a surface of a substrate by use of a laser beam having a Gaussian intensity distribution, said opposed edges being equal to or smaller than a diameter of the laser beam, which comprises: an optical scanning system for scanning the substrate with the laser beam so that said light beam crosses over said opposed edges formed thereon; means for detecting intensity information of the light reflected from the substrate; means for providing a reflected light intensity data pattern for a scanning distance of said light beam in accordance with the detected light intensity information; means for calculating at least one value corresponding to either a peak value, an integrated value, and a slice pitch value obtained from said reflected light intensity data pattern; means for storing at least one predetermined reference value corresponding to said at least one calculated value, said at least one reference value being obtained from a reflected light intensity sample pattern provided for a sample distance equal to 65% of a diameter of said laser beam; means for comparing said at least one calculated value with said reference value; means for calculating a three-dimensional function which approximately represents a part of said reflected light intensity data pattern at each side of the peak value thereof at times when said at least one calculated value is larger than said at least one reference value, said part corresponding to an intensity range which is predetermined on the basis of said reflected light intensity sample pattern; means for differentiating said three-dimensional function to determine a point of inflection within said intensity range at each side of the peak of said reflected light intensity data pattern; means for calculating a scanning distance between the two determined points of inflection; means for calculating a distance value between said opposed edges in accordance with said scanning distance between the determined points of inflection; means for twice differentiating said reflected light intensity data pattern to determine two kink points thereof at the sides of the peak thereof, respectively, at times when said at least one calculated value is smaller than said reference value; means for calculating a scanning distance between the two determined kink points; and means for calculating a distance value between said opposed edges in accordance with said scanning distance between said two kink points.

Claim 34

A micro-dimensional measurement apparatus for optically measuring a distance between opposed edges formed on a surface of a substrate by use of a laser beam having a Gaussian intensity distribution, said opposed edges being equal to or smaller than a diameter of the laser beam, which comprises: an optical scanning system for scanning the substrate with the laser beam so that said light beam crosses over said opposed edges formed thereon; means for detecting intensity information of the light reflected from the substrate; means for providing a reflected light intensity data pattern for a scanning distance of said light beam in accordance with the detected light intensity information; means for calculating at least one value corresponding to either a peak value, an integrated value, and a slice pitch value obtained from said reflected light intensity data pattern; means for storing at least one predetermined reference value corresponding to said at least one calculated value, said at least one reference value being obtained from a reflected light intensity sample pattern provided for a sample distance equal to 65% of a diameter of said laser beam; means for comparing said at least one calculated value with said reference value; means for calculating a three-dimensional function which approximately represents a part of said reflected light intensity data pattern at each side of the peak value thereof at times when said at least one calculated value is larger than said at least one reference value, said part corresponding to an intensity range which is predetermined on the basis of said reflected light intensity sample pattern; means for differentiating said three-dimensional function to determine a point of inflection within said intensity range at each side of the peak of said reflected light intensity data pattern; means for calculating a scanning distance between the two determined points of inflection; means for calculating a distance value between said opposed edges in accordance with said scanning distance between the determined points of inflection; means for twice differentiating said reflected light intensity data pattern to determine two kink points thereof at the sides of the peak thereof, respectively, at times when said at least one calculated value is smaller than said reference value; means for calculating a scanning distance between the two determined kink points; and means for calculating a distance value between said opposed edges in accordance with said scanning distance between said two kink points.

Claim 35

A micro-dimensional measurement apparatus as set forth in claim 29, wherein said reflected light intensity sample pattern is provided for a sample distance equal to a diameter of said laser beam, said intensity range being from 25 to 75% of the peak intensity of said reflected light intensity sample pattern.