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US5039381A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of electroplating a precious metal on a semiconductor device, integrated circuit or the like

Assignee: Individual
•
Filing: 1989-05-25
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Granted: 1991-08-13
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Expires: 2009-05-25
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Abstract

Abstract A method for electroplating a layer of a precious metal, copper or aluminum on a surface of a semiconductor device, an integrated circuit, or the like employs an electrolytic cell in which the cathode comprises a semiconductor device, an integrated circuit device, or the like, having a surface for receiving the precious metal layer. The surface is oriented in a position normal to a vector representing the acceleration of gravity and facing the anode of the cell. An electroplating direct current on the order of about 0.1 milliamp/cm 2 is employed while superimposing a time varying electromagnetic field in the range of about 1 to about 100 megahertz on the direct current. The electroplating current and the electromagnetic field are employed in the absence of convection, i.e. stirring, in the electrolyte. The product produced by the described method comprises a smooth, evenly distributed layer of the precious metal having a microstructure that is characteristic of single crystals.

Inventors

  • 👤 Edward J. Mullarkey

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 18:19
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/40; H10P14/46; H10P14/47; C; C25; C25D; C25D5/00; C25D5/007; C25D5/60; C25D5/605; C25D5/611; C25D5/615; C25D5/617; C25D5/627; C25D7/00; C25D7/12; Y; Y10; Y10S; Y10S204/00; Y10S204/09

Claims Analysis

Total Claims: 31
Claim 1
Independent Claim 220 words
A method for electroplating a layer of a precious metal or copper on a surface of a semiconductor device, which method comprises: (a) providing an electrolytic cell comprising a cathode, an anode, a direct current source and an aqueous electrolyte containing a precious metal compound or a copper compound dissolved therein, said cathode comprising a semiconductor device having a surface for receiving a layer of precious metal or copper; (b) orienting the semiconductor device surface for receiving a layer of the precious metal or copper in a position normal to a vector representing the acceleration of gravity and facing the anode of the electrolytic cell, the anode being positioned in the direction of the acceleration of gravity with respect to said surface; and (c) employing an electroplating direct current on the order of about 0.1 milliamp/cm 2 in the electrolytic cell while superimposing an alternating current electromagnetic field in the range of about 1 to about 100 megahertz on the electroplating current, the strength of said electromagnetic field being sufficiently large to enhance the diffusion, mobility or mass transport of electrolyte ions in solution, said electroplating current and said electromagnetic field being employed in the absence of convection in the electrolyte, whereby a smooth, evenly distributed layer of the precious metal or copper is formed on the semiconductor device surface.
Claim 2
Independent Claim 220 words
A method for electroplating a layer of a precious metal or copper on a surface of a semiconductor device, which method comprises: (a) providing an electrolytic cell comprising a cathode, an anode, a direct current source and an aqueous electrolyte containing a precious metal compound or a copper compound dissolved therein, said cathode comprising a semiconductor device having a surface for receiving a layer of precious metal or copper; (b) orienting the semiconductor device surface for receiving a layer of the precious metal or copper in a position normal to a vector representing the acceleration of gravity and facing the anode of the electrolytic cell, the anode being positioned in the direction of the acceleration of gravity with respect to said surface; and (c) employing an electroplating direct current on the order of about 0.1 milliamp/cm 2 in the electrolytic cell while superimposing an alternating current electromagnetic field in the range of about 1 to about 100 megahertz on the electroplating current, the strength of said electromagnetic field being sufficiently large to enhance the diffusion, mobility or mass transport of electrolyte ions in solution, said electroplating current and said electromagnetic field being employed in the absence of convection in the electrolyte, whereby a smooth, evenly distributed layer of the precious metal or copper is formed on the semiconductor device surface.
Claim 3
Dependent Claim 47 words
A method as defined by claim 1, wherein the electroplating direct current and the electromagnetic field are employed for a time sufficient to produce a smooth, evenly distributed layer of the precious metal or copper having a thickness in the range of about 1 to 10 microns.
Claim 4
Dependent Claim 22 words
A method as defined by claim 1, wherein the precious metal is selected from the group consisting of gold, silver and palladium.
Claim 5
Dependent Claim 13 words
A method as defined by claim 1, wherein the precious metal comprises gold.
Claim 6
Dependent Claim 15 words
A method as defined by claim 1, wherein steps (a)-(c) are conducted at ambient temperature.
Claim 7
Dependent Claim 15 words
A method as defined by claim 1, wherein the electromagnetic field is about 10 megahertz.
Claim 8
Dependent Claim 31 words
A method as defined by claim 1 wherein the aqueous electrolyte contains a copper compound dissolved therein and a layer of copper is formed on the surface of the semiconductor device.
Claim 9
Dependent Claim 33 words
A method as defined by claim 1 wherein the evenly distributed layer of the precious metal or copper formed on the semiconductor device surface has a microstructure that is characteristic of single crystals.
Claim 10
Independent Claim 244 words
A method for electroplating a layer of precious metal or copper on a surface of a semiconductor device, which method comprises (a) providing an electrolytic cell comprising a cathode, an anode, a direct current source and an aqueous electrolyte containing a precious metal compound or a copper compound dissolved therein, said cathode comprising a semiconductor device having a surface for receiving a layer of precious metal or copper; (b) orienting the semiconductor device surface for receiving a layer of the precious metal or copper in a position normal to a vector representing the acceleration of gravity and facing the anode of the electrolytic cell, the anode being positioned in the direction of the acceleration of gravity with respect to said surface; and (c) employing an electroplating direct current on the order of about 0.1 milliamp/cm 2 in the electrolytic cell while superimposing an alternating current electromagnetic field on the electroplating current, said direct current being at or below a value at which the current yield for the deposition is 100 percent, and said electromagnetic field being in the range from about 1 to about 100 megahertz, the strength of said electromagnetic field being sufficiently large to enhance the diffusion, mobility or mass transport of electrolyte ions in solution, said electroplating current and said electromagnetic field being employed in the absence of convection in the electrolyte whereby a smooth, evenly distributed layer of the precious metal or copper is formed on the semiconductor device surface.
Claim 11
Independent Claim 244 words
A method for electroplating a layer of precious metal or copper on a surface of a semiconductor device, which method comprises (a) providing an electrolytic cell comprising a cathode, an anode, a direct current source and an aqueous electrolyte containing a precious metal compound or a copper compound dissolved therein, said cathode comprising a semiconductor device having a surface for receiving a layer of precious metal or copper; (b) orienting the semiconductor device surface for receiving a layer of the precious metal or copper in a position normal to a vector representing the acceleration of gravity and facing the anode of the electrolytic cell, the anode being positioned in the direction of the acceleration of gravity with respect to said surface; and (c) employing an electroplating direct current on the order of about 0.1 milliamp/cm 2 in the electrolytic cell while superimposing an alternating current electromagnetic field on the electroplating current, said direct current being at or below a value at which the current yield for the deposition is 100 percent, and said electromagnetic field being in the range from about 1 to about 100 megahertz, the strength of said electromagnetic field being sufficiently large to enhance the diffusion, mobility or mass transport of electrolyte ions in solution, said electroplating current and said electromagnetic field being employed in the absence of convection in the electrolyte whereby a smooth, evenly distributed layer of the precious metal or copper is formed on the semiconductor device surface.
Claim 12
Dependent Claim 19 words
A method as defined by claim 9, wherein the electromagnetic field is from about 10 to about 15 megahertz.
Claim 13
Dependent Claim 15 words
A method as defined by claim 9, wherein the electromagnetic field is about 12 megahertz.
Claim 14
Dependent Claim 33 words
A method as defined by claim 9 wherein the evenly distributed layer of the precious metal or copper formed on the semiconductor device surface has a microstructure that is characteristic of single crystals.
Claim 15
Independent Claim 222 words
A method for electroplating a layer of precious metal or copper on a surface of an integrated circuit device, which method comprises: (a) providing an electrolytic cell comprising a cathode, an anode, a direct current source and an aqueous electrolyte containing a precious metal compound or a copper compound dissolved therein, said cathode comprising an integrated circuit device having a surface for receiving a layer of precious metal or copper; (b) orienting the integrated circuit device surface for receiving a layer of the precious metal or copper in a position normal to a vector representing the acceleration of gravity and facing the anode of the electrolytic cell, the anode being positioned in the direction of the acceleration of gravity with respect to said surface; and (c) employing an electroplating direct current not greater than about 0.1 milliamp/cm 2 in the electrolytic cell while superimposing an alternating current electromagnetic field in the range of about 10 to about 15 megahertz on the electroplating current, the strength of said electromagnetic field being sufficiently large to enhance the diffusion, mobility or mass transport of electrolyte ions in solution, said electroplating current and said electromagnetic field being employed in the absence of convection in the electrolyte, whereby a smooth, evenly distributed layer of the precious metal or copper is formed on the integrated circuit device surface.
Claim 16
Independent Claim 222 words
A method for electroplating a layer of precious metal or copper on a surface of an integrated circuit device, which method comprises: (a) providing an electrolytic cell comprising a cathode, an anode, a direct current source and an aqueous electrolyte containing a precious metal compound or a copper compound dissolved therein, said cathode comprising an integrated circuit device having a surface for receiving a layer of precious metal or copper; (b) orienting the integrated circuit device surface for receiving a layer of the precious metal or copper in a position normal to a vector representing the acceleration of gravity and facing the anode of the electrolytic cell, the anode being positioned in the direction of the acceleration of gravity with respect to said surface; and (c) employing an electroplating direct current not greater than about 0.1 milliamp/cm 2 in the electrolytic cell while superimposing an alternating current electromagnetic field in the range of about 10 to about 15 megahertz on the electroplating current, the strength of said electromagnetic field being sufficiently large to enhance the diffusion, mobility or mass transport of electrolyte ions in solution, said electroplating current and said electromagnetic field being employed in the absence of convection in the electrolyte, whereby a smooth, evenly distributed layer of the precious metal or copper is formed on the integrated circuit device surface.
Claim 17
Dependent Claim 45 words
A method as defined by claim 23, wherein the electroplating direct current and the electromagnetic field are employed for a time sufficient to produce a smooth layer of the precious metal or copper having a thickness in the range of about 1 to 10 microns.
Claim 18
Dependent Claim 22 words
A method as defined by claim 13, wherein the precious metal is selected from the group consisting of gold, silver and palladium.
Claim 19
Dependent Claim 13 words
A method as defined by claim 13, wherein the precious metal comprises gold.
Claim 20
Dependent Claim 15 words
A method as defined by claim 13, wherein steps (a)-(c) are conducted at ambient temperature.
Claim 21
Dependent Claim 15 words
A method as defined by claim 13, wherein the electromagnetic field is about 12 megahertz.
Claim 22
Dependent Claim 31 words
A method as defined by claim 13 wherein the aqueous electrolyte contains a copper compound dissolved therein and a layer of copper is formed on the surface of the semiconductor device.
Claim 23
Dependent Claim 33 words
A method as defined by claim 13 wherein the evenly distributed layer of the precious metal or copper formed on the semiconductor device surface has a microstructure that is characteristic of single crystals.
Claim 24
Independent Claim 245 words
A method for electroplating a layer of precious metal or copper on a surface of an integrated circuit device, which method comprises (a) providing an electrolytic cell comprising a cathode, an anode, a direct current source and an aqueous electrolyte containing a precious metal compound or a copper compound dissolved therein, said cathode comprising an integrated circuit device having a surface for receiving a layer of precious metal or copper; (b) orienting the integrated circuit device surface for receiving a layer of the precious metal or copper in a position normal to a vector representing the acceleration of gravity and facing the anode of the electrolytic cell, the anode being positioned in the direction of the acceleration of gravity with respect to said surface; and (c) employing an electroplating direct current on the order of about 0.1 milliamp/cm 2 in the electrolytic cell while superimposing an alternating current electromagnetic field on the electroplating current, said direct current being at a value at which the current yield for the deposition is 100%, and said electromagnetic field being in the range from about 1 to about 100 megahertz, the strength of said electromagnetic field being sufficiently large to enhance the diffusion, mobility or mass transport of electrolyte ions in solution, said electroplating current and said electromagnetic field being employed int he absence of convection in the electrolyte whereby a smooth, evenly distributed layer of the precious metal or copper is formed on the integrated circuit device surface.
Claim 25
Independent Claim 245 words
A method for electroplating a layer of precious metal or copper on a surface of an integrated circuit device, which method comprises (a) providing an electrolytic cell comprising a cathode, an anode, a direct current source and an aqueous electrolyte containing a precious metal compound or a copper compound dissolved therein, said cathode comprising an integrated circuit device having a surface for receiving a layer of precious metal or copper; (b) orienting the integrated circuit device surface for receiving a layer of the precious metal or copper in a position normal to a vector representing the acceleration of gravity and facing the anode of the electrolytic cell, the anode being positioned in the direction of the acceleration of gravity with respect to said surface; and (c) employing an electroplating direct current on the order of about 0.1 milliamp/cm 2 in the electrolytic cell while superimposing an alternating current electromagnetic field on the electroplating current, said direct current being at a value at which the current yield for the deposition is 100%, and said electromagnetic field being in the range from about 1 to about 100 megahertz, the strength of said electromagnetic field being sufficiently large to enhance the diffusion, mobility or mass transport of electrolyte ions in solution, said electroplating current and said electromagnetic field being employed int he absence of convection in the electrolyte whereby a smooth, evenly distributed layer of the precious metal or copper is formed on the integrated circuit device surface.
Claim 26
Dependent Claim 19 words
A method as defined by claim 21, wherein the electromagnetic field is from about 10 to about 15 megahertz.
Claim 27
Dependent Claim 15 words
A method as defined by claim 21, wherein the electromagnetic field is about 12 megahertz.
Claim 28
Dependent Claim 33 words
A method as defined by claim 21 wherein the evenly distributed layer of the precious metal or copper formed on the semiconductor device surface has a microstructure that is characteristic of single crystals.
Claim 29
Independent Claim 193 words
A method for electroplating a layer of aluminum on a surface of a workpiece, which method comprises: (a) providing an electrolytic cell comprising a cathode, anode, a direct current source and a liquid electrolyte containing an aluminum compound dissolved therein, said cathode comprising a workpiece having a surface for receiving a layer of aluminum; (b) orienting the workpiece surface for receiving a layer of the aluminum in a position normal to a vector representing the acceleration of gravity and facing the anode of the electrolytic cell, the anode being positioned in the direction of the acceleration of gravity with respect to said surface; and (c) employing an electroplating direct current not greater than about 0.1 milliamp/cm 2 in the electrolytic cell while superimposing an alternating current electromagnetic field in the range of from about 1 to about 100 megahertz, the strength of said electromagnetic field being sufficiently large to enhance the diffusion, mobility or mass transport of electrolyte ions in solution, said electroplating current and said electromagnetic field being employed in the absence of convection in the electrolyte, whereby a smooth, evenly distributed layer of the aluminum is formed on the workpiece surface.
Claim 30
Independent Claim 193 words
A method for electroplating a layer of aluminum on a surface of a workpiece, which method comprises: (a) providing an electrolytic cell comprising a cathode, anode, a direct current source and a liquid electrolyte containing an aluminum compound dissolved therein, said cathode comprising a workpiece having a surface for receiving a layer of aluminum; (b) orienting the workpiece surface for receiving a layer of the aluminum in a position normal to a vector representing the acceleration of gravity and facing the anode of the electrolytic cell, the anode being positioned in the direction of the acceleration of gravity with respect to said surface; and (c) employing an electroplating direct current not greater than about 0.1 milliamp/cm 2 in the electrolytic cell while superimposing an alternating current electromagnetic field in the range of from about 1 to about 100 megahertz, the strength of said electromagnetic field being sufficiently large to enhance the diffusion, mobility or mass transport of electrolyte ions in solution, said electroplating current and said electromagnetic field being employed in the absence of convection in the electrolyte, whereby a smooth, evenly distributed layer of the aluminum is formed on the workpiece surface.
Claim 31
Dependent Claim 28 words
A method as defined by claim 25 wherein the evenly distributed layer of aluminum formed on the workpiece surface has a microstructure that is characteristic of single crystals.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-08-12 1995-02-11 1995-08-13 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-08-12 1999-02-11 1999-08-13 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-08-12 2003-02-11 2003-08-13 $7700.00 Window Closed / Lapsed

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