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US5045485A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for producing amorphous silicon thin film transistor array substrate

Assignee: Seiko Precision Inc
•
Filing: 1989-07-19
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Granted: 1991-09-03
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Expires: 2009-07-19
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Abstract

Abstract A method for producing an amorphous silicon thin film transistor array substrate comprising successively coating a gate insulating layer, an amorphous silicon layer and a protective insulating layer on a glass substrate provided with a gate electrode and a gate wiring having a predetermined shape, in such a manner as to not cover the connecting terminal region of the gate wiring. A protective insulating layer is patterned into a predetermined shape. After passing through a predetermined production process to produce an amorphous silicon thin film transistor array, at least a gate wiring and a source wiring are provided. The step of patterning the protective insulating layer comprises covering the connecting terminals of the gate wiring and the exposed region of the glass substrate with a photoresist.

Inventors

  • 👤 Sakae Tanaka
  • 👤 Yoshiaki Watanabe

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 16:43
CPC Classifications
H; H10; H10D; H10D86/00; H10D86/40; H10D86/441; H10D30/00; H10D30/01; H10D30/021; H10D30/031; H10D30/0312; H10D30/0316; H10D30/60; H10D30/67; H10D30/6729; H10D30/673; H10D30/6732; H10D86/01; H10D86/021; H10D86/0231; H10D86/443; H10D86/60

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 197 words
In a method for producing an amorphous silicon thin film transistor array substrate comprising coating a gate insulating layer, an amorphous silicon layer, and a protective insulating layer on a glass substrate provided with a gate electrode and a gate wiring, removing said protective insulating layer selectively to expose the amorphous silicon layer to overlap at least a part of said gate electrode, and then after passing through a predetermined procedure, providing at least an amorphous silicon thin film transistor array, a gate wiring, and a source wiring, the improvement wherein said step of coating comprises depositing said gate insulating layer on the whole surface of said glass substrate, depositing said amorphous silicon layer so as to not cover an end part of said gate wiring pattern, and further comprising removing the gate insulating layer to expose only said gate wiring, at a part thereof, by providing an opening part in the gate insulating layer on the gate wiring of the part at the end part of said gate wiring pattern where the amorphous silicon layer is not coated, and forming a conductive layer for a connecting terminal for the gate wiring on the said opening part.
Claim 2
Dependent Claim 197 words
In a method for producing an amorphous silicon thin film transistor array substrate comprising coating a gate insulating layer, an amorphous silicon layer, and a protective insulating layer on a glass substrate provided with a gate electrode and a gate wiring, removing said protective insulating layer selectively to expose the amorphous silicon layer to overlap at least a part of said gate electrode, and then after passing through a predetermined procedure, providing at least an amorphous silicon thin film transistor array, a gate wiring, and a source wiring, the improvement wherein said step of coating comprises depositing said gate insulating layer on the whole surface of said glass substrate, depositing said amorphous silicon layer so as to not cover an end part of said gate wiring pattern, and further comprising removing the gate insulating layer to expose only said gate wiring, at a part thereof, by providing an opening part in the gate insulating layer on the gate wiring of the part at the end part of said gate wiring pattern where the amorphous silicon layer is not coated, and forming a conductive layer for a connecting terminal for the gate wiring on the said opening part.
Claim 3
Dependent Claim 44 words
The method for producing an amorphous silicon thin film array substrate as claimed in claim 1, further comprising forming the conductive layer for the connecting terminal of said gate wiring at the same time as forming the source and drain electrodes or source wiring.

References Cited (Backward Citations)

US4601097A Cited
JPS60170261A Cited
JPS615577A Cited
US4904056A Cited
JPS6315470A Cited
US4862234A Cited
US4918504A Cited
JPH0191467A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-09-02 1995-03-04 1995-09-03 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-09-02 1999-03-04 1999-09-03 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-09-02 2003-03-04 2003-09-03 $7700.00 Window Closed / Lapsed

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