Patent US5083299A successfully refreshed from Google Patents.
US5083299A
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Tester for measuring signal propagation delay through electronic components
Assignee: Unisys Corp
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Filing: 1990-07-16
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Granted: 1992-01-21
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Expires: 2010-07-16
Abstract
Abstract A tester for measuring the time with which a signal propagates through an electronic component is comprised of a ring oscillator in which pulses are periodically generated and propagated around a loop. Within this loop, a fixture is disposed for selectively holding either the electronic component that is to be tested, or a shorting plug, in a removable fashion. Pulses from the ring oscillator propagate through the fixture, and their period reflects whether the component/shorting plug is being held. Coupled to the loop is a timing circuit which generates a timing signal each time it receives a predetermined number of the pulses on the loop. Using this timing signal, the signal propagation delay through the electronic component is determined substantially more accurately than that which is attainable by measuring propagation delay through the component directly.
Inventors
- 👤 Robert E. Schwanke
- 👤 James C. Icuss
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 13:26
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/319; G01R31/3193; G01R31/31937; G01R31/31725
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
182 words
A tester, for precisely measuring the time with which a signal propagates through an integrated circuit chip, said tester being comprised of: a pulse generator having a control terminal for receiving a control signal, and having an output terminal on which a pulse is generated in response to said control signal; a feedback circuit which couples each pulse from said output terminal back to said control terminal; said feedback circuit together with said pulse generator forming a ring oscillator in which each pulse on said control terminal causes another pulse to be generated on said output terminal; a fixture, within said feedback circuit, for holding said integrated circuit chip in a removable fashion such that pulses from said output terminal propagate through said fixture and said chip to said control terminal; and, a timing circuit, coupled to said feedback circuit, for measuring the time interval between a multitude of said pulses from said feedback circuit with a certain tolerance that is larger than said integrated circuit chip, and for dividing the measured time interval by the number of pulses in said multitude.
Claim 2
Dependent Claim
182 words
A tester, for precisely measuring the time with which a signal propagates through an integrated circuit chip, said tester being comprised of: a pulse generator having a control terminal for receiving a control signal, and having an output terminal on which a pulse is generated in response to said control signal; a feedback circuit which couples each pulse from said output terminal back to said control terminal; said feedback circuit together with said pulse generator forming a ring oscillator in which each pulse on said control terminal causes another pulse to be generated on said output terminal; a fixture, within said feedback circuit, for holding said integrated circuit chip in a removable fashion such that pulses from said output terminal propagate through said fixture and said chip to said control terminal; and, a timing circuit, coupled to said feedback circuit, for measuring the time interval between a multitude of said pulses from said feedback circuit with a certain tolerance that is larger than said integrated circuit chip, and for dividing the measured time interval by the number of pulses in said multitude.
Claim 3
Dependent Claim
32 words
A tester according to claim 1 wherein the number of pulses in said multitude multiplied by the time period from one pulse to the next pulse is substantially larger than said tolerance.
Claim 4
Dependent Claim
34 words
A tester according to claim 2 wherein said timing circuit is adapted to measure said time interval between said multitude of pulses beginning selectively with a positive pulse transition or a negative pulse transition.
Claim 5
Dependent Claim
39 words
A tester according to claim 3 wherein said chip has multiple output terminals and said feedback circuit includes a multiplexor for passing said pulses from any selectable one of said multiple output terminals to said pulse generator control terminal.
Claim 6
Dependent Claim
24 words
A tester according to claim 4 and further including an electromechanical plug which inserts into said fixture and shorts said pulses through said fixture.
Claim 7
Dependent Claim
34 words
A tester according to claim 1 wherein said timing circuit is adapted to measure said time interval between said multitude of pulses beginning selectively with a positive pulse transition or a negative pulse transition.
Claim 8
Dependent Claim
39 words
A tester according to claim 1 wherein said chip has multiple output terminals and said feedback circuit includes a multiplexor for passing said pulses from a selectable one of said multiple output terminals to said pulse generator control terminal.
Claim 9
Dependent Claim
24 words
A tester according to claim 1 and further including an electromechanical plug which inserts into said fixture and shorts said pulses through said fixture.
Claim 10
Dependent Claim
118 words
A tester for use in measuring the time with which a signal propagates through an electronic component, said tester being comprised of: a ring oscillator in which pulses are periodically generated and propagated around a loop; a fixture, within said loop, for holding said electronic component in a removable fashion such that said pulses propagate through said fixture and electronic component; a timing circuit, coupled to said loop, for generating a timing signal each time it receives a predetermined number of said pulses from said loop; a means for measuring the time interval between two consecutive timing signals with a certain tolerance; and said predetermined number times the period of said pulses being substantially larger than said tolerance.
Claim 11
Dependent Claim
118 words
A tester for use in measuring the time with which a signal propagates through an electronic component, said tester being comprised of: a ring oscillator in which pulses are periodically generated and propagated around a loop; a fixture, within said loop, for holding said electronic component in a removable fashion such that said pulses propagate through said fixture and electronic component; a timing circuit, coupled to said loop, for generating a timing signal each time it receives a predetermined number of said pulses from said loop; a means for measuring the time interval between two consecutive timing signals with a certain tolerance; and said predetermined number times the period of said pulses being substantially larger than said tolerance.
Claim 12
Dependent Claim
24 words
A tester according to claim 9 and further including an electromechanical plug which inserts into said fixture and shorts said pulses through said fixture.
Claim 13
Dependent Claim
36 words
A tester according to claim 10 wherein said component has multiple output terminals and said ring oscillator includes a multiplexor for passing said pulses from any selectable one of said multiple output terminals around said loop.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-01-20 | 1995-07-22 | 1996-01-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-01-20 | 1999-07-22 | 2000-01-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-01-20 | 2003-07-22 | 2004-01-21 | $7700.00 | Window Closed / Lapsed |