Patent US5099480A successfully refreshed from Google Patents.
← Back to Patent Explorer
US5099480A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of testing bit errors in isdn circuits

Assignee: Ando Electric Co Ltd
•
Filing: 1989-12-21
•
Granted: 1992-03-24
•
Expires: 2009-12-21
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A method of testing bit errors in an ISDN circuit by employing a tester having the function of a terminal and by using the information channels of the frame of an ISDN. The tester sends out a known data pattern generated by a pattern generator to the ISDN by a sending circuit, receives the data pattern transmitted through the ISDN by a receiving circuit, and compares the known data pattern generated by the pattern generator and the received pattern data to detect errors in the circuit of ISDN. The method is capable of detecting errors in the circuit and confirming the quality of the circuit and the operating condition of the ISDN without requiring any additional special function of the circuit and without disturbing the communication of terminals connected to the ISDN.

Inventors

  • 👤 Yazuru Murata

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 10:54
CPC Classifications
B; B41; B41J; B41J3/00; B41J3/36; B41J17/00; B41J17/28

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 324 words
A method of testing for errors in an ISDN circuit having a bus including T-lines and R-lines for connecting a plurality of terminals to a network which includes a digital service unit, comprising the steps of: providing a test unit which includes a sending circuit having a B channel for sending out data on the T-lines, a receiving circuit having a B channel for receiving data from the R-lines, a protocol controller which executes channel D call control procedures, a pattern generator which generates a known data pattern, a selector which receives the data pattern of the pattern generator and sends a predetermined logic level or the data pattern of the pattern generator selectively to the sending circuit according to a control signal provided by the protocol controller, and an error detector which receives output data from the receiving circuit and detects errors by comparing the output data of the receiving circuit and the data pattern of the pattern generator; connecting said test unit to said bus; using the protocol controller to establish a test B channel which permits B channel communication between said sending circuit and said receiving circuit and which utilizes said T-lines and said network and said R-lines and said B channels of said sending circuit and said receiving circuit so that data sent out on the B channel of the sending circuit is received through the B channel of the receiving circuit; switching the selector by means of the control signal from said protocol controller so that the data pattern generated by the pattern generator is applied to the sending circuit as input test data for the test B channel; sending the input test data through the test B channel via the T-lines using the sending circuit, and receiving output test data from the test B channel via the R-lines using the receiving circuit; and using the error detector to compare the output test data to the input test data.
Claim 2
Independent Claim 324 words
A method of testing for errors in an ISDN circuit having a bus including T-lines and R-lines for connecting a plurality of terminals to a network which includes a digital service unit, comprising the steps of: providing a test unit which includes a sending circuit having a B channel for sending out data on the T-lines, a receiving circuit having a B channel for receiving data from the R-lines, a protocol controller which executes channel D call control procedures, a pattern generator which generates a known data pattern, a selector which receives the data pattern of the pattern generator and sends a predetermined logic level or the data pattern of the pattern generator selectively to the sending circuit according to a control signal provided by the protocol controller, and an error detector which receives output data from the receiving circuit and detects errors by comparing the output data of the receiving circuit and the data pattern of the pattern generator; connecting said test unit to said bus; using the protocol controller to establish a test B channel which permits B channel communication between said sending circuit and said receiving circuit and which utilizes said T-lines and said network and said R-lines and said B channels of said sending circuit and said receiving circuit so that data sent out on the B channel of the sending circuit is received through the B channel of the receiving circuit; switching the selector by means of the control signal from said protocol controller so that the data pattern generated by the pattern generator is applied to the sending circuit as input test data for the test B channel; sending the input test data through the test B channel via the T-lines using the sending circuit, and receiving output test data from the test B channel via the R-lines using the receiving circuit; and using the error detector to compare the output test data to the input test data.
Claim 3
Dependent Claim 50 words
A method according to claim 1, wherein said predetermined logic level is a logic 1, wherein said test unit is connected to said bus at a reference point S/T as specified in CCITT-I, and wherein said protocol controller executes channel D call control procedures specified in CCITT Advice Series I.
Claim 4
Independent Claim 358 words
A method of testing for errors in an ISDN circuit having a bus including T-lines and R-lines for connecting a plurality of terminals of a network which includes a digital service unit, comprising the steps of: providing a test unit which includes a sending circuit having a plurality of B channels for sending out data on the T-lines, a receiving circuit having a plurality of B channels for receiving data from the R-lines, a protocol controller which executes channel D call control procedures, pattern generators which generate known data patterns, selectors which receive the data patterns from the pattern generators and send a predetermined logic level or the data patterns of the pattern generators selectively to the sending circuit according to control signals provided by the protocol controller, and error detectors which receive output data from the receiving circuit and detect errors by comparing the output data of the receiving circuit and the data patterns of the pattern generators; connecting said test unit to said bus; using the protocol controller to establish a plurality of test B channels which permit B channel communication between said sending circuit and said receiving circuit and which utilize said T-lines and said network and said R-lines and selected B channels of both said sending circuit and said receiving circuit so that data sent out on a first selected B channel of the sending circuit is received through a first selected B channel of the receiving circuit, and so that data sent out on a second selected B channel of the sending circuit is received through a second selected B channel of the receiving circuit; switching the selectors by means of the control signals from said protocol controller so that the data patterns generated by the pattern generators are applied to the sending circuit as input test data for the test B channels; sending the input test data through the test B channels via the T-lines using the sending circuit, and receiving output test data from the test B channels via the R-lines using the receiving circuit; and using the error detectors to compare the output test data to the input test data.
Claim 5
Independent Claim 358 words
A method of testing for errors in an ISDN circuit having a bus including T-lines and R-lines for connecting a plurality of terminals of a network which includes a digital service unit, comprising the steps of: providing a test unit which includes a sending circuit having a plurality of B channels for sending out data on the T-lines, a receiving circuit having a plurality of B channels for receiving data from the R-lines, a protocol controller which executes channel D call control procedures, pattern generators which generate known data patterns, selectors which receive the data patterns from the pattern generators and send a predetermined logic level or the data patterns of the pattern generators selectively to the sending circuit according to control signals provided by the protocol controller, and error detectors which receive output data from the receiving circuit and detect errors by comparing the output data of the receiving circuit and the data patterns of the pattern generators; connecting said test unit to said bus; using the protocol controller to establish a plurality of test B channels which permit B channel communication between said sending circuit and said receiving circuit and which utilize said T-lines and said network and said R-lines and selected B channels of both said sending circuit and said receiving circuit so that data sent out on a first selected B channel of the sending circuit is received through a first selected B channel of the receiving circuit, and so that data sent out on a second selected B channel of the sending circuit is received through a second selected B channel of the receiving circuit; switching the selectors by means of the control signals from said protocol controller so that the data patterns generated by the pattern generators are applied to the sending circuit as input test data for the test B channels; sending the input test data through the test B channels via the T-lines using the sending circuit, and receiving output test data from the test B channels via the R-lines using the receiving circuit; and using the error detectors to compare the output test data to the input test data.
Claim 6
Dependent Claim 34 words
A method according to claim 3, wherein said predetermined logic level is a logic 1, and wherein said test unit is connected to said bus at a reference point S/T as specified in CCITT-I.
Claim 7
Independent Claim 215 words
A method for testing for errors in an ISDN circuit having a bus including T-lines and R-lines for connecting a plurality of terminals to a switching network, comprising the steps of: providing a test unit which includes a sending circuit having at least one B channel for transmitting data on the T-lines, a receiving circuit having at least one B channel for receiving data from the R-lines, and a protocol controller for executing D channel call control procedures; connecting said test unit to said data bus with said sending circuit connected to said T-lines and said receiving circuit connected to said R-lines; using the protocol controller to establish at least one test B channel which permits B channel communication between said sending circuit and said receiving circuit and which utilizes said T-lines and said switching network and said R-lines and selected B channels of both said sending circuit and said receiving circuit so that data transmitted on a selected B channel of the sending circuit is received on a selected B channel of the receiving circuit; using the sending circuit to send into test data through the test B channel; using the receiving circuit to receive output test data from the test B channel; and comparing the output test data to the input test data.
Claim 8
Independent Claim 215 words
A method for testing for errors in an ISDN circuit having a bus including T-lines and R-lines for connecting a plurality of terminals to a switching network, comprising the steps of: providing a test unit which includes a sending circuit having at least one B channel for transmitting data on the T-lines, a receiving circuit having at least one B channel for receiving data from the R-lines, and a protocol controller for executing D channel call control procedures; connecting said test unit to said data bus with said sending circuit connected to said T-lines and said receiving circuit connected to said R-lines; using the protocol controller to establish at least one test B channel which permits B channel communication between said sending circuit and said receiving circuit and which utilizes said T-lines and said switching network and said R-lines and selected B channels of both said sending circuit and said receiving circuit so that data transmitted on a selected B channel of the sending circuit is received on a selected B channel of the receiving circuit; using the sending circuit to send into test data through the test B channel; using the receiving circuit to receive output test data from the test B channel; and comparing the output test data to the input test data.

References Cited (Backward Citations)

US3069498A Cited
US3380023A Cited
US3562710A Cited
US4156110A Cited
US4730313A Cited
US4922482A Cited
US4999836A Cited
US4989202A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-03-24 1995-09-23 1996-03-24 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-03-24 1999-09-23 2000-03-24 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-03-24 2003-09-23 2004-03-24 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag