Thickness/density mesuring apparatus

Claim 2

A thickness/density measuring apparatus comprising: a particle radiation source; a particle radiation detector spaced from said source and comprising a PIN diode; means for preventing light from impinging on said diode, but permitting particle radiation from said source to strike said diode and for further providing a low resistance conductive material layer in a path of particle movement between said source and said detector; a charge sensitive preamplifier connected to an output of said diode; a first high pass filter connected to the output of said preamplifier; an operational amplifier connected to the output of said first high pass filter; a second high pass filter connected to the output of said amplifier; a comparator receiving the output of said second high pass filter and providing an output signal when the level of said second high pass filter output exceeds a set threshold; and means responsive to the output of said comparator for providing a signal representative of at least one of the thickness and density of a material placed between said particle radiation source and particle radiation detector.

Claim 3

A thickness/density measuring apparatus as in claim 1, wherein said providing means comprises a pulse rate counter coupled to the output of said comparator means and means responsive to the output of said pulse rate counter for producing said signal.

Claim 4

A thickness/density measuring apparatus as in claim 2, wherein said producing means comprises a microprocessor for converting a pulse count rate into said signal.

Claim 5

A thickness/density measuring apparatus as in claim 1, further comprising an opto-isolator for coupling the output of said comparator to said providing means.

Claim 6

A thickness/density measuring device as in claim 1, further comprising a power supply for supplying operating power to said diode, preamplifier, amplifier and comparator, said power supply comprising means for providing a first unregulated D.C. voltage of a first value and means for producing from said unregulated D.C. voltage a plurality of regulated D.C. voltages.

Claim 7

A thickness/density measuring apparatus as in claim 5, wherein said means for producing a plurality of regulated D.C. voltage comprises a transformer for receiving said unregulated D.C. voltage at a first primary winding thereof and for supplying said regulated D.C. voltages at a plurality of secondary windings, means for switching the current through said first primary winding, a pulse width modulator for operating said switching means, and means for coupling said pulse width modulator to a second primary winding of said transformer.

Claim 8

A thickness/density measuring apparatus comprising: a detector unit, a processing unit spaced from said detector unit and a communication link coupling said detector and processing units, said detector unit comprising: a housing having a light blocking, particle radiation permeable, window therein, said window including a low resistance conductive material layer; a flat area PIN diode mounted within said housing and adjacent said window for receiving particle radiation; a charge sensitive preamplifier connected to the output of said PIN diode; an operational amplifier coupled to the output of said preamplifier; a high pass filter coupled to the output of said amplifier; a comparator coupled to the output of said filter for comparing said filter output with a set threshold; and means for coupling the output of said comparator to an output terminal of said detector unit; said processing unit comprising: means for receiving the output of said comparator and for converting said comparator output to a measurement signal representing at least one of thickness and density of a material.

Claim 9

A thickness/density measuring apparatus comprising: a detector unit, a processing unit spaced from said detector unit and a communication link coupling said detector and processing units, said detector unit comprising: a housing having a light blocking, particle radiation permeable, window therein, said window including a low resistance conductive material layer; a flat area PIN diode mounted within said housing and adjacent said window for receiving particle radiation; a charge sensitive preamplifier connected to the output of said PIN diode; an operational amplifier coupled to the output of said preamplifier; a high pass filter coupled to the output of said amplifier; a comparator coupled to the output of said filter for comparing said filter output with a set threshold; and means for coupling the output of said comparator to an output terminal of said detector unit; said processing unit comprising: means for receiving the output of said comparator and for converting said comparator output to a measurement signal representing at least one of thickness and density of a material.

Claim 10

A thickness/density measuring apparatus as in claim 7, wherein said communications link is a wired connection between said detector unit and said processing unit.

Claim 11

A thickness/density measuring apparatus as in claim 7, wherein said processing unit further comprises means for displaying a representation of said measurement signal.

Claim 12

A thickness/density measuring apparatus as in claim 7, wherein said means for receiving and converting comprises a pulse rate counter coupled to the output of said comparator means and means responsive to the output of said pulse rate counter for producing said measurement signal.

Claim 13

A thickness/density measuring apparatus as in claim 10, wherein said producing means comprises a microprocessor for converting a pulse count rate into said measurement signal.

Claim 14

A thickness/density measuring apparatus as in claim 10, further comprising an opto-isolator for coupling the output of said comparator to said processing unit.

Claim 15

A thickness/density measuring device as in claim 7, further comprising a power supply for supplying operating power to said diode, preamplifier, amplifier and comparator, said power supply comprising means located in said processing unit for providing a first unregulated D.C. voltage of a first value; means located in said detector unit for producing from said unregulated D.C. voltage a plurality of regulated D.C. voltages, said communications link connecting said means for providing said first unregulated D.C. voltage with said means for producing a plurality of regulated D.C. voltages.

Claim 16

A thickness/density measuring apparatus as in claim 13, wherein said means for producing a plurality of regulated D.C. voltage comprises a transformer for receiving said unregulated D.C. voltage at a first primary winding thereof and for supplying said regulated D.C. voltages at a plurality of secondary windings, means for switching the current through said first primary winding, a pulse width modulator for operating said switching means, and means for coupling said pulse width modulator to a second primary winding of said transformer.

Claim 17

A thickness/density measuring apparatus comprising: a particle radiation detector for receiving particle radiation, said detector comprising a PIN diode; means for preventing light radiation from striking said diode, but permitting particle radiation to strike said diode and for further providing a low resistance conductive material layer in a path of particle movement toward said PIN diode; a charge sensitive preamplifier coupled to the output of said PIN diode; an amplifier coupled to the output of said preamplifier; a comparator coupled to the output of said amplifier for providing an output signal when the level of the output of said amplifier exceeds a set threshold; means responsive to the output of said comparator for providing a pulse rate signal; and meals for converting said pulse rate signal to one of a thickness or density measurement of a material which is positioned to affect the amount of radiation which reaches said detector from a particle radiation source.

Claim 18

A thickness/density measuring apparatus comprising: a particle radiation detector for receiving particle radiation, said detector comprising a PIN diode; means for preventing light radiation from striking said diode, but permitting particle radiation to strike said diode and for further providing a low resistance conductive material layer in a path of particle movement toward said PIN diode; a charge sensitive preamplifier coupled to the output of said PIN diode; an amplifier coupled to the output of said preamplifier; a comparator coupled to the output of said amplifier for providing an output signal when the level of the output of said amplifier exceeds a set threshold; means responsive to the output of said comparator for providing a pulse rate signal; and meals for converting said pulse rate signal to one of a thickness or density measurement of a material which is positioned to affect the amount of radiation which reaches said detector from a particle radiation source.

Claim 19

A thickness/density measuring apparatus as in claim 15, further comprising a radiation source spaced from said detector.

Claim 20

A thickness/density measuring apparatus as in claim 16, wherein said detector is mounted in a housing and said source is mounted on an arm extending from said housing at a position to oppose said detector whereby a gap is formed between said source and detector for accommodating a material to be measured.

Claim 21

A thickness/density measuring apparatus as in claim 16, further comprising means for mounting said radiation source relative to said detector such that particle radiation detected by said detector is backscattered by said material to be measured.

Claim 22

A thickness/density measuring apparatus as in claim 16, wherein said detector is mounted within a housing behind a particle radiation permeable, light radiation-blocking window of said housing.

Claim 23

A thickness/density measuring apparatus as in claim 19, wherein said window is a thin film window.

Claim 24

A thickness/density measuring apparatus as in claim 20, wherein said window is formed of an aluminized mylar.

Claim 25

A thickness/density measuring apparatus as in claim 16, further comprising a first high pass filter connected between said preamplifier and amplifier.

Claim 26

A thickness/density measuring apparatus as in claim 22, further comprising a second high pass filter connected between said amplifier and comparator.

Claim 27

A thickness/density measuring apparatus as in claim 15, further comprising an opto-isolator connected between said comparator and said means providing a pulse rate signal.

Claim 28

A thickness/density measuring apparatus as in claim 15, wherein said apparatus is usable for a thickness measurement and further comprises means for calibrating said apparatus for a thickness measurement, said calibrating means comprising means for entering an actual thickness value (T s ) for a calibration material sample, means for determining a sample pulse count rate (C s ) for said material sample, means for storing the values (C s ) and (T s ), means for entering an indication of material type for a measured material, means for storing said entered material type, and means for storing a plurality of slope values (M) for various combinations of a sample pulse count rate (C s ), and entered actual thickness value (T s ) and an entered material type.

Claim 29

A thickness/density measuring apparatus as in claim 25, wherein said converting means comprises means for computing a thickness value in accordance with the following: T.sub.u =(M x (C.sub.u -C.sub.s))+T.sub.s where T u is the unknown thickness value, C u is the pulse rate signal, T s is the actual thickness of a material sample used for calibration, C s is the pulse count rate for said material sample, and M is a slope value selected from said plurality of slope values which correspond to an entered T s value, a determined C s value, and an entered material type.

Claim 30

A thickness/density measuring apparatus as in claim 15, wherein said PIN diode contains no protective layers between said preventing means and particle radiation sensitive areas thereof.

Claim 31

An extrusion film thickness control system comprising means for extruding a film thickness through a gap defined by pairs of die lips divided into a plurality of die lip sections along their length: a thickness measuring device for each die lip section, each measuring device comprising a particle radiation source; a particle radiation detector spaced from said source and comprising a PIN diode; means for preventing light radiation from striking said PIN diode, but permitting particle radiation to strike said diode, a charge sensitive preamplifier connected to an output of said diode; an amplifier coupled to the output of said preamplifier; a comparator coupled to the output of said amplifier and providing an output signal when the level of the output of said amplifier exceeds a set threshold; means responsive to the output of said comparator for providing a signal representative of the thickness of a material placed in a position to affect the radiation from said source which reaches said detector; means for separately controlling the gaps of each of said lip sections; and means for respectively associating an output of a measuring device with the control means for a respective die lip section which produces a section of film measured by the measuring device.

Claim 32

An extrusion film thickness control system comprising means for extruding a film thickness through a gap defined by pairs of die lips divided into a plurality of die lip sections along their length: a thickness measuring device for each die lip section, each measuring device comprising a particle radiation source; a particle radiation detector spaced from said source and comprising a PIN diode; means for preventing light radiation from striking said PIN diode, but permitting particle radiation to strike said diode, a charge sensitive preamplifier connected to an output of said diode; an amplifier coupled to the output of said preamplifier; a comparator coupled to the output of said amplifier and providing an output signal when the level of the output of said amplifier exceeds a set threshold; means responsive to the output of said comparator for providing a signal representative of the thickness of a material placed in a position to affect the radiation from said source which reaches said detector; means for separately controlling the gaps of each of said lip sections; and means for respectively associating an output of a measuring device with the control means for a respective die lip section which produces a section of film measured by the measuring device.

Claim 33

A control system as in claim 28, wherein said control means comprises, for each die lip section, a heated bolt driven by an output signal from a respective thickness measuring device.

Claim 34

A materials thickness control system comprising; means for continuously forming a material into at least one desired thickness; control means for controlling said forming means to produce at least one desired thickness in said material; at least one thickness measuring device for measuring the thickness of said formed material, each of said measuring devices being positioned downstream of said forming means, each said measuring device comprising: a particle radiation source; a particle radiation detector spaced from said source and comprising a PIN diode; means for preventing light radiation from striking said PIN diode, but permitting particle radiation to strike said diode, a charge sensitive preamplifier connected to an output of said diode; an amplifier coupled to the output of said preamplifier; a comparator coupled to the output of said amplifier and providing an output signal when the level of the output of said amplifier exceeds a set threshold; means responsive to the output of said comparator for providing a signal representative of the thickness of a material placed in a position to affect the radiation from said source which reaches said detector; said control means controlling said forming means in response to the signal representing thickness provided by at least one said measuring device.

Claim 35

A materials thickness control system comprising; means for continuously forming a material into at least one desired thickness; control means for controlling said forming means to produce at least one desired thickness in said material; at least one thickness measuring device for measuring the thickness of said formed material, each of said measuring devices being positioned downstream of said forming means, each said measuring device comprising: a particle radiation source; a particle radiation detector spaced from said source and comprising a PIN diode; means for preventing light radiation from striking said PIN diode, but permitting particle radiation to strike said diode, a charge sensitive preamplifier connected to an output of said diode; an amplifier coupled to the output of said preamplifier; a comparator coupled to the output of said amplifier and providing an output signal when the level of the output of said amplifier exceeds a set threshold; means responsive to the output of said comparator for providing a signal representative of the thickness of a material placed in a position to affect the radiation from said source which reaches said detector; said control means controlling said forming means in response to the signal representing thickness provided by at least one said measuring device.

Claim 36

A materials thickness control system as in claim 30, wherein said material is an extruded material and said forming means is an extruder.

Claim 37

A materials thickness control system as in claim 30, wherein said extruded material is an extruded film.

Claim 38

A materials thickness control system as in claim 31, wherein said forming means includes an extruder die.

Claim 39

A materials thickness control system as in claim 30, wherein, for each measuring device, said light preventing means is formed of a light blocking low resistance conductive material.

Claim 40

A material thickness control system as in claim 30, wherein said control means includes a PID controller.

Claim 41

A material thickness control system as in claim 30, further comprising plurality of said measuring devices spaced about a formed material, said control means being responsive to thickness representative signals from said plurality of spaced measuring devices.