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US5152607A Expired / Lapsed US ⏱️ 0.0 years remaining

Process for analyzing relaxation spectra and resonances in materials

Assignee: Setaram Inc
•
Filing: 1991-12-06
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Granted: 1992-10-06
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Expires: 2011-12-06
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Abstract

Abstract The present invention relates to the use of thermal stimulated processes for analyzing relaxation spectra and resonances in materials. The process is characterized in that at least two coupled excitation fields are applied to the sample of material analyzed along with a programmed temperature variation, with the objective to deconvolute during the thermally stimulated recovery stage the global deformation resulting from the excitation stage, i.e. obtain one by one the individual and elementary relaxation motions responsible for the global deformation, whether these elementary internal motions be of mechanical, electrical or magnetic origin. The process is characterized in the fact that the relaxation spectra for the motions resulting from the coupling between mechanical and electrical (and/or electromagnetical) excitations are obtained at the same time and are inter-related.

Inventors

  • 👤 Jean-Pierre Ibar

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 23:16
CPC Classifications
G; G01; G01N; G01N25/00; G01N25/20; G01N25/48; G01N25/4806; G01N25/4826; G01N25/4833

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 86 words
A process of analyzing relaxation spectra in materials, comprising the steps of: a. varying the temperature of at least one sample of material according to a predetermined temperature program; b. applying to the sample at least two coupled excitation fields simultaneously with said temperature program, each excitation field being variable according to a predetermined excitation program co-extensive in time with said temperature program; and c. measuring at least one sample parameter representative of the relaxation behavior of the sample during a portion of the temperature program.
Claim 2
Dependent Claim 86 words
A process of analyzing relaxation spectra in materials, comprising the steps of: a. varying the temperature of at least one sample of material according to a predetermined temperature program; b. applying to the sample at least two coupled excitation fields simultaneously with said temperature program, each excitation field being variable according to a predetermined excitation program co-extensive in time with said temperature program; and c. measuring at least one sample parameter representative of the relaxation behavior of the sample during a portion of the temperature program.
Claim 3
Dependent Claim 29 words
The process according to claim 1, wherein each excitation field is selected from the group comprising electric excitation fields, mechanical excitation fields, magnetic excitation fields, and electromagnetic excitation fields.
Claim 4
Dependent Claim 14 words
The process according to claim 1 or 2, wherein the sample parameter comprises temperature.
Claim 5
Dependent Claim 24 words
The process according to claim 3, wherein the sample parameter comprising temperature is measured using a selected one of differential microcalorimetry or differential analysis.
Claim 6
Dependent Claim 57 words
The process according to claim 4, further comprising the steps of: a. simultaneously varying the temperature of at least two samples according to said temperature program; b. maintaining said samples at the same temperature but at different pressures; and c. performing said differential calorimetry by measuring simultaneously the temperature difference between said samples and a reference temperature.
Claim 7
Dependent Claim 19 words
The process according to claim 5, wherein said different pressures are variable over time according to a predetermined program.
Claim 8
Dependent Claim 13 words
The process according to claim 1, wherein the excitation fields are oscillatory fields.

References Cited (Backward Citations)

US2647393A Cited
US2896442A Cited
US3271996A Cited
US4031740A Cited
US4322967A Cited
US4566806A Cited
US4592661A Cited
US4761078A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-10-06 1996-04-06 1996-10-06 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-10-06 2000-04-06 2000-10-06 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-10-06 2004-04-06 2004-10-06 $7700.00 Window Closed / Lapsed

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