US5204285A
Expired / Lapsed
US
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Method for patterning a metal layer
Assignee: Panasonic Holdings Corp
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Filing: 1992-03-19
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Granted: 1993-04-20
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Expires: 2012-03-19
Abstract
Abstract A method for patterning a metal layer without so-called "rabbit ears" comprising the steps of: deposition of a metal layer on a substrate, deposition of a barrier layer on the metal layer, formation of a mask layer of a predetermined pattern on the barrier layer, etching of the barrier layer and the metal layer under conditions such that the mask layer is also eroded slightly, and removal of the mask layer. In other embodiments, selective etching of barrier layer and mask sidewalls avoids or eliminates such "rabbit ears" and/or etchant product deposits which are precursors of such "rabbit ears".
Inventors
- 👤 Takao Kakiuchi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 04:30
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/71; Y; Y10; Y10S; Y10S438/00; Y10S438/942; Y10S438/945
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
119 words
A method for patterning a metallization layer comprising aluminum, said method comprising: depositing said metallization layer on an oxide covered silicon substrate; depositing a barrier layer on said metallization layer; forming a mask layer on selected portions of said barrier layer; a first etching step wherein said barrier layer and said metallization layer are etched, said first etching step also causing a thin film deposition of an etching product on sidewalls of said mask layer; a second etching step wherein said etched sidewall of said barrier layer is selectively further etched to the extent that this sidewall is separated from said thin film of said etching product on said sidewalls of said mask layer; and removing said mask layer.
Claim 2
Independent Claim
119 words
A method for patterning a metallization layer comprising aluminum, said method comprising: depositing said metallization layer on an oxide covered silicon substrate; depositing a barrier layer on said metallization layer; forming a mask layer on selected portions of said barrier layer; a first etching step wherein said barrier layer and said metallization layer are etched, said first etching step also causing a thin film deposition of an etching product on sidewalls of said mask layer; a second etching step wherein said etched sidewall of said barrier layer is selectively further etched to the extent that this sidewall is separated from said thin film of said etching product on said sidewalls of said mask layer; and removing said mask layer.
Claim 3
Independent Claim
113 words
A method for patterning a metallization layer comprising aluminum, said method comprising: depositing said metallization layer on an oxide covered silicon substrate; depositing a barrier layer on said metallization layer; forming a mask layer on selected portions of said barrier layer; a first etching step wherein said barrier layer and said metallization layer are etched, said first etching also causing a thin film deposition of an etching product on sidewalls of said mask layer; removing said mask layer; and a second etching step wherein said etched sidewall of said barrier layer is selectively further etched to the extent that said thin film of said etching product is lifted off from said barrier layer.
Claim 4
Independent Claim
113 words
A method for patterning a metallization layer comprising aluminum, said method comprising: depositing said metallization layer on an oxide covered silicon substrate; depositing a barrier layer on said metallization layer; forming a mask layer on selected portions of said barrier layer; a first etching step wherein said barrier layer and said metallization layer are etched, said first etching also causing a thin film deposition of an etching product on sidewalls of said mask layer; removing said mask layer; and a second etching step wherein said etched sidewall of said barrier layer is selectively further etched to the extent that said thin film of said etching product is lifted off from said barrier layer.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1996-04-19 | 1996-10-19 | 1997-04-20 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2000-04-19 | 2000-10-19 | 2001-04-20 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2004-04-19 | 2004-10-19 | 2005-04-20 | $7700.00 | Window Closed / Lapsed |