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US5326431A
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Dry etching method utilizing (SN)x polymer mask
Assignee: Sony Corp
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Filing: 1992-06-03
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Granted: 1994-07-05
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Expires: 2012-06-03
Abstract
Abstract A dry etching method using no organic resist mask without involving an increase in the number of necessary processes or wafer surface steps. Conventionally, a nitrogen based compound film is formed as a thin anti-reflection film on a gate electrode or aluminum (Al) metallization layer. The nitrogen based compound film thus formed can be used as an etching mask for the material layer by using etching gas capable of forming sulfur (S) in a plasma when dissociated by electric discharges. For instance, a W polycide film masked by a TiON anti-reflection film patterned into a predetermined shape can be etched by S2F2/H2 mixed gas. In this case, a nitrogen (N) dangling bond formed on the surface of the TiON anti-reflection film combines with sulfur supplied by S2F2 to form a polythiazyl (SN)x coating, which provides the resulting TiON anti-reflection film pattern with a sufficient etching resistance to act as an etching mask. This etching process emits no carbon to the etching system, thus improving selectivity for a SiO2 based material layer. The TiON anti-reflection film pattern can also be used as an etching mask for an aluminum metallization layer with a view to reducing after-corrosion.
Inventors
- 👤 Shingo Kadomura
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 07:58
CPC Classifications
H; H10; H10P; H10P76/00; H10P76/20; H10P76/204; H10P76/2041; H10P76/2043; H10P50/00; H10P50/69; H10P50/691; H10P50/692; H10P50/71
Claims Analysis
Total Claims: 24
Claim 1
Independent Claim
72 words
A dry etching method comprising patterning a nitrogen based compound film into a shape to mask a lower target material layer selected from aluminum based materials and silicon based materials, and plasma etching said lower target material layer by using an etching gas containing a sulfur based compound capable of forming free sulfur in a plasma when dissociated by electric discharges so that free sulfur and sulfur nitrides are present during etching.
Claim 2
Dependent Claim
72 words
A dry etching method comprising patterning a nitrogen based compound film into a shape to mask a lower target material layer selected from aluminum based materials and silicon based materials, and plasma etching said lower target material layer by using an etching gas containing a sulfur based compound capable of forming free sulfur in a plasma when dissociated by electric discharges so that free sulfur and sulfur nitrides are present during etching.
Claim 3
Dependent Claim
37 words
A dry etching method as claimed in claim 1 wherein said target material layer is any one of a polycide layer, aluminum based material layer, single-crystal silicon layer, polysilicon layer, amorphous silicon layer, and refractory metal layer.
Claim 4
Dependent Claim
35 words
A dry etching method as claimed in claim 1 wherein said nitrogen based compound film is composed of at least one compound selected from the group consisting TiON, TiN, and Si 3 N 4 .
Claim 5
Dependent Claim
78 words
A dry etching method as claimed in claim 1 wherein said sulfur based compound is at least one compound selected from the group consisting of from S 2 F 2 , SF 2 , SF 4 , S 2 F 10 , S 3 Cl 2 , S 2 Cl 2 , SCl 2 , S 3 Br 2 , S 2 Br 2 , SBr 2 , SOF 2 , SOCl 2 , and SOBr 2 .
Claim 6
Dependent Claim
19 words
A dry etching method as claimed in claim 1 wherein said nitrogen based compound film is an anti-reflection film.
Claim 7
Dependent Claim
44 words
A dry etching method as claimed in claim 1 wherein said target material layer is a W polycide film formed on a single-crystal silicon substrate with an interposition of a gate oxide film and said nitrogen based compound film is a TiON anti-reflection film.
Claim 8
Dependent Claim
57 words
A dry etching method as claimed in claim 1 wherein said target material layer is an Al-1% Si layer formed on a single-crystal silicon substrate with an interposition of a barrier metal formed of a Ti layer and TiON layer which are fabricated in this order and said nitrogen based compound film is a TiON anti-reflection film.
Claim 9
Dependent Claim
96 words
A dry etching method comprising patterning a nitrogen based compound film into a shape to mask a lower target material layer selected from aluminum based materials and silicon based materials, and plasma etching said lower target material layer by using an etching gas containing a sulfur based compound capable of forming free sulfur in a plasma when dissociated by electric discharges and at least one halogen radical consuming compound selected from the group consisting of H 2 , H 2 S, and silane based compounds so that sulfur nitrides and free sulfur are formed during etching.
Claim 10
Dependent Claim
96 words
A dry etching method comprising patterning a nitrogen based compound film into a shape to mask a lower target material layer selected from aluminum based materials and silicon based materials, and plasma etching said lower target material layer by using an etching gas containing a sulfur based compound capable of forming free sulfur in a plasma when dissociated by electric discharges and at least one halogen radical consuming compound selected from the group consisting of H 2 , H 2 S, and silane based compounds so that sulfur nitrides and free sulfur are formed during etching.
Claim 11
Dependent Claim
37 words
A dry etching method as claimed in claim 8 wherein said target material layer is any one of a polycide layer, aluminum based material layer, single-crystal silicon layer, polysilicon layer, amorphous silicon layer, and refractory metal layer.
Claim 12
Dependent Claim
36 words
A dry etching method as claimed in claim 8 wherein said nitrogen based compound film is composed of at least one compound selected from the group consisting of TiON, TiN, and Si 3 N 4 .
Claim 13
Dependent Claim
77 words
A dry etching method as claimed in claim 8 wherein said sulfur based compound is at least one compound selected from the group consisting of S 2 F 2 , SF 2 , SF 4 , S 2 F 10 , S 3 Cl 2 , S 2 Cl 2 , SCl 2 , S 3 Br 2 , S 2 Br 2 , SBr 2 , SOF 2 , SOCl 2 , and SOBr 2 .
Claim 14
Dependent Claim
19 words
A dry etching method as claimed in claim 8 wherein said nitrogen based compound film is an anti-reflection film.
Claim 15
Dependent Claim
44 words
A dry etching method as claimed in claim 8 wherein said target material layer is a W polycide film formed on a single-crystal silicon substrate with an interposition of a gate oxide film and said nitrogen based compound film is a TiON anti-reflection film.
Claim 16
Dependent Claim
57 words
A dry etching method as claimed in claim 8 wherein said target material layer is an Al-1% Si layer formed on a single-crystal silicon substrate with an interposition of a barrier metal formed of a Ti layer and TiON layer which are fabricated in this order and said nitrogen based compound film is a TiON anti-reflection film.
Claim 17
Dependent Claim
129 words
A dry etching method comprising patterning a nitrogen based compound film into a shape to mask a lower target material layer selected from silicon based materials and aluminum based materials, and plasma etching said lower target material layer by using an etching gas containing a sulfur based compound capable of forming free sulfur in a plasma when dissociated by electric discharges, at least one halogen radical consuming compound selected from the group consisting of H 2 , H 2 S, and silane based compounds, and at least one nitrogen based compound selected from the group consisting of N 2 , N 2 H 2 , NF 3 , NCl 3 , NBr 3 , and nitrogen oxide so that both sulfur nitrides and free sulfur are produced during etching.
Claim 18
Dependent Claim
129 words
A dry etching method comprising patterning a nitrogen based compound film into a shape to mask a lower target material layer selected from silicon based materials and aluminum based materials, and plasma etching said lower target material layer by using an etching gas containing a sulfur based compound capable of forming free sulfur in a plasma when dissociated by electric discharges, at least one halogen radical consuming compound selected from the group consisting of H 2 , H 2 S, and silane based compounds, and at least one nitrogen based compound selected from the group consisting of N 2 , N 2 H 2 , NF 3 , NCl 3 , NBr 3 , and nitrogen oxide so that both sulfur nitrides and free sulfur are produced during etching.
Claim 19
Dependent Claim
37 words
A dry etching method as claimed in claim 15 wherein said target material layer is any one of a polycide layer, aluminum based material layer, single-crystal silicon layer, polysilicon layer, amorphous silicon layer, and refractory metal layer.
Claim 20
Dependent Claim
36 words
A dry etching method as claimed in claim 15 wherein said nitrogen based compound film is composed of at least one compound selected from the group consisting of TiON, TiN, and Si 3 N 4 .
Claim 21
Dependent Claim
77 words
A dry etching method as claimed in claim 15 wherein said sulfur based compound is at least one compound selected from the group consisting of S 2 F 2 , SF 2 , SF 4 , S 2 F 10 , S 3 Cl 2 , S 2 Cl 2 , SCl 2 , S 3 Br 2 , S 2 Br 2 , SBr 2 , SOF 2 , SOCl 2 , and SOBr 2 .
Claim 22
Dependent Claim
19 words
A dry etching method as claimed in claim 15 wherein said nitrogen based compound film is an anti-reflection film.
Claim 23
Dependent Claim
45 words
A dry etching method as claimed in claim 15 where in said target material layer is a W polycide film formed on a single-crystal silicon substrate with an interposition of a gate oxide film and said nitrogen based compound film is a TiON anti-reflection film.
Claim 24
Dependent Claim
57 words
A dry etching method as claimed in claim 15 wherein said target material layer is an Al-1% Si layer formed on a single-crystal silicon substrate with an interposition of a barrier metal formed of a Ti layer and TiON layer which are fabricated in this order and said nitrogen based compound film is a TiON anti-reflection film.
References Cited (Backward Citations)
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| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1997-07-04 | 1998-01-03 | 1998-07-05 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-07-04 | 2002-01-03 | 2002-07-05 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-07-04 | 2006-01-03 | 2006-07-05 | $7700.00 | Window Closed / Lapsed |