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US5401351A Expired / Lapsed US ⏱️ 0.0 years remaining

Radio frequency electron cyclotron resonance plasma etching apparatus

Assignee: NEC Corp
•
Filing: 1994-01-27
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Granted: 1995-03-28
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Expires: 2014-01-27
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Abstract

Abstract A radio frequency electron cyclotron resonance (RF·ECR) plasma etching apparatus in which electron cyclotron resonance is caused to occur by radio frequency waves of 100-500 MHz introduced in by an antenna. The antenna is disposed within a plasma-producing chamber and connected to a coaxial cable for introducing the radio frequency waves. A plurality of permanent magnets are provided for producing magnetic fields that perpendicularly intersect electric fields produced around the antenna within the plasma-producing chamber. A process gas forms plasma to the electron cyclotron resonance phenomena resulting from the electric fields generated by the radio frequency waves and the magnetic fields perpendicularly intersecting the electric fields in the plasma-producing chamber. The plasma thus produced is applied to the substrate for etching.

Inventors

  • 👤 Seiji Samukawa

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 06:46
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/32; H01J37/32009; H01J37/32082; H01J37/32431; H01J37/3266; H01J37/32678

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 138 words
A radio frequency electron cyclotron resonance plasma etching apparatus comprising: a plasma-producing chamber for etching a substrate therein; a coaxial cable for introducing radio frequency waves for discharging within said plasma-producing chamber; an antenna disposed within said plasma-producing chamber and electrically connected to said coaxial cable; and a plurality of permanent magnets for producing plasma by applying magnetic fields that perpendicularly intersect electric fields produced around said antenna within said plasma-producing chamber, wherein a process gas is caused to become plasmic by utilizing electron cyclotron resonance phenomena to develop based on the electric fields generated by the radio frequency waves and the magnetic fields for plasma production perpendicularly intersecting said electric fields in said plasma-producing chamber and the plasma thus produced is applied to the substrate for etching, and wherein a radio frequency of 100-500 MHz is used.
Claim 2
Dependent Claim 138 words
A radio frequency electron cyclotron resonance plasma etching apparatus comprising: a plasma-producing chamber for etching a substrate therein; a coaxial cable for introducing radio frequency waves for discharging within said plasma-producing chamber; an antenna disposed within said plasma-producing chamber and electrically connected to said coaxial cable; and a plurality of permanent magnets for producing plasma by applying magnetic fields that perpendicularly intersect electric fields produced around said antenna within said plasma-producing chamber, wherein a process gas is caused to become plasmic by utilizing electron cyclotron resonance phenomena to develop based on the electric fields generated by the radio frequency waves and the magnetic fields for plasma production perpendicularly intersecting said electric fields in said plasma-producing chamber and the plasma thus produced is applied to the substrate for etching, and wherein a radio frequency of 100-500 MHz is used.
Claim 3
Dependent Claim 35 words
A radio frequency electron cyclotron resonance plasma etching apparatus according to claim 1, in which said plurality of permanent magnets are such that their magnetic lines of force are applied in parallel to said substrate.
Claim 4
Dependent Claim 37 words
A radio frequency electron cyclotron resonance plasma etching apparatus according to claim 1, in which said plasma-producing chamber is provided at its periphery with a plurality of magnets for producing magnetic fields which confine the plasma therein.
Claim 5
Dependent Claim 37 words
A radio frequency electron cyclotron resonance plasma etching apparatus according to claim 2, in which said plasma-producing chamber is provided at its periphery with a plurality of magnets for producing magnetic fields which confine the plasma therein.
Claim 6
Dependent Claim 42 words
A radio frequency electron cyclotron resonance plasma etching apparatus according to claim 1, in which said plurality of permanent magnets are provided in such that N poles and S poles alternate with one another and motion of electrons takes a loop form.
Claim 7
Dependent Claim 22 words
A radio frequency electron cyclotron resonance plasma etching apparatus according to claim 1, in which said antenna has a disk like configuration.
Claim 8
Dependent Claim 22 words
A radio frequency electron cyclotron resonance plasma etching apparatus according to claim 1, in which said antenna has a fork like configuration.

References Cited (Backward Citations)

JPS56155535A Cited
JPS60134423A Cited
US4996077A Cited
US5081398A Cited
US5280154A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1998-03-27 1998-09-26 1999-03-28 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2002-03-27 2002-09-26 2003-03-28 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2006-03-27 2006-09-26 2007-03-28 $7700.00 Window Closed / Lapsed

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