Patent US5488005A successfully refreshed from Google Patents.
US5488005A
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Process for manufacturing an offset gate structure thin film transistor
Assignee: Samsung Display Co Ltd
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Filing: 1995-05-05
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Granted: 1996-01-30
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Expires: 2015-05-05
Abstract
Abstract A process for manufacturing an offset gate structure thin film transistor which includes the steps of forming a first semiconductor layer, e.g., an active layer made of amorphous silicon or polysilicon, on a major surface of a substrate, e.g., a glass substrate of an LCD, forming a buffer layer on the first semiconductor layer, etching away a first region of the buffer layer and etching a corresponding region of the first semiconductor layer to a predetermined depth, to thereby form a recess and an underlying thin channel region in the first semiconductor layer, the thin channel region having a thickness less than that of the remainder of the first semiconductor layer, forming a second semiconductor layer on the buffer layer and exposed portions of the first semiconductor layer defining the recess, forming a gate insulating layer on the second semiconductor layer, forming a conductive layer on the gate insulating layer, etching the second semiconductor layer, the gate insulating layer, and the conductive layer so as to form a gate electrode structure overlying the thin channel region of the first semiconductor layer and offset resistance regions of the first semiconductor layer disposed on opposite sides of the thin channel region, and, ion-implanting impurities into the first semiconductor layer through exposed portions of the buffer layer disposed on opposite sides of the gate electrode structure, to thereby form source and drain regions on opposite sides of the offset resistance regions of the first semiconductor layer.
Inventors
- 👤 Min-Ku Han
- 👤 Byung-Hyuk Min
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 11:08
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/01; H10D84/0107; H10D84/02; H10D84/03; H10D84/038; Y; Y10; Y10S; Y10S148/00; Y10S148/15
Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
238 words
A process for manufacturing an offset gate structure thin film transistor, comprising the steps of: forming a first semiconductor layer comprised of a first semiconductor material on a major surface of a substrate; forming a buffer layer on said first semiconductor layer; etching away a first region of said buffer layer and etching a corresponding region of said first semiconductor layer to a predetermined depth, to thereby form a recess and an underlying thin channel region in said first semiconductor layer, said thin channel region having a thickness less than that of the remainder of said first semiconductor layer; forming a second semiconductor layer comprised of a second semiconductor material on said buffer layer and exposed portions of said said first semiconductor layer defining said recess; forming a gate insulating layer on said second semiconductor layer; forming a conductive layer on said gate insulating layer; etching said second semiconductor layer, said gate insulating layer, and said conductive layer so as to form a gate electrode structure overlying said thin channel region of said first semiconductor layer and offset resistance regions of said first semiconductor layer disposed on opposite sides of said thin channel region; and, ion-implanting impurities into said first semiconductor layer through exposed portions of said buffer layer disposed on opposite sides of said gate electrode structure, to thereby form source and drain regions on opposite sides of said offset resistance regions of said first semiconductor layer.
Claim 2
Dependent Claim
238 words
A process for manufacturing an offset gate structure thin film transistor, comprising the steps of: forming a first semiconductor layer comprised of a first semiconductor material on a major surface of a substrate; forming a buffer layer on said first semiconductor layer; etching away a first region of said buffer layer and etching a corresponding region of said first semiconductor layer to a predetermined depth, to thereby form a recess and an underlying thin channel region in said first semiconductor layer, said thin channel region having a thickness less than that of the remainder of said first semiconductor layer; forming a second semiconductor layer comprised of a second semiconductor material on said buffer layer and exposed portions of said said first semiconductor layer defining said recess; forming a gate insulating layer on said second semiconductor layer; forming a conductive layer on said gate insulating layer; etching said second semiconductor layer, said gate insulating layer, and said conductive layer so as to form a gate electrode structure overlying said thin channel region of said first semiconductor layer and offset resistance regions of said first semiconductor layer disposed on opposite sides of said thin channel region; and, ion-implanting impurities into said first semiconductor layer through exposed portions of said buffer layer disposed on opposite sides of said gate electrode structure, to thereby form source and drain regions on opposite sides of said offset resistance regions of said first semiconductor layer.
Claim 3
Dependent Claim
51 words
The process as set forth in claim 1, wherein said gate electrode structure includes a central, recessed portion overlying said thin channel region of said first semiconductor layer, and laterally outwardly extending flange portions overlying corresponding portions of said buffer layer and said offset resistance regions of said first semiconductor layer.
Claim 4
Dependent Claim
51 words
The process as set forth in claim 2, further comprising the step of partially etching said buffer layer prior to the ion-implanting step, using said gate electrode structure as an etching mask, whereby said exposed portions of said buffer layer are made thinner than said corresponding portions of said buffer layer.
Claim 5
Dependent Claim
27 words
The process as set forth in claim 1, wherein said first and second semiconductor materials are selected from the group consisting of polycrystalline silicon and amorphous silicon.
Claim 6
Dependent Claim
27 words
The process as set forth in claim 3, wherein said first and second semiconductor materials are selected from the group consisting of polycrystalline silicon and amorphous silicon.
Claim 7
Dependent Claim
18 words
The process as set forth in claim 4, wherein said buffer layer is made of an insulating material.
Claim 8
Dependent Claim
21 words
The process as set forth in claim 1, further comprising the step of removing said exposed portions of said buffer layer.
Claim 9
Dependent Claim
21 words
The process as set forth in claim 3, further comprising the step of removing said exposed portions of said buffer layer.
Claim 10
Dependent Claim
48 words
The process as set forth in claim 1, wherein said thickness of said remainder of said first semiconductor layer is X angstroms, and said predetermined depth is 1/2 X angstroms, so that said thickness of said thin channel region of said first semiconductor layer is 1/2 X angstroms.
Claim 11
Dependent Claim
10 words
The process as set forth in claim 9, wherein X=1,000.
Claim 12
Dependent Claim
23 words
The process as set forth in claim 3, wherein said exposed portions of said buffer layer have a thickness of approximately 100 angstroms.
Claim 13
Dependent Claim
18 words
The process as set forth in claim 1, wherein said substrate is a transparent substrate of an LCD.
Claim 14
Dependent Claim
216 words
A process for manufacturing a thin film transistor, comprising the steps of: forming a first semiconductor layer comprised of a first semiconductor material on a major surface of a substrate; forming a buffer layer on said first semiconductor layer; etching away a first region of said buffer layer and etching a corresponding region of said first semiconductor layer to a predetermined depth, to thereby form a recess and an underlying thin channel region in said first semiconductor layer, said thin channel region having a thickness less than that of the remainder of said first semiconductor layer; forming a second semiconductor layer comprised of a second semiconductor material on said buffer layer and exposed portions of said first semiconductor layer defining said recess; forming a gate insulating layer on said second semiconductor layer; forming a conductive layer on said gate insulating layer; etching said second semiconductor layer, said gate insulating layer, and said conductive layer so as to form a gate electrode structure overlying said thin channel region of said first semiconductor layer; and, ion-implanting impurities into said first semiconductor layer through exposed portions of said buffer layer disposed on opposite sides of said gate electrode structure, to thereby form source and drain regions on opposite sides of said thin channel region of said first semiconductor layer.
Claim 15
Dependent Claim
216 words
A process for manufacturing a thin film transistor, comprising the steps of: forming a first semiconductor layer comprised of a first semiconductor material on a major surface of a substrate; forming a buffer layer on said first semiconductor layer; etching away a first region of said buffer layer and etching a corresponding region of said first semiconductor layer to a predetermined depth, to thereby form a recess and an underlying thin channel region in said first semiconductor layer, said thin channel region having a thickness less than that of the remainder of said first semiconductor layer; forming a second semiconductor layer comprised of a second semiconductor material on said buffer layer and exposed portions of said first semiconductor layer defining said recess; forming a gate insulating layer on said second semiconductor layer; forming a conductive layer on said gate insulating layer; etching said second semiconductor layer, said gate insulating layer, and said conductive layer so as to form a gate electrode structure overlying said thin channel region of said first semiconductor layer; and, ion-implanting impurities into said first semiconductor layer through exposed portions of said buffer layer disposed on opposite sides of said gate electrode structure, to thereby form source and drain regions on opposite sides of said thin channel region of said first semiconductor layer.
Claim 16
Dependent Claim
43 words
The process as set forth in claim 13, further comprising the step of partially etching said buffer layer prior to the ion-implanting step, using said gate electrode structure as an etching mask, whereby said exposed portions of said buffer layer are made thinner.
Claim 17
Dependent Claim
27 words
The process as set forth in claim 13, wherein said first and second semiconductor materials are selected from the group consisting of polycrystalline silicon and amorphous silicon.
Claim 18
Dependent Claim
18 words
The process as set forth in claim 13, wherein said buffer layer is made of an insulating material.
Claim 19
Dependent Claim
18 words
The process as set forth in claim 15, wherein said buffer layer is made of an insulating material.
Claim 20
Dependent Claim
21 words
The process as set forth in claim 13, further comprising the step of removing said exposed portions of said buffer layer.
Claim 21
Dependent Claim
21 words
The process as set forth in claim 14, further comprising the step of removing said exposed portions of said buffer layer.
Claim 22
Dependent Claim
18 words
The process as set forth in claim 13, wherein said substrate comprises a transparent substrate of an LCD.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1999-01-29 | 1999-07-31 | 2000-01-30 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-01-29 | 2003-07-31 | 2004-01-30 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-01-29 | 2007-07-31 | 2008-01-30 | $7700.00 | Window Closed / Lapsed |