Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
245 words
An X-ray examination apparatus, comprising an X-ray source for forming an X-ray image by irradiation of an object by means of X-rays, an X-ray image intensifier for converting the X-ray image into an optical image, and an image pick-up device for forming an electronic image signal from the optical image, which image pick-up device comprises an exposure control means for applying a control signal, derived from the electronic image signal, to a control input of an amplifier of the image pick-up device, which exposure control means comprises selection means for selecting at least one measuring field in the optical image, a maximum detector for detecting a maximum level derived from a maximum value of signal amplitudes of the image signal corresponding to at least one measuring field, a minimum detector for detecting a minimum level derived from a minimum value of signal amplitudes of the image signal corresponding to at least one measuring field, and a mean value detector for detecting a mean level derived from a mean value of signal amplitudes of the image signal corresponding to at least one measuring field, characterized in that the exposure control means is also operative to form the control signal with the maximum level when the mean level exceeds a first limit value, with the minimum level when the mean level drops below a second limit value, and with a signal level which varies smoothly between the two limit values as a function of the mean level.
Claim 2
Dependent Claim
245 words
An X-ray examination apparatus, comprising an X-ray source for forming an X-ray image by irradiation of an object by means of X-rays, an X-ray image intensifier for converting the X-ray image into an optical image, and an image pick-up device for forming an electronic image signal from the optical image, which image pick-up device comprises an exposure control means for applying a control signal, derived from the electronic image signal, to a control input of an amplifier of the image pick-up device, which exposure control means comprises selection means for selecting at least one measuring field in the optical image, a maximum detector for detecting a maximum level derived from a maximum value of signal amplitudes of the image signal corresponding to at least one measuring field, a minimum detector for detecting a minimum level derived from a minimum value of signal amplitudes of the image signal corresponding to at least one measuring field, and a mean value detector for detecting a mean level derived from a mean value of signal amplitudes of the image signal corresponding to at least one measuring field, characterized in that the exposure control means is also operative to form the control signal with the maximum level when the mean level exceeds a first limit value, with the minimum level when the mean level drops below a second limit value, and with a signal level which varies smoothly between the two limit values as a function of the mean level.
Claim 3
Dependent Claim
24 words
An X-ray examination apparatus as claimed in claim 1, characterized in that the minimum level, the maximum level and the limit values are adjustable.
Claim 4
Dependent Claim
33 words
An X-ray examination apparatus as claimed in claim 1, characterized in that the signal level of the control signal varies linearly as a function of the mean level between the two limit values.
Claim 5
Dependent Claim
107 words
An X-ray examination apparatus as claimed in claim 3, characterized in that the exposure control means comprises arithmetic means for determining an auxiliary control signal level which assumes the maximum level when the mean level equals the first limit value and which assumes the minimum level when the mean level equals the second limit value, and also comprises a first comparison circuit for supplying the lower one of the maximum level and the auxiliary control signal level, and a second comparison circuit for supplying the control signal whose signal level is the higher one of the minimum level and the output signal of the first comparison circuit.
Claim 6
Dependent Claim
29 words
An X-ray examination apparatus as claimed in claim 1, characterized in that the selection means are operative to derive at least one measuring field from the electronic image signal.
Claim 7
Dependent Claim
29 words
An X-ray examination apparatus as claimed in claim 4, characterized in that the selection means are operative to derive at least one measuring field from the electronic image signal.
Claim 8
Dependent Claim
36 words
An X-ray examination apparatus as claimed in claim 2 or claim 2, characterized in that the signal level of the control signal varies linearly as a function of the mean level between the two limit values.
Claim 9
Dependent Claim
107 words
An X-ray examination apparatus as claimed in claim 7, characterized in that the exposure control means comprises arithmetic means for determining an auxiliary control signal level which assumes the maximum level when the mean level equals the first limit value and which assumes the minimum level when the mean level equals the second limit value, and also comprises a first comparison circuit for supplying the lower one of the maximum level and the auxiliary control signal level, and a second comparison circuit for supplying the control signal whose signal level is the higher one of the minimum level and the output signal of the first comparison circuit.
Claim 10
Dependent Claim
29 words
An X-ray examination apparatus as claimed in claim 2, characterized in that the selection means are operative to derive at least one measuring field from the electronic image signal.
Claim 11
Dependent Claim
29 words
An X-ray examination apparatus as claimed in claim 3, characterized in that the selection means are operative to derive at least one measuring field from the electronic image signal.
Claim 12
Dependent Claim
29 words
An X-ray examination apparatus as claimed in claim 7, characterized in that the selection means are operative to derive at least one measuring field from the electronic image signal.
Claim 13
Dependent Claim
29 words
An X-ray examination apparatus as claimed in claim 8, characterized in that the selection means are operative to derive at least one measuring field from the electronic image signal.